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1Academic Journal
المؤلفون: Perneczky, L., Rauwolf, M., Ingerle, D., Eichert, D., Brigidi, F., Jark, W., Bjeoumikhova, S., Pepponi, G., Wobrauschek, P., Streli, C., Turyanskaya, A.
المساهمون: Austrian Science Fund
المصدر: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment ; volume 897, page 114-119 ; ISSN 0168-9002
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2Conference
المؤلفون: Lubeck, J., Bogovac, M., Boyer, B., Detlefs, B., Eichert, D., Fliegauf, R., Grötzsch, D., Holfelder, I., Hönicke, P., Jark, W., Kaiser, R. B., Kanngießer, B., Karydas, A. G., Leani, J. J., Lépy, M. C., Lühl, L., Ménesguen, Y., Migliori, A., Müller, M., Pollakowski, B., Spanier, M., Sghaier, H., Ulm, G., Weser, J., Beckhoff, B.
المصدر: AIP Conference Proceedings ; volume 1741, page 030011 ; ISSN 0094-243X
الاتاحة: http://dx.doi.org/10.1063/1.4952834
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3Conference
المؤلفون: Karydas, A.G., Beckhoff, B., Bogovac, M., Diawara, Y., Eichert, D., Fliegauf, R., Gambitta, A., Grötzsch, D., Herzog, C., Jark, W., Kaiser, R. B., Kanngießer, B., Leani, Juan José, Lühl, L., Kiskinova, M., Lubeck, J., Malzer, W., Migliori, A., Sghaier, H., Vakula, N., Weser, J.
مصطلحات موضوعية: Experimental facility, Advanced X-ray Spectrometry, X-Ray Fluorescence Beamline, Física atómica, molecular y química
وصف الملف: Impreso
Relation: http://hdl.handle.net/11086/17420
الاتاحة: http://hdl.handle.net/11086/17420
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4Conference
المؤلفون: Di Fraia, M., Antonelli, M., Tallaire, A., Achard, J., Carrato, S., Menk, R. H., Cautero, G., Giuressi, D., Jark, W. H., d'Acapito, F., de Sio, A., Pace, E.
المساهمون: Università degli studi di Trieste = University of Trieste, Laboratoire des Sciences des Procédés et des Matériaux (LSPM), Université Paris 13 (UP13)-Institut Galilée-Université Sorbonne Paris Cité (USPC)-Centre National de la Recherche Scientifique (CNRS), Detectors Instrumentat Lab, Trieste, Italy, X-ray Microfluorescence Beamline Multilayer Lab, Trieste, Italy, European Synchrotron Radiation Facility (ESRF), Università degli Studi di Firenze = University of Florence = Université de Florence (UniFI)
المصدر: 11th International Conference on Synchrotron Radiation Instrumentation (SRI)
https://hal.science/hal-01572931
11th International Conference on Synchrotron Radiation Instrumentation (SRI), Jul 2012, Lyon, France. 4 p., ⟨10.1088/1742-6596/425/21/212001⟩مصطلحات موضوعية: [PHYS]Physics [physics]
Relation: hal-01572931; https://hal.science/hal-01572931; https://hal.science/hal-01572931/document; https://hal.science/hal-01572931/file/J_Phys_Conf_Series_425_212001.pdf
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5Academic Journal
المؤلفون: Korytar, D., Vagovic, P., Vegsö, K., Siffalovic, P., Dobrocka, E., Jark, W., Ac, V., Zaprazny, Z., Ferrari, C., Cecilia, A., Hamann, E., Mikulik, P., Baumbach, T., Fiederle, M., Jergel, M.
المصدر: Journal of Applied Crystallography, 46, 945-952 ; ISSN: 0021-8898
مصطلحات موضوعية: ddc:620, Engineering & allied operations, info:eu-repo/classification/ddc/620
Relation: info:eu-repo/semantics/altIdentifier/wos/000322032300019; info:eu-repo/semantics/altIdentifier/issn/0021-8898; https://publikationen.bibliothek.kit.edu/110099288
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6Academic Journal
المؤلفون: Jark, W, Matteucci, M Marco, Menk, RH
المصدر: ISSN:0909-0495.
وصف الملف: application/pdf
Relation: http://repository.tue.nl/712851
الاتاحة: http://repository.tue.nl/712851
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7Academic Journal
المؤلفون: De Caro, L, Jark, W, Menk, RH, Matteucci, M Marco
المصدر: ISSN:0909-0495.
وصف الملف: application/pdf
Relation: http://repository.tue.nl/712850
الاتاحة: http://repository.tue.nl/712850
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8Academic Journal
المؤلفون: Jark, W.
المصدر: X-Ray Spectrometry ; volume 33, issue 6, page 455-461 ; ISSN 0049-8246 1097-4539
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9Academic Journal
المؤلفون: Desiderio, D., Difonzo, S., Dlviacco, B., Jark, W., Krempasky, J., Krempaska, R., Lama, F., Luce, M., Mertins, H. C., Placentini, M., Prosperi, T., Rinaldi, S., Soullie, G., Schäfers, F., Schmolle, F., Stichauer, L., Turchini, S., Walker, R. P., Zema, N.
المصدر: Synchrotron Radiation News ; volume 12, issue 4, page 34-38 ; ISSN 0894-0886 1931-7344
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10Academic Journal
المؤلفون: Di Fonzo, S., Jark, W., Schafers, F., Petersen, H., Gaupp, A., Underwood, J.H.
المصدر: Synchrotron Radiation News ; volume 6, issue 2, page 16-18 ; ISSN 0894-0886 1931-7344
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11Academic Journal
المؤلفون: Pelizzo, M. G., Corso, A. J., Tessarolo, E., Böttger, R., Hübner, R., Napolitani, E., Bazzan, M., Rancan, M., Armelao, L., Jark, W., Eichert, D., Martucci, A.
المساهمون: European Space Agency, Agenzia Spaziale Italiana
المصدر: ACS Applied Materials & Interfaces ; volume 10, issue 40, page 34781-34791 ; ISSN 1944-8244 1944-8252
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12Conference
المؤلفون: ANTONELLI, MATIAS, DI FRAIA, MICHELE, CARRATO, SERGIO, CAUTERO, GIUSEPPE, GANBOLD, TAMIRAA, Tallaire A., Achard J., Menk R. H., Giuressi D., Jark W. H., Biasiol G., Oliver K., Callegari C., Coreno M., De Sio A., Pace E.
المساهمون: Moeller S. P., Yabashi M., Hau-Riege S. P., Antonelli, Matia, DI FRAIA, Michele, Tallaire, A., Achard, J., Carrato, Sergio, Menk, R. H., Cautero, Giuseppe, Giuressi, D., Jark, W. H., Biasiol, G., Ganbold, Tamiraa, Oliver, K., Callegari, C., Coreno, M., De Sio, A., Pace, E.
مصطلحات موضوعية: Beam Position Monitor, Synchrotron, Free Electron Laser, Diamond Detector, Quantum Well, Bunch by Bunch, X-ray, UV
وصف الملف: STAMPA
Relation: info:eu-repo/semantics/altIdentifier/isbn/9780819492210; info:eu-repo/semantics/altIdentifier/wos/WOS:000311837900008; ispartofbook:X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications; Optics + Photonics; volume:8504; firstpage:85040D-1; lastpage:85040D-11; numberofpages:11; journal:PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING; http://hdl.handle.net/11368/2636235; http://hdl.handle.net/11368/2794628; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84872541405
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13Conference
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14Academic Journal
المؤلفون: Jark, W., Eichert, D.
المصدر: Journal of Analytical Atomic Spectrometry ; volume 30, issue 12, page 2548-2550 ; ISSN 0267-9477 1364-5544
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15Book
المؤلفون: Lagomarsino, S., Bukreeva, I., Cedola, A., Pelliccia, D., Jark, W.
مصطلحات موضوعية: ddc:620, Engineering & allied operations, info:eu-repo/classification/ddc/620
Relation: info:eu-repo/semantics/altIdentifier/isbn/978-3-540-74560-0; https://publikationen.bibliothek.kit.edu/150072490
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16Academic Journal
المؤلفون: Simon, M., Reznikova, E., Nazmov, V., Last, A., Jark, W.
مصطلحات موضوعية: ddc:620, Engineering & allied operations, info:eu-repo/classification/ddc/620
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17Conference
المؤلفون: Simon, M., Reznikova, E., Nazmov, V., Last, A., Jark, W.
المساهمون: Goto, Shunji, Khounsary, Ali M., Morawe, Christian
المصدر: SPIE Proceedings ; Advances in X-Ray/EUV Optics and Components III ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.795423
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18Conference
المؤلفون: Jark, W., Matteucci, M., Menk, R. H., Rigon, L., De Caro, L.
المساهمون: Goto, Shunji, Khounsary, Ali M., Morawe, Christian
المصدر: SPIE Proceedings ; Advances in X-Ray/EUV Optics and Components III ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.804383
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19Academic Journal
المؤلفون: Jark, W., Grenci, G.
المساهمون: MECHANOBIOLOGY INSTITUTE
المصدر: Scopus
Relation: Jark, W., Grenci, G. (2014-03-01). Bidimensional focusing of x rays by refraction in an edge. Optics Letters 39 (5) : 1250-1253. ScholarBank@NUS Repository. https://doi.org/10.1364/OL.39.001250; http://scholarbank.nus.edu.sg/handle/10635/128513; 000332233300038
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20Academic Journal
المؤلفون: Antonelli, M, Ganbold, T, Menk, R H, Cautero, G, Jark, W H, Eichert, D M, Biasiol, G
المصدر: Journal of Instrumentation ; volume 9, issue 05, page C05034-C05034 ; ISSN 1748-0221