المؤلفون: K.B. Crawford, W.R. Crain, S.J. Hansel, R. Koga, S.H. Penzin, J.F. Kirshman

المصدر: IEEE Transactions on Nuclear Science. 43:2968-2973

مصطلحات موضوعية: Nuclear and High Energy Physics, Engineering, Switched-mode power supply, business.industry, Event (relativity), Hardware_PERFORMANCEANDRELIABILITY, Radiation, Spaceflight, law.invention, Nuclear Energy and Engineering, Pulse circuits, Single event upset, law, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, business, Pulse-width modulation, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f5dcb309c24b867667ba4ce619311cdc
https://doi.org/10.1109/23.556893

المؤلفون: J.F. Kirshman, R. Koga, K.B. Crawford, S.D. Pinkerton, W.R. Crain, S.J. Hansel

المصدر: IEEE Transactions on Nuclear Science. 43:931-935

مصطلحات موضوعية: Physics, Nuclear and High Energy Physics, Nuclear Energy and Engineering, Hardening (metallurgy), Resistive load, Electronic engineering, Bit error rate, Electrical and Electronic Engineering, Radiation hardening, Upset, Semiconductor storage devices, Computational physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::74dbd484f5ec1321ec9c521f5d6a1b62
https://doi.org/10.1109/23.510736

المؤلفون: S.J. Hansel, K.B. Crawford, J.F. Kirshman, S.D. Pinkerton, W.R. Crain, Steven C. Moss, S.H. Penzin, R. Koga, M.C. Maher

المصدر: IEEE Transactions on Nuclear Science. 42:1823-1828

مصطلحات موضوعية: Nuclear and High Energy Physics, Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Transistor, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, Electrostatic induction, Emitter-coupled logic, law.invention, Nuclear Energy and Engineering, CMOS, law, Single event upset, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electrical and Electronic Engineering, business, Common emitter, Shift register

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::88f3d1e180205ccf5799028659f479d9
https://doi.org/10.1109/23.488785