المؤلفون: Matthew C. Farrelly, Taylor Hudson Lewis, Jim Nonnemaker, Burton Levine

المصدر: Statistical Journal of the IAOS. 37:603-610

مصطلحات موضوعية: Economics and Econometrics, Measure (data warehouse), Index (economics), Calibration (statistics), media_common.quotation_subject, 010401 analytical chemistry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, 0104 chemical sciences, Management Information Systems, Statistics, Survey data collection, Quality (business), Statistics, Probability and Uncertainty, 0210 nano-technology, Psychology, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2f061613d498640de5bf143557ae359c
https://doi.org/10.3233/sji-200719