المؤلفون: Nicolò D'Anna, Dario Ferreira Sanchez, Guy Matmon, Jamie Bragg, Procopios C. Constantinou, Taylor J.Z. Stock, Sarah Fearn, Steven R. Schofield, Neil J. Curson, Marek Bartkowiak, Y. Soh, Daniel Grolimund, Simon Gerber, Gabriel Aeppli

المصدر: Advanced Electronic Materials, Vol 9, Iss 5, Pp n/a-n/a (2023)

مصطلحات موضوعية: doped silicon devices, non‐destructive sub‐surface imaging, X‐ray fluorescence, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2199-160X

URL الوصول: https://doaj.org/article/4c5c4e033fa84dad9f3b4d2c476d593f