المؤلفون: Jacques Boulmer, Dominique Débarre, T. Kociniewski, A. Bhaduri, Frédéric Fossard

المصدر: Applied Surface Science. 258:9228-9232

مصطلحات موضوعية: Materials science, Dopant, Silicon, Doping, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Surfaces and Interfaces, General Chemistry, Conductivity, Condensed Matter Physics, Laser, Drude model, Surfaces, Coatings and Films, law.invention, Gas immersion laser doping, chemistry, law, Spectroscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ca512cdc736dd998882981b803e9bfbc
https://doi.org/10.1016/j.apsusc.2011.10.077

المؤلفون: Jacques Boulmer, Daniel Bouchier, T. Kociniewski, Frédéric Fossard

المصدر: Thin Solid Films. 518:2542-2545

مصطلحات موضوعية: Materials science, Silicon, business.industry, Metals and Alloys, chemistry.chemical_element, Heterojunction, Germanium, Surfaces and Interfaces, Epitaxy, Laser, Fluence, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Optics, Strain engineering, chemistry, law, Materials Chemistry, Optoelectronics, Wafer, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d4cb2d9e517aedeb60ce8977c107a2c8
https://doi.org/10.1016/j.tsf.2009.09.154

المؤلفون: Davide Cammilleri, Daniel Bouchier, C. Tran Manh, Dominique Débarre, N. Yam, Frédéric Fossard, Mathieu Halbwax, Jacques Boulmer

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

المصدر: Thin Solid Films
Thin Solid Films, Elsevier, 2008, 517, pp.327-330. ⟨10.1016/j.tsf.2008.08.147⟩
Thin Solid Films, 2008, 517, pp.327-330. ⟨10.1016/j.tsf.2008.08.147⟩

مصطلحات موضوعية: Materials science, chemistry.chemical_element, Germanium, 02 engineering and technology, Dielectric, 01 natural sciences, law.invention, Optics, Stack (abstract data type), law, Dielectric mirror, 0103 physical sciences, Materials Chemistry, Microelectronics, 010302 applied physics, business.industry, Metals and Alloys, Surfaces and Interfaces, 021001 nanoscience & nanotechnology, Laser, Distributed Bragg reflector, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Wavelength, chemistry, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4a870a2f78f09a4477a61bc6d8b9855c
https://doi.org/10.1016/j.tsf.2008.08.147

المؤلفون: Daniel Bouchier, Véronique Mathet, Davide Cammilleri, Dominique Débarre, Jacques Boulmer, Mathieu Halbwax, Frédéric Fossard, Huu Lam Nguyen, Vy Yam

المصدر: ECS Transactions. 3:593-598

مصطلحات موضوعية: Materials science, business.industry, Optoelectronics, business, Epitaxy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b8b2bc3b252f995c4a3a0376745039b8
https://doi.org/10.1149/1.2355856

المؤلفون: Dominique Débarre, G. Kerrien, Jacques Boulmer, Kuniyuki Kakushima, C. Laviron, M. Hernandez, Thierry Sarnet, Alain Bosseboeuf, Nourdin Yaakoubi, Elisabeth Dufour-Gergam, Tarik Bourouina, J. Venturini

المصدر: Applied Surface Science. 247:537-544

مصطلحات موضوعية: Materials science, Silicon, Dopant, business.industry, Doping, General Physics and Astronomy, chemistry.chemical_element, Silicon on insulator, Nanotechnology, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Laser, Surfaces, Coatings and Films, law.invention, Gas immersion laser doping, Semiconductor, chemistry, law, Optoelectronics, Microelectronics, Crystalline silicon, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e67293178df8972e00aeb0c363080f8c
https://doi.org/10.1016/j.apsusc.2005.01.172

المؤلفون: Dominique Débarre, Bogdan Dragnea, Bernard Bourguignon, Jacques Boulmer

المصدر: Journal of Applied Physics. 90:449-455

مصطلحات موضوعية: Diffraction, Materials science, Low-energy electron diffraction, Electron diffraction, law, Wide-bandgap semiconductor, Analytical chemistry, General Physics and Astronomy, Crystallite, Laser, Layer (electronics), Overlayer, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::935828654743362cf6645cd80a05712c
https://doi.org/10.1063/1.1379054

المؤلفون: Bogdan Dragnea, Jacques Boulmer, Jean-Pierre Budin, Bernard Bourguignon, Dominique Débarre

المصدر: Physical Review B. 55:13904-13915

مصطلحات موضوعية: Auger electron spectroscopy, Materials science, Recrystallization (geology), Thermal desorption spectroscopy, Desorption, Diffusion, Analytical chemistry, Thermal desorption, Fast atom bombardment, Soft laser desorption

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c13b3878eccd54f4f2df76722f910052
https://doi.org/10.1103/physrevb.55.13904

المؤلفون: P. Roca i Cabarrocas, C. Clerc, Christian Godet, C. Guedj, F. Houze, Daniel Bouchier, G. Calvarin, D. Mencaraglia, Jacques Boulmer

المصدر: Applied Surface Science. 102:28-32

مصطلحات موضوعية: Materials science, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Germanium, Surfaces and Interfaces, General Chemistry, Substrate (electronics), Condensed Matter Physics, Channelling, Laser, Epitaxy, Fluence, Surfaces, Coatings and Films, law.invention, Amorphous solid, Crystallography, chemistry, law, Spectroscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8c3a1a6ab8f9288b84fceaba7626803f
https://doi.org/10.1016/0169-4332(96)00013-x

المؤلفون: J.-P. Budin, Jacques Boulmer, A. Desmur, J.-B. Ozenne, Bernard Bourguignon, Dominique Débarre, A. Aliouchouche

المصدر: Journal of Applied Physics. 76:3081-3087

مصطلحات موضوعية: inorganic chemicals, Materials science, Silicon, Dopant, Annealing (metallurgy), Doping, Inorganic chemistry, technology, industry, and agriculture, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Isotropic etching, Fluence, chemistry, Desorption, Boron

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::83cdf26f2779b7e283b26153688b0fc0
https://doi.org/10.1063/1.357490

المؤلفون: T. Kociniewski, Guy Fishman, Olivier Kermarrec, T.-P. Ngo, R. Jakomin, Xavier Checoury, Isabelle Sagnes, Daniel Bensahel, Sébastien Sauvage, Philippe Boucaud, Dominique Débarre, M. El Kurdi, Jean-Francois Damlencourt, Jacques Boulmer

المصدر: 2009 6th IEEE International Conference on Group IV Photonics.

مصطلحات موضوعية: Photoluminescence, Materials science, Silicon, business.industry, Doping, chemistry.chemical_element, Germanium, Laser, Semiconductor laser theory, law.invention, chemistry, law, Optoelectronics, Electronic band structure, business, Photonic crystal

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e137450866205edac5abf9d805dc26de
https://doi.org/10.1109/group4.2009.5338363

المؤلفون: Alain Bosseboeuf, Dominique Débarre, Bernard Bourguignon, E. Finkman, Bogdan Dragnea, Jacques Boulmer, Cyril Guedj

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Materials science, Laser ablation, Excimer laser, medicine.medical_treatment, Analytical chemistry, Laser, Isotropic etching, Fluence, law.invention, Chemical species, law, Chemical-mechanical planarization, medicine, Thin film

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::63509e14202a9328d1155d55d2f6ae44
https://doi.org/10.1117/12.308609

المؤلفون: Jean-Pierre Budin, Bernard Bourguignon, Jacques Boulmer, A. Aliouchouche, Dominique Débarre

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Silicon, chemistry, Excimer laser, Etching (microfabrication), medicine.medical_treatment, medicine, chemistry.chemical_element, Context (language use), Dry etching, Reactive-ion etching, Photochemistry, Copper, Isotropic etching

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::96bd6ab9c0281c951f37a4a2536b25f1
https://doi.org/10.1117/12.206272

المؤلفون: Frédéric Fossard, Jacques Boulmer, Franck Fortuna, Daniel Bouchier, Cyril Bachelet, Jean-Luc Perrossier, Véronique Mathet, Dominique Débarre

المساهمون: Institut d'électronique fondamentale (IEF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), CSNSM SEMI, Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), CSNSM PS2, Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)-Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)

المصدر: Applied Physics Letters
Applied Physics Letters, American Institute of Physics, 2008, 93, pp.021911. ⟨10.1063/1.2956674⟩

مصطلحات موضوعية: Diffraction, Materials science, Physics and Astronomy (miscellaneous), Silicon, FABRICATION, Analytical chemistry, chemistry.chemical_element, 02 engineering and technology, 01 natural sciences, SHALLOW JUNCTION FORMATION, GILD, Adsorption, 0103 physical sciences, HETEROSTRUCTURES, INDUCED EPITAXY, SILICON, 010302 applied physics, Doping, 021001 nanoscience & nanotechnology, Rutherford backscattering spectrometry, Gas immersion laser doping, chemistry, X-ray crystallography, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], 0210 nano-technology, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9eee36ad3b96bad87f3260d7174e0ba7
https://doi.org/10.1063/1.2956674

المؤلفون: Jean-Marie Lecomte, Pierre Pillet, Pierre Camus, Jacques Boulmer

المصدر: Atoms in Strong Fields ISBN: 9781475793369

مصطلحات موضوعية: Physics, symbols.namesake, Field (physics), Stark effect, Excited state, Ionization, symbols, Rydberg formula, Rydberg state, Atomic physics, Microwave cavity, Ion

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a5c4810818fd8300b3a3e74bc89a34ff
https://doi.org/10.1007/978-1-4757-9334-5_26

المؤلفون: Frédéric Fossard, Mathieu HALBWAX, Vy YAM, Huu Lam Nguyen, Véronique Mathet, Davide Cammilleri, Dominique Débarre, Jacques Boulmer, Daniel BOUCHIER

المصدر: ECS Meeting Abstracts. :1463-1463

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bf83fd3fb39297c904ec5c2b2a35f021
https://doi.org/10.1149/ma2006-02/31/1463

المؤلفون: Regina Bonanno, John Weiner, Jacques Boulmer

المصدر: Physical Review A. 28:604-608

مصطلحات موضوعية: Physics, Reaction rate constant, Ionization, Atomic physics, Constant (mathematics), Alkali metal, Electromagnetic radiation, Beam (structure), Charged particle, Ion

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d234e0ebfdd2450f221da6d81f61d2aa
https://doi.org/10.1103/physreva.28.604

المؤلفون: M. X. Wang, Jacques Boulmer, John Weiner, J. Keller

المصدر: Physical Review A. 34:4497-4500

مصطلحات موضوعية: Physics, Cross section (physics), Ionization, Atomic physics, Collision, Anisotropy, Electromagnetic radiation, Excitation, Charged particle, Ion

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::015594508f2eeb94307213f43a6fb7c0
https://doi.org/10.1103/physreva.34.4497

المؤلفون: Jacques Boulmer, John Weiner

المصدر: Physical Review A. 27:2817-2825

مصطلحات موضوعية: Physics, Photon, Ionization, Optical radiation, Absorption (logic), Atomic physics, Radiation, Molecular physics, Beam (structure), Charged particle, Ion

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4fb195221b8dbf408b48b45ca9c24e48
https://doi.org/10.1103/physreva.27.2817

المؤلفون: Jacques Boulmer, John Weiner, M. X. Wang, J. Keller

المصدر: Physical Review A. 35:934-937

مصطلحات موضوعية: Excitation function, Physics, Angular momentum, Range (particle radiation), Cross section (physics), Excited state, Ionization, Singlet state, Atomic physics, Spin (physics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::02d1cba0762e33b9565536c22ce7e115
https://doi.org/10.1103/physreva.35.934