المؤلفون: Chun, H.R., Jeon, I.S., Park, S.Y., Lee, S.J., Kang, S.H., Kim, S.I.

المصدر: British Journal of Anaesthesia ; volume 112, issue 3, page 485-490 ; ISSN 0007-0912

الاتاحة: http://dx.doi.org/10.1093/bja/aet340
https://api.elsevier.com/content/article/PII:S0007091217318597?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0007091217318597?httpAccept=text/plain
http://academic.oup.com/bja/article-pdf/112/3/485/681972/aet340.pdf

المؤلفون: Nam, K.J., Lee, S.H., Kim, D.C., Hyun, S., Kim, J.H., Jeon, I.S., Kang, S.B., Choi, S., Chung, U.I., Moon, J.T.

المصدر: 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual ; page 622-623

الاتاحة: http://dx.doi.org/10.1109/relphy.2007.369981
http://xplorestaging.ieee.org/ielx5/4227591/4227592/04227722.pdf?arnumber=4227722

المؤلفون: Jeon, I.S., Lee, J., Zhao, P., Sivasubramani, P., Oh, T., Kim, J., Cha, D., Huang, J., Kim, M.J., Gnade, B.E., Wallace, R.M.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. ; page 303-306

الاتاحة: http://dx.doi.org/10.1109/iedm.2004.1419139
http://xplorestaging.ieee.org/ielx5/9719/30682/01419139.pdf?arnumber=1419139

المؤلفون: Choi, Y.M., Kim, H.J., Jeon, I.S., Aiga, J.

المصدر: IFAC Proceedings Volumes ; volume 41, issue 2, page 8165-8170 ; ISSN 1474-6670

الاتاحة: http://dx.doi.org/10.3182/20080706-5-kr-1001.01379
https://api.elsevier.com/content/article/PII:S1474667016402624?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1474667016402624?httpAccept=text/plain

المؤلفون: Oh, S.J., Yang, B.S., Jeon, I.S., Seong, H.H., Im, K.S., Lee, J.H., Yoon, D.H., Kim, T.H., Park, Y.Y.

المصدر: Theriogenology ; volume 47, issue 1, page 271 ; ISSN 0093-691X

الاتاحة: http://dx.doi.org/10.1016/s0093-691x(97)82398-9
https://api.elsevier.com/content/article/PII:S0093691X97823989?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0093691X97823989?httpAccept=text/plain

المؤلفون: Kwon, Y.S., Park, T.S., Kim, J.M., An, K.S., Jeon, I.S., Park, C.Y., Kimura, S., Nanba, T., Matsumura, T., Suzuki, T.

المصدر: Physica B: Condensed Matter ; volume 206-207, page 389-391 ; ISSN 0921-4526

الاتاحة: http://dx.doi.org/10.1016/0921-4526(94)00468-b
https://api.elsevier.com/content/article/PII:092145269400468B?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:092145269400468B?httpAccept=text/plain

المؤلفون: Jeon, I.S., Lee, J., Zhao, P., Sivasubramani, P., Oh, T., Kim, H.J., Cha, D., Huang, J., Kim, M.J., Gnade, B.E., Kim, J., Wallace, R.M.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004; 2004, p303-306, 4p