المؤلفون: Koray Karakaya, A. Zinine, J.G.M. van Berkum, P. Graat, M.A. Verheijen, Z.M. Rittersma, A.J.H.M. Rijnders, D.H.A. Blank

المساهمون: Inorganic Materials Science, Physics of Interfaces and Nanomaterials

المصدر: None

مصطلحات موضوعية: METIS-228657

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::febc5c3c37ae3fae484c4888600dbac8
https://research.utwente.nl/en/publications/characterization-of-laminated-ceo2hfo2-highk-gate-delectrics-deposited-by-pulsed-laser-deposition(6b342d0e-8eb2-4f80-954a-beaee0fc39b8).html

المؤلفون: J. Schmitz, M. van Gestel, P.A. Stolk, Y.V. Ponomarev, F. Roozeboom, J.G.M. van Berkum, P.C. Zalm, P.H. Woerlee

المساهمون: Applied Physics and Science Education

المصدر: Proceedings of the IEDM, international electron devices meeting : technical digest, December 6-9, 1998, San Francisco, California, USA, 1009-1012
STARTPAGE=1009;ENDPAGE=1012;TITLE=Proceedings of the IEDM, international electron devices meeting : technical digest, December 6-9, 1998, San Francisco, California, USA
Scopus-Elsevier

مصطلحات موضوعية: Materials science, Fabrication, Dopant, Silicon, business.industry, Doping, Oxide, chemistry.chemical_element, chemistry.chemical_compound, Ion implantation, CMOS, chemistry, Electronic engineering, Optoelectronics, business, NMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c28ab2078b01bcfa6c7d00efd732ce2a
https://research.tue.nl/nl/publications/7c9a4a7c-7902-4b26-b330-d3565f74aaa0

المؤلفون: R.J.P. Lander, Y.V. Ponomarev, J.G.M. van Berkum, W.B. de Boer, R. Loo, M. Caymax

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.imec.be/6/AApples/philips.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.24.7570; http://www.imec.be/6/AApples/philips.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.24.7570
http://www.imec.be/6/AApples/philips.pdf

المؤلفون: Jacob Hooker, Robert Lander, Florence Cubaynes, Tom Schram, F. Roozeboom, Jeroen van Zijl, Martien Maas, Eric van den Heuvel, Emile Naburgh, J.G.M. van Berkum, Y. Tamming, Thuy Dao, Kirklen Henson, Marc Schaekers, Annemie Van Ammel, Zsolt Tokei, Marc Demand, Charles Dachs

المصدر: ECS Meeting Abstracts. :632-632

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e841cb8c9db88eb324e386bbefbbe872
https://doi.org/10.1149/ma2005-01/14/632