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المؤلفون: C. Porret, J.-L. Everaert, M. Schaekers, L.-A. Ragnarsson, A. Hikavyy, E. Rosseel, G. Rengo, R. Loo, R. Khazaka, M. Givens, X. Piao, S. Mertens, N. Heylen, H. Mertens, C. Toledo De Carvalho Cavalcante, G. Sterckx, S. Brus, A. Nalin Mehta, M. Korytov, D. Batuk, P. Favia, R. Langer, G. Pourtois, J. Swerts, E. Dentoni Litta, N. Horiguchi
المصدر: 2022 International Electron Devices Meeting (IEDM).
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المؤلفون: C. Porret, Y.H. Huang, G. Rengo, H. Yu, M. Schaekers, J.-L. Everaert, M. Heyns, A. Vohra, A. Hikavyy, E. Rosseel, R. Langer, R. Loo
المصدر: Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Materials science, Strain (chemistry), business.industry, Electrical resistivity and conductivity, Doping, Optoelectronics, Ohm, business, Epitaxy
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3
المؤلفون: Fareen Adeni Khaja, Marc Schaekers, H. van Meer, Hao Yu, Naoto Horiguchi, Lee Jae Young, Y.-L. Jiang, L.-L. Wang, Dan Mocuta, Kelly E Hollar, L. Date, J.-L. Everaert, Wolfgang R. Aderhold, J. del Agua Borniquel, Abhilash J. Mayur, K. De Meyer, Andriy Hikavyy
المصدر: 2017 Symposium on VLSI Technology.
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Annealing (metallurgy), Doping, 02 engineering and technology, Conductivity, 021001 nanoscience & nanotechnology, 01 natural sciences, Silicon-germanium, PMOS logic, chemistry.chemical_compound, chemistry, Transmission electron microscopy, Electrical resistivity and conductivity, 0103 physical sciences, Electronic engineering, Optoelectronics, Nanosecond laser, 0210 nano-technology, business
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المؤلفون: Tarun Agarwal, Liesbeth Witters, S. A. Chew, Jerome Mitard, Kathy Barla, Pierre Eyben, Hao Yu, Niamh Waldron, Aaron Thean, Thomas Chiarella, K. De Meyer, Nadine Collaert, Steven Demuynck, Geoffrey Pourtois, Erik Rosseel, Andriy Hikavyy, Marc Schaekers, Clement Merckling, Naoto Horiguchi, Dan Mocuta, J.-L. Everaert, Stefan Kubicek, Anda Mocuta, A. Sibaja-Hernandez
المصدر: 2016 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Materials science, Silicon, business.industry, Doping, chemistry.chemical_element, Heterojunction, 02 engineering and technology, Conductivity, 021001 nanoscience & nanotechnology, 01 natural sciences, Band offset, Silicon-germanium, chemistry.chemical_compound, chemistry, Electrical resistivity and conductivity, 0103 physical sciences, Density of states, Electronic engineering, Optoelectronics, 0210 nano-technology, business
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المؤلفون: S. A. Chew, K. De Meyer, Steven Demuynck, Erik Rosseel, Aaron Thean, Kathy Barla, Stefan Kubicek, Antony Premkumar Peter, Anda Mocuta, Marc Schaekers, Naoto Horiguchi, J.-L. Everaert, Nadine Collaert, Hao Yu
المصدر: 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC).
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Doping, 02 engineering and technology, 021001 nanoscience & nanotechnology, Epitaxy, 01 natural sciences, chemistry.chemical_compound, Semiconductor, CMOS, chemistry, Transmission line, Electrical resistivity and conductivity, 0103 physical sciences, Silicide, Electronic engineering, Optoelectronics, Ohm, 0210 nano-technology, business
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المؤلفون: A. Meszaros, P. Tutto, Marshall Wilson, A. Pap, J.-L. Everaert, Krisztián Kis-Szabó, T. Pavelka, Piotr Edelman, Jacek Lagowski, Erik Rosseel, Andrew Findlay
المصدر: ECS Transactions. 28:33-41
مصطلحات موضوعية: Materials science, business.industry, Analytical chemistry, Optoelectronics, Inversion (meteorology), Dielectric, business, Sheet resistance
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المؤلفون: Barry O'Sullivan, V. Kaushik, M.M. Heyns, Lars-Ake Ragnarsson, Luigi Pantisano, J.-L. Everaert, S. DeGendt, E. Rohr, Lionel Trojman
المساهمون: Cork Constraint Computation Centre (4C UCC), University College Cork (UCC), Laboratoire d'Informatique, Signal et Image, Electronique et Télécommunication (LISITE), Institut Supérieur d'Electronique de Paris (ISEP), IMEC (IMEC), Catholic University of Leuven - Katholieke Universiteit Leuven (KU Leuven)
المصدر: IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2007, 54 (7), pp.1771-1775. ⟨10.1109/TED.2007.898460⟩مصطلحات موضوعية: 010302 applied physics, Electron mobility, Materials science, Analytical chemistry, chemistry.chemical_element, Equivalent oxide thickness, 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, 01 natural sciences, 7. Clean energy, Silicate, [SPI.MAT]Engineering Sciences [physics]/Materials, Electronic, Optical and Magnetic Materials, Hafnium, chemistry.chemical_compound, chemistry, 0103 physical sciences, Wafer, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Electrical and Electronic Engineering, 0210 nano-technology, Current density, ComputingMilieux_MISCELLANEOUS, High-κ dielectric
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المؤلفون: Rita Verbeeck, L. Date, Aude Rothschild, J.-L. Everaert, Christa Vrancken, Anabela Veloso, Masaaki Niwa, Ingrid Debusschere, O. Richard, M. de Potter, Philippe Absil, Malgorzata Jurczak, Christoph Kerner, Thierry Conard, Serge Biesemans, Anne Lauwers, X. Shi, R. Mitsuhashi
المصدر: Microelectronics Reliability. 47:521-524
مصطلحات موضوعية: Engineering, business.industry, Design of experiments, Transistor, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, PMOS logic, law.invention, Plasma nitridation, Reference process, CMOS, law, Electronic engineering, Optoelectronics, Response surface methodology, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, NMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2a147b28fc145bf8494394fe6b1d8944
https://doi.org/10.1016/j .microrel.2007.01.042 -
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المؤلفون: Erik Rosseel, Stefan Kubicek, Kathy Barla, Marc Schaekers, Antony Premkumar Peter, Thomas Chiarella, Naoto Horiguchi, W.-B. Song, Aaron Thean, J-A. Ragnarsson, Steven Demuynck, Ju-Bum Lee, K. De Meyer, Hao Yu, D.I. Kim, J.-L. Everaert, Nadine Collaert
المصدر: 2015 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Materials science, Silicon, chemistry, Electrical resistivity and conductivity, Annealing (metallurgy), Metallurgy, Doping, Analytical chemistry, chemistry.chemical_element, Thermal stability, Conductivity, Epitaxy
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المؤلفون: Werner Boullart, Serge Vanhaelemeersch, Dries Dictus, Chao Zhao, S. Van Elshocht, J.-L. Everaert, Vasile Paraschiv, S. De Gendt, Annelies Delabie, Thierry Conard, Martine Claes
المصدر: ECS Transactions. 1:633-644
مصطلحات موضوعية: Thin layers, Materials science, Renewable Energy, Sustainability and the Environment, Gate dielectric, Metallurgy, Analytical chemistry, chemistry.chemical_element, Chemical vapor deposition, Condensed Matter Physics, Nitrogen, Silicate, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Hafnium, chemistry.chemical_compound, chemistry, Electrode, Materials Chemistry, Electrochemistry, Nitriding
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المؤلفون: L. Haspeslagh, D. Maes, Ludovic Goux, Dirk Wouters, Judit Lisoni, M. Schwitters, P. Casella, L. Autryve, Vasile Paraschiv, G. Russo, R. Zambrano, G. Corallo, C. Artoni, J.-L. Everaert, C. Caputa, H. Monchoix
المصدر: Integrated Ferroelectrics. 66:71-83
مصطلحات موضوعية: Materials science, business.industry, Contact resistance, Condensed Matter Physics, Ferroelectricity, Ferroelectric capacitor, Electronic, Optical and Magnetic Materials, law.invention, Capacitor, CMOS, Hardware_GENERAL, Control and Systems Engineering, law, Ferroelectric RAM, Hardware_INTEGRATEDCIRCUITS, Materials Chemistry, Ceramics and Composites, Optoelectronics, Metalorganic vapour phase epitaxy, Electrical and Electronic Engineering, business, Electrical conductor
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المؤلفون: J. G. Lisoni, J. Johnson, J. L. Everaert, V. Paraschiv, W. Boullart, D. Maes, L. Haspeslagh, D. J. Wouters, C. Caputa, P. Casella, R. Zambrano, G. Vecchio, H. Monchoix, L. Van Autryve
المصدر: Integrated Ferroelectrics. 53:257-267
مصطلحات موضوعية: Control and Systems Engineering, Materials Chemistry, Ceramics and Composites, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
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المؤلفون: C. Caputa, Judit Lisoni, H. Monchoix, Dirk Wouters, L. Haspeslagh, J. A. Johnson, J.-L. Everaert, Werner Boullart, D. Maes, Raffaele Zambrano, P. Casella, G. Vecchio, Vasile Paraschiv, L. Van Autryve
المصدر: Integrated Ferroelectrics. 53:257-267
مصطلحات موضوعية: Materials science, chemistry.chemical_element, Condensed Matter Physics, Thermal expansion, Electronic, Optical and Magnetic Materials, law.invention, chemistry, Chemical engineering, Control and Systems Engineering, law, Electrode, Materials Chemistry, Ceramics and Composites, Thermal stability, Iridium, Electrical and Electronic Engineering, Crystallization, Polarization (electrochemistry), Platinum, Layer (electronics)
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المؤلفون: Annelies Delabie, Serge Biesemans, Shou-Zen Chang, Hui Yu, T. Y. Hoffmann, Anne Lauwers, J.-L. Everaert, Anabela Veloso, Christoph Kerner, Philippe Absil
المصدر: IEEE Electron Device Letters. 28:634-636
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Ring oscillator, Capacitance, Electronic, Optical and Magnetic Materials, Atomic layer deposition, CMOS, Low-power electronics, Logic gate, Optoelectronics, Electrical and Electronic Engineering, Thin film, business, Leakage (electronics)
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المؤلفون: R.L. Van Meirhaeghe, J L Everaert, J. Uyttenhove, Felix Cardon, F. Verhaegen
المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 117:397-402
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Silicon, business.industry, Schottky barrier, Analytical chemistry, chemistry.chemical_element, Radiation, Acceptor, Reduction (complexity), Semiconductor, chemistry, Electron beam processing, Optoelectronics, business, Instrumentation, Diode
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المؤلفون: J L Everaert, Felix Cardon, W.H. Laflère, R. L. Van Meirhaeghe
المصدر: Semiconductor Science and Technology. 10:504-508
مصطلحات موضوعية: Condensed matter physics, Passivation, Hydrogen, Chemistry, business.industry, Schottky barrier, Schottky diode, chemistry.chemical_element, Polishing, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Condensed Matter::Materials Science, Semiconductor, Optics, Ballistic conduction, Materials Chemistry, Electrical and Electronic Engineering, business, Ballistic electron emission microscopy
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المصدر: 2009 International Workshop on Junction Technology.
مصطلحات موضوعية: Electron mobility, Ion implantation, Materials science, Silicon, chemistry, Scattering, Annealing (metallurgy), Doping, Analytical chemistry, chemistry.chemical_element, Boron, Sheet resistance
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المؤلفون: Lars-Ake Ragnarsson, Serge Biesemans, R. Schreutelkamp, O. Richard, Stefan Kubicek, Erik Rosseel, Philippe Absil, Paola Favia, T. Y. Hoffmann, Tom Schram, Y. Okuno, Thomas Chiarella, J.-L. Everaert, Christoph Kerner, C. Ortolland
المصدر: 2009 International Workshop on Junction Technology.
مصطلحات موضوعية: Materials science, business.industry, Laser, Semiconductor laser theory, PMOS logic, law.invention, CMOS, law, Logic gate, Scalability, Electronic engineering, Optoelectronics, business, NMOS logic, High-κ dielectric
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المؤلفون: T. Pavelka, C. Ortolland, J.-L. Everaert, Erik Rosseel, E. Don, T. Y. Hoffmann, Marc Aoulaiche
المصدر: 2008 16th IEEE International Conference on Advanced Thermal Processing of Semiconductors.
مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Gate dielectric, Dielectric, Laser, law.invention, Semiconductor laser theory, Metrology, law, Stress relaxation, Optoelectronics, Crystallization, business
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المؤلفون: G. Vecchio, Wilfried Vandervorst, J.-L. Everaert, G. Zschatzsch, L. Cunnane
المصدر: 2008 16th IEEE International Conference on Advanced Thermal Processing of Semiconductors.
مصطلحات موضوعية: Argon, Materials science, Dopant, Annealing (metallurgy), fungi, Doping, Analytical chemistry, food and beverages, chemistry.chemical_element, Plasma, Plasma-immersion ion implantation, Metrology, chemistry, Sheet resistance