المؤلفون: Jennie E. Hill, T. Owens Walker, Justin A. Blanco, Robert W. Ives, Ryan Rakvic, Bruce Jacob

المصدر: IEEE Access, Vol 12, Pp 63865-63884 (2024)

مصطلحات موضوعية: Classification, hardware performance counters, machine learning, microarchitectural side-channel, ransomware, side-channel analysis, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10510438/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/0ac05952e84641cb9927b77d5634ec3e