المؤلفون: Jeong, Taehee

مصطلحات موضوعية: Computer Science - Machine Learning, Computer Science - Artificial Intelligence

URL الوصول: http://arxiv.org/abs/2501.10534

المؤلفون: D'Alberto, Paolo, Jeong, Taehee, Jain, Akshai, Manjunath, Shreyas, Sarmah, Mrinal, Hsu, Samuel, Raparti, Yaswanth, Pipralia, Nitesh

مصطلحات موضوعية: Computer Science - Machine Learning, Computer Science - Hardware Architecture, Computer Science - Computation and Language, C.5, D.3.4

URL الوصول: http://arxiv.org/abs/2407.09453

المؤلفون: Jeong, Taehee, Park, Sungyeong, Kim, Jeong-Wook, Yu, Jong-Won

المصدر: IEEE Access ; volume 10, page 42750-42761 ; ISSN 2169-3536

الاتاحة: http://dx.doi.org/10.1109/access.2022.3168707
http://xplorestaging.ieee.org/ielx7/6287639/9668973/09759424.pdf?arnumber=9759424

المؤلفون: Jeong, Taehee, Delaye, Elliott

المصدر: 2022 5th International Conference on Information and Computer Technologies (ICICT)

الاتاحة: http://dx.doi.org/10.1109/icict55905.2022.00029
http://xplorestaging.ieee.org/ielx7/9844746/9844991/09845025.pdf?arnumber=9845025

المؤلفون: Jeong, Taehee, Bollavaram, Manasa, Delaye, Elliott, Sirasao, Ashish

المساهمون: Linte, Cristian A., Siewerdsen, Jeffrey H.

المصدر: Medical Imaging 2021: Image-Guided Procedures, Robotic Interventions, and Modeling

الاتاحة: http://dx.doi.org/10.1117/12.2579256

المؤلفون: Jeong, Taehee, Parikh, Kunj, Chau, Raymond, Huang, Chung Ho, Chan, Henry, Jeon, Hyeran

المصدر: 2021 IEEE 19th World Symposium on Applied Machine Intelligence and Informatics (SAMI)

الاتاحة: http://dx.doi.org/10.1109/sami50585.2021.9378660
http://xplorestaging.ieee.org/ielx7/9378591/9378608/09378660.pdf?arnumber=9378660

المؤلفون: Jeong, Taehee

المصدر: Dissertations.

وصف الملف: application/pdf

الاتاحة: http://repository.cmu.edu/dissertations/66
http://repository.cmu.edu/cgi/viewcontent.cgi?article=1057&context=dissertations

المؤلفون: Jeong, Taehee, Prakash Kankalale, Deeksha, Chau, Raymond, Jeon, Hyeran

المصدر: Proceedings of the 6th IEEE/ACM International Conference on Big Data Computing, Applications and Technologies

الاتاحة: http://dx.doi.org/10.1145/3365109.3368786
https://dl.acm.org/doi/pdf/10.1145/3365109.3368786

المؤلفون: Jeong, Taehee, Mandal, Anubha

المصدر: 2018 17th IEEE International Conference on Machine Learning and Applications (ICMLA)

الاتاحة: http://dx.doi.org/10.1109/icmla.2018.00046
http://xplorestaging.ieee.org/ielx7/8613701/8614025/08614071.pdf?arnumber=8614071

المؤلفون: Lim, Sangho, Choi, Ikhwan, Jeong, Taehee

المصدر: IEEE Sensors Journal ; volume 19, issue 8, page 2937-2945 ; ISSN 1530-437X 1558-1748 2379-9153

الاتاحة: http://dx.doi.org/10.1109/jsen.2019.2892722
http://xplorestaging.ieee.org/ielx7/7361/8668589/08611199.pdf?arnumber=8611199

المؤلفون: Jeong, Taehee, Ham, So-Yeon, Koo, Bonkee, Lee, Phillip, Min, Yo-Sep, Kim, Jae-Yup, Ko, Min Jae

المساهمون: Ministry of Science, ICT and Future Planning, National Research Foundation of Korea, Ministry of Education, Korea Institute of Energy Technology Evaluation and Planning, Ministry of Trade, Industry and Energy

المصدر: Journal of Industrial and Engineering Chemistry ; volume 80, page 106-111 ; ISSN 1226-086X

الاتاحة: http://dx.doi.org/10.1016/j.jiec.2019.07.037
https://api.elsevier.com/content/article/PII:S1226086X19303892?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1226086X19303892?httpAccept=text/plain

المؤلفون: Jo, Jea Woong, Yoo, Yongseok, Jeong, Taehee, Ahn, SeJin, Ko, Min Jae

المساهمون: the framework of Research and Development of the Korea Institute of Energy Research

المصدر: Electronic Materials Letters ; volume 14, issue 6, page 657-668 ; ISSN 1738-8090 2093-6788

الاتاحة: http://dx.doi.org/10.1007/s13391-018-0073-7
http://link.springer.com/article/10.1007/s13391-018-0073-7/fulltext.html
http://link.springer.com/content/pdf/10.1007/s13391-018-0073-7.pdf

المؤلفون: Jeong, Taehee¹, Zhu, Jian-Gang¹, Chung, Suk², Gibbons, Matthew R.³

المصدر: Journal of Applied Physics. Apr2012, Vol. 111 Issue 8, p083510. 7p. 1 Black and White Photograph, 2 Diagrams, 1 Chart, 3 Graphs.

مصطلحات موضوعية: *SILICON nitride, *THIN films, *ELECTRIC insulators & insulation, *MICROELECTRONICS, *DIELECTRICS, *THERMAL boundary layer, *PHONONS

المؤلفون: Linte, Cristian A., Siewerdsen, Jeffrey H., Jeong, Taehee, Bollavaram, Manasa, Delaye, Elliott, Sirasao, Ashish

المصدر: Proceedings of SPIE; February 2021, Vol. 11598 Issue: 1 p115981J-115981J-11, 11482131p

المؤلفون: Park, Jeong-Heon, Park, Chando, Jeong, Taehee, Moneck, Matthew T., Nufer, Noel T., Zhu, Jian-Gang

المصدر: Journal of Applied Physics; Apr2008, Vol. 103 Issue 7, p07A917, 3p

المؤلفون: Jeong, Taehee, Zhu, Jian-Gang, Mao, Sining, Pan, Tao, Tang, Yun Jun

المصدر: International Journal of Thermophysics ; volume 33, issue 6, page 1000-1012 ; ISSN 0195-928X 1572-9567

الاتاحة: http://dx.doi.org/10.1007/s10765-012-1193-1
http://link.springer.com/content/pdf/10.1007/s10765-012-1193-1.pdf
http://link.springer.com/article/10.1007/s10765-012-1193-1/fulltext.html
http://link.springer.com/content/pdf/10.1007/s10765-012-1193-1

المؤلفون: Park, Jeong-Woo, Jeong, TaeHee, Yeon, Cheong, Lee, Dong C., Seo, Hun

المصدر: Joint International Symposium on Optical Memory and Optical Data Storage 1999

الاتاحة: http://dx.doi.org/10.1117/12.997581

المؤلفون: Park, Jeong-Woo, Lee, Dong C., Jeong, TaeHee, Yeon, Cheong, Kim, Sang J., Seo, Hun, Lim, Han-jo

المصدر: Joint International Symposium on Optical Memory and Optical Data Storage 1999

الاتاحة: http://dx.doi.org/10.1117/12.997570

المؤلفون: Park, Jeong-Heon, Park, Chando, Jeong, Taehee, Moneck, Matthew T., Nufer, Noel T., Zhu, Jian-Gang

المصدر: Journal of Applied Physics ; volume 103, issue 7 ; ISSN 0021-8979 1089-7550

الاتاحة: http://dx.doi.org/10.1063/1.2838754
https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/1.2838754/15010546/07a917_1_online.pdf

المؤلفون: Pollarolo, Alessio¹, Jeong, Taehee², Benz, Samuel P.², Rogalla, Horst³

المصدر: IEEE Transactions on Instrumentation & Measurement. Jun2013, Vol. 62 Issue 6, p1512-1517. 6p.

مصطلحات موضوعية: ELECTRIC resistors, ELECTRIC noise, BOLTZMANN'S constant, UNCERTAINTY

الشركة/الكيان: NATIONAL Institute of Standards & Technology (U.S.)