المؤلفون: H. Yoon, Vinayak Bharat Naik, J. Kwon, K. Yamane, L. Pu, J. H. Lim, S. T. Woo, O. Kallensee, J. Hwang, Y. S. You, S. Ong, Jeff J. Xu, L. Zhang, Tae Young Lee, S. H. Jang, S. K L. C. Goh, F. Tan, Eng Huat Toh, D. Zeng, N. Balasankaran, Soh Yun Siah, Hemant Dixit, T. H. Chan, N. L. Chung, R. Low, G. Congedo, R. Chao, Y. Otani, Johannes Mueller, C.G. Lee, T. Merbeth, J. W. Ting, L. Y. Hau, K. W. Gan, Y. Huang, A. Vogel, E. Quek, C. Chiang, Behtash Behin-Aein, W. P. Neo, T. Ling, V. Kriegerstein, Chim Seng Seet, Jen Shuang Wong, B. Pfefferling

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Magnetoresistive random-access memory, Computer science, business.industry, Automotive industry, Silicon on insulator, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Automotive engineering, Reliability (semiconductor), Stack (abstract data type), JEDEC memory standards, Soldering, 0103 physical sciences, Data retention, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2297be3b6e345d353ce3138acd58f0cd
https://doi.org/10.1109/iedm13553.2020.9371935

المؤلفون: S. T. Woo, Y. Otani, S. Ong, N. L. Chung, R. Low, D. Zeng, L. Y. Hau, S. Y. Siah, J. H. Lim, J. Hwang, L. Zhang, J. Chang, S. H. Jang, Y. S. You, F. Tan, L. C. Goh, T. Ling, Chim Seng Seet, J. Kwon, K. Yamane, Vinayak Bharat Naik, R. Chao, N. Balasankaran, T. H. Chan, J. W. Ting, Tae Young Lee

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Magnetoresistive random-access memory, Computer science, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Stack (abstract data type), Margin (machine learning), 0103 physical sciences, Key (cryptography), Electronic engineering, Macro, Data retention, 0210 nano-technology, Device parameters, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0bead89c44fb678ee1674ac0f0d28e99
https://doi.org/10.1109/iedm13553.2020.9372015

المؤلفون: V. B. Naik, K. Yamane, J. H. Lim, T. Y. Lee, J. Kwon, Behin Aein, N. L. Chung, L. Y. Hau, R. Chao, D. Zeng, Y. Otani, C Chiang, Y. Huang, L. Pu, N. Thiyagarajah, S. H. Jang, W. P. Neo, H. Dixit, S.K Aris, L. C. Goh, T. Ling, J. Hwang, J. W. Ting, L. Zhang, R. Low, N. Balasankaran, C. S. Seet, S. Ong, J. Wong, Y. S. You, S. T. Woo, S. Y. Siah

المصدر: 2020 IEEE Symposium on VLSI Technology.

مصطلحات موضوعية: Magnetoresistive random-access memory, Materials science, Stack (abstract data type), Failure rate, Time-dependent gate oxide breakdown, Static random-access memory, Cache, Macro, Simulation, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b950a86848127f4ffc230063ff57e42d
https://doi.org/10.1109/vlsitechnology18217.2020.9265086

المؤلفون: R. Chao, C. Chiang, R. Low, S. T. Woo, S. H. Jang, N. Balasankaran, F. Tan, J.H. Lim, L. Y. Hau, J. Kwon, Vinayak Bharat Naik, K. Yamane, L. C. Goh, Y. S. You, W. P. Neo, Naganivetha Thiyagarajah, Kevin Khua, Y. Huang, J. W. Ting, K. Sivabalan, Tae Young Lee, T. Ling, L. Zhang, Chim Seng Seet, Jen Shuang Wong, Y. Otani, J. Hwang, D. Zeng, S. Ong, Soh Yun Siah, N. L. Chung

المصدر: 2020 IEEE Symposium on VLSI Technology.

مصطلحات موضوعية: Very-large-scale integration, Magnetoresistive random-access memory, Stack (abstract data type), Computer science, Electronic engineering, Bit error rate, Data retention, Macro, Scaling, Fast switching

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1665aecda9e6972943c9f7a79be5742c
https://doi.org/10.1109/vlsitechnology18217.2020.9265027

المؤلفون: Vinayak Bharat Naik, S. L Tan, W. P. Neo, J. H. Lim, Kevin Khua, T. Ling, J. Hwang, Y. S. You, R. Chao, Chim Seng Seet, L. C. Goh, S. T. Woo, K. Yamane, D. Zeng, R. Low, Naganivetha Thiyagarajah, Behtash Behin-Aein, N. Balasankaran, S. H. Jang, Eng Huat Toh, J. W. Ting, Tae Young Lee, E. Quek, L. Zhang, K. Sivabalan, L. Y. Hau, Y. Otani, S. Ong, Soh Yun Siah, N. L. Chung, J. Kwon

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Magnetoresistive random-access memory, Computer science, Ranging, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Reliability engineering, Reliability (semiconductor), 0103 physical sciences, Production (economics), Static random-access memory, Data retention, 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::baaf7f37e50fcc0edf972ac185f34e58
https://doi.org/10.1109/irps45951.2020.9128317

المؤلفون: V. B. Naik, J. H. Lim, T. Y. Lee, W. P. Neo, H. Dixit, S. K, L. C. Goh, T. Ling, J. Hwang, D. Zeng, J. W. Ting, K. Lee, E. H. Toh, L. Zhang, R. Low, N. Balasankaran, L. Y. Zhang, K. W. Gan, L. Y. Hau, J. Mueller, B. Pfefferling, O. Kallensee, K. Yamane, S. L. Tan, C. S. Seet, Y. S. You, S. T. Woo, E. Quek, S. Y. Siah, J. Pellerin, R. Chao, J. Kwon, N. Thiyagarajah, N. L. Chung, S. H. Jang, B. Behin-Aein

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Magnetoresistive random-access memory, Materials science, business.industry, Silicon on insulator, Failure rate, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Microcontroller, Tunnel magnetoresistance, Reliability (semiconductor), Stack (abstract data type), Soldering, 0103 physical sciences, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::97756aa1076d3633495ae47aedb97a18
https://doi.org/10.1109/iedm19573.2019.8993454

المؤلفون: K. Lee, R. Chao, K. Yamane, V. B. Naik, H. Yang, J. Kwon, N. L. Chung, S. H. Jang, B. Behin-Aein, J.H. Lim, S. K, B. Liu, E. H. Toh, K. W. Gan, D. Zeng, N. Thiyagarajah, L. C. Goh, T. Ling, J. W. Ting, J. Hwang, L. Zhang, R. Low, R. Krishnan, S. L Tan, Y. S. You, C. S. Seet, H. Cong, J. Wong, S. T. Woo, E. Quek, S. Y. Siah

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Magnetoresistive random-access memory, Materials science, business.industry, Silicon on insulator, 01 natural sciences, Microcontroller, Tunnel magnetoresistance, Reliability (semiconductor), 0103 physical sciences, Scalability, Bit error rate, Optoelectronics, Macro, 010306 general physics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3e71ba1b22f817431209b88a2d95e960
https://doi.org/10.1109/iedm.2018.8614566

المؤلفون: K. Lee, K. Yamane, S. Noh, V. B. Naik, H. Yang, S. H. Jang, J. Kwon, B. Behin-Aein, R. Chao, J. H. Lim, null S. K., K. W. Gan, D. Zeng, N. Thiyagarajah, L. C. Goh, B. Liu, E. H. Toh, B. Jung, T. L. Wee, T. Ling, T. H. Chan, N. L. Chung, J. W. Ting, S. Lakshmipathi, J. S. Son, J. Hwang, L. Zhang, R. Low, R. Krishnan, T. Kitamura, Y. S. You, C. S. Seet, H. Cong, D. Shum, J. Wong, S. T. Woo, J. Lam, E. Quek, A. See, S. Y. Siah

المصدر: 2018 IEEE Symposium on VLSI Technology.

مصطلحات موضوعية: 010302 applied physics, Magnetoresistive random-access memory, Materials science, business.industry, Silicon on insulator, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, CMOS, Soldering, 0103 physical sciences, Compatibility (mechanics), Bit error rate, Optoelectronics, Data retention, Macro, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3028c6d8033fb95b54e47d04e4e0e57b
https://doi.org/10.1109/vlsit.2018.8510655

المؤلفون: Jon M. Slaughter, J. J. Sun, Sarin A. Deshpande, N. L. Chung, M. Hossain, Frederick B. Mancoff, Renu Whig, Sumio Ikegawa, Y. S. You, S. T. Woo, C. C. Wang, J. Wong, Naganivetha Thiyagarajah, T. Ling, J. W. Ting, H.-J. Chia, G. Shimon, J. Janesky, Ming-Wei Lin, Chim Seng Seet, H. Yang, Michael Tran, Syed M. Alam, Vinayak Bharat Naik, H. Lu, Thomas W. Andre, Taiebeh Tahmasebi, C. Hai, T. H. Chan, Dimitri Houssameddine, K. Yamane, Rajesh R. Nair, Danny Pak-Chum Shum, S. Y. Siah, K. W. Wong, M. DeHerrera, R. Chao, Sanjeev Aggarwal, Kerry Joseph Nagel, Kangho Lee

المصدر: 2017 Symposium on VLSI Technology.

مصطلحات موضوعية: 010302 applied physics, Very-large-scale integration, Magnetoresistive random-access memory, Engineering, business.industry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Design for manufacturability, Microcontroller, Reliability (semiconductor), CMOS, 0103 physical sciences, Electronic engineering, Bit error rate, Data retention, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a8418750ba7a8213eb54d445cb6c292c
https://doi.org/10.23919/vlsit.2017.7998174

المؤلفون: D. Stranges, J. W. Ting, H. Chan, Oskar Asvany, Yuan T. Lee, N. Balucani, D. Gee, Ralf I. Kaiser, L. C. L. Huang

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Crossed molecular beam, Chopper, chemistry.chemical_compound, Laser ablation, Materials science, Cyano radical, chemistry, Cyanogen, Radical, Atomic physics, Instrumentation, Beam (structure), Ion

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dcc54c61e29737902f7aac41dc3a341a
https://doi.org/10.1063/1.1150050

المؤلفون: W. Blake, J. W. Ting

المصدر: ANZ Journal of Surgery. 79:A34-A34

مصطلحات موضوعية: medicine.medical_specialty, business.industry, medicine.medical_treatment, Pincer grip, General Medicine, Wrist, Thumb, Numerical digit, Surgery, Tendon, body regions, medicine.anatomical_structure, Tendon transfer, Replantation, medicine, Upper limb, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c8fe9ed2045282a12c7345d5dd77d7d7
https://doi.org/10.1111/j.1445-2197.2009.04918_1.x

المؤلفون: J. W. Ting, W. M. Rozen, D. Grinsell, D. L. STELLA and M. W. Ashton

المصدر: ANZ Journal of Surgery. 79:A54-A54

مصطلحات موضوعية: Surgery, General Medicine

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6369b2f2deec867e874a01e4d874a0fc
https://doi.org/10.1111/j.1445-2197.2009.04927_4.x

المؤلفون: A. Morsi, J. W. Ting

المصدر: ANZ Journal of Surgery. 79:A57-A57

مصطلحات موضوعية: medicine.medical_specialty, medicine.diagnostic_test, business.industry, Deep Inferior Epigastric Artery, General Medicine, Dissection (medical), medicine.disease, Abdominal wall weakness, eye diseases, Surgery, Tram flap, Angiography, Medicine, Radiology, business, Breast reconstruction, Perforator flaps, Ophthalmic surgery

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2ed2f45e2a4057baba93c31ce5eb2ec1
https://doi.org/10.1111/j.1445-2197.2009.04927_14.x

المؤلفون: L. P. Hwi, J. W. Ting

المصدر: Clinical & Investigative Medicine. 30:46

مصطلحات موضوعية: medicine.medical_specialty, business.industry, Opera, Piano, General Medicine, Musical, Chamber music, humanities, Violin, Ophthalmology, medicine, Eye disorder, Choir, Viola, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2c56152f3d5457a1cd6ef6c4ad0002a9
https://doi.org/10.25011/cim.v30i4.2796

المؤلفون: Peng, W.-P., Y. T. Lee, J. W. Ting, H.-C. Chang

المساهمون: 國立東華大學物理學系暨應用物理研究所

Relation: Review of Scientific Instruments, 76, 023108.; http://ir.ndhu.edu.tw/handle/987654321/8857

الاتاحة: http://ir.ndhu.edu.tw/handle/987654321/8857