المؤلفون: Chi-Pei Lu, Cheng-Shu Ho, Ryan Liang, Shou-Zen Chang, Weiwei Pan, Chieh Lo, Yongjun Zheng, Fan Lan, Shao-Yu Hsu, Jim-Chen Chen, Shenzhi-Yang Lin, Chan-Ching Lin, Sa Zhao

المصدر: 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

مصطلحات موضوعية: Yield (engineering), business.industry, Computer science, Controller (computing), media_common.quotation_subject, 010401 analytical chemistry, Transistor, Big data, 020206 networking & telecommunications, 02 engineering and technology, 01 natural sciences, Die (integrated circuit), 0104 chemical sciences, law.invention, Debugging, law, Analytics, 0202 electrical engineering, electronic engineering, information engineering, business, Computer hardware, Communication channel, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::788eecd6011f8ee420c69ea5faed8c42
https://doi.org/10.1109/vlsi-tsa51926.2021.9440044