المؤلفون: Calvin Yi-Ping Chao, Yi-Che Chen, Kuo-Yu Chou, Jhy-Jyi Sze, Fu-Lung Hsueh, Shou-Gwo Wuu

المصدر: IEEE Journal of the Electron Devices Society, Vol 2, Iss 4, Pp 59-64 (2014)

مصطلحات موضوعية: Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/6799991/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/491409e7673a4134872156a524483f5e

المؤلفون: Seiji Takahashi, Yi-Min Huang, Jhy-Jyi Sze, Tung-Ting Wu, Fu-Sheng Guo, Wei-Cheng Hsu, Tung-Hsiung Tseng, King Liao, Chin-Chia Kuo, Tzu-Hsiang Chen, Wei-Chieh Chiang, Chun-Hao Chuang, Keng-Yu Chou, Chi-Hsien Chung, Kuo-Yu Chou, Chien-Hsien Tseng, Chuan-Joung Wang, Dun-Nien Yaung

المصدر: Sensors, Vol 17, Iss 12, p 2816 (2017)

مصطلحات موضوعية: submicron pixel, image sensor, stacked CMOS image sensor, dark current, read noise, random telegraph noise, full well capacity, optical crosstalk, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1424-8220/17/12/2816; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/e943c9552b8649ad8783b651839b2c7f

المؤلفون: Cheng-Hsien TSENG, Chi-Hsien CHUNG, Hirofumi SUMI, Jen-Cheng LIU, Jhy-Jyi SZE, Ren-Jie LIN, Sho-Gwo WUU, Wen-Hau WU, Wen-Jen CHIANG, Yuichiro YAMASHITA

المصدر: ITE Technical Report. 2015, :13

المؤلفون: Chi-Hsien Chung, Chiang Wei-Chieh, Kuo-Yu Chou, Tzu-Hsiang Chen, Tseng Chien-Hsien, Tung-Ting Wu, Takahashi Seiji, Chin-Chia Kuo, Chuan-Joung Wang, Huang Yimin, Dun-Nien Yaung, Chuang Chun-Hao, King Liao, Tung-Hsiung Tseng, Fu-Sheng Guo, Jhy-Jyi Sze, Hsu Wei-Cheng, Chou Keng-Yu

المصدر: Sensors, Vol 17, Iss 12, p 2816 (2017)
Sensors; Volume 17; Issue 12; Pages: 2816
Sensors (Basel, Switzerland)

مصطلحات موضوعية: Materials science, stacked CMOS image sensor, 02 engineering and technology, lcsh:Chemical technology, 01 natural sciences, Biochemistry, Noise (electronics), full well capacity, Article, Analytical Chemistry, random telegraph noise, optical crosstalk, 0103 physical sciences, read noise, lcsh:TP1-1185, Electrical and Electronic Engineering, Image sensor, Instrumentation, 010302 applied physics, submicron pixel, image sensor, dark current, Pixel, business.industry, Process (computing), 021001 nanoscience & nanotechnology, Atomic and Molecular Physics, and Optics, Optoelectronics, Node (circuits), 0210 nano-technology, business, Dark current, Voltage

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ac67032e3f5a8aeb975f5a08156255f4
https://www.mdpi.com/1424-8220/17/12/2816

المؤلفون: Yi-Che Chen, Kuo-Yu Chou, Shou-Gwo Wuu, Fu-Lung Hsueh, Calvin Yi-Ping Chao, Jhy-Jyi Sze

المصدر: IEEE Journal of the Electron Devices Society, Vol 2, Iss 4, Pp 59-64 (2014)

مصطلحات موضوعية: Materials science, business.industry, Extraction (chemistry), Photon flux, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Capacitance, Electronic, Optical and Magnetic Materials, Photodiode, law.invention, CMOS, law, Optoelectronics, Computer Science::Symbolic Computation, Extraction methods, lcsh:Electrical engineering. Electronics. Nuclear engineering, Electrical and Electronic Engineering, Image sensor, Photonics, business, lcsh:TK1-9971, Biotechnology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::25fb0f3aa93c2153cf682515fa941b25
https://doi.org/10.1109/jeds.2014.2318060

المؤلفون: W.P. Mo, S. Takahashi, R.J. Lin, Kuo-Ching Huang, Gene. Hung, C.C. Chuang, Jhy-Jyi Sze, S.Y. Chen, F.J. Shiu, R.L. Lee, Jeng-Shyan Lin, Chung Wang, S. G. Wuu, W.I. Hsu, Chia-Shiung Tsai, Yeur-Luen Tu, D.N. Yaung, H.Y. Cheng, S.J. Tsai, T.H. Hsu, W.H. Wu, Y.P. Chao, S.T. Tsai, Wen-De Wang, Jen-Cheng Liu, Ta-Wei Wang, Chi-Chuan Wang

المصدر: 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.

مصطلحات موضوعية: CMOS sensor, Pixel, Computer science, business.industry, Page layout, Process (computing), computer.software_genre, Application-specific integrated circuit, Sensor array, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Wafer, Image sensor, business, computer

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c5143c8683d3a586b5263ebe5180e7cd
https://doi.org/10.1109/vlsit.2014.6894429