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1Academic Journal
المؤلفون: J. Rychen, D. I. Rodrigues, T. Tomka, L. Rüttimann, H. Yamahachi, R. H. R. Hahnloser
المصدر: Scientific Reports, Vol 11, Iss 1, Pp 1-15 (2021)
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2045-2322
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2Academic Journal
المؤلفون: J. Rychen, T. Fingerlin, L. Greuter, R. Guzman, L. Mariani, J. Soleman
المصدر: Brain and Spine, Vol 2, Iss , Pp 101622- (2022)
مصطلحات موضوعية: Neurology. Diseases of the nervous system, RC346-429
وصف الملف: electronic resource
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3Academic Journal
المؤلفون: A. Saemann, J. Rychen, M. Röthlisberger, J. Gehweiler, B. Westermann, J. Soleman, G. Hutter, L. Mariani, R. Guzman
المصدر: Brain and Spine, Vol 2, Iss , Pp 101202- (2022)
مصطلحات موضوعية: Neurology. Diseases of the nervous system, RC346-429
وصف الملف: electronic resource
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4Academic Journal
المؤلفون: L. Greuter, J. Rychen, A. Chiappini, R. Guzman, J. Soleman
المصدر: Brain and Spine, Vol 1, Iss , Pp 100777- (2021)
مصطلحات موضوعية: Neurology. Diseases of the nervous system, RC346-429
وصف الملف: electronic resource
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5
المؤلفون: J, Rychen, D I, Rodrigues, T, Tomka, L, Rüttimann, H, Yamahachi, R H R, Hahnloser
المصدر: Scientific Reports
مصطلحات موضوعية: Animal Communication, Behavioural methods, Acoustic Stimulation, Developmental biology, Animals, Finches, Vocalization, Animal, Article, Electrical and electronic engineering
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6
المؤلفون: Luigi Mariani, Maria Kamenova, J. Rychen, Jehuda Soleman
المصدر: Journal of Neurological Surgery Part A: Central European Neurosurgery.
مصطلحات موضوعية: Shunt placement, Yield (engineering), medicine.diagnostic_test, business.industry, medicine, Computed tomography, Nuclear medicine, business
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7
المؤلفون: Urs Maier, J. Rychen, Tom Wirtz, Ernst Meyer, Urs Gysin, Yves Fleming, Thilo Glatzel, Urs Wegmann
المصدر: Applied Surface Science. 258:1322-1327
مصطلحات موضوعية: Atomic force microscopy, business.industry, Chemistry, General Physics and Astronomy, Chemical distribution, Nanotechnology, Surfaces and Interfaces, General Chemistry, Lateral resolution, Surface finish, Condensed Matter Physics, Ion fluence, Surfaces, Coatings and Films, Secondary Ion Mass Spectroscopy, Secondary ion mass spectrometry, Optics, Three dimensional imaging, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bf2bb4eff4c048c953e7bf8de075c791
https://doi.org/10.1016/j .apsusc.2011.09.029 -
8
المؤلفون: J. Rychen, Klaus Ensslin, Werner Wegscheider, Max Bichler, Thomas Ihn
المصدر: Microelectronic Engineering. 63:81-85
مصطلحات موضوعية: Coupling, Scanning Hall probe microscope, Condensed matter physics, Chemistry, Scanning electron microscope, Conductance, Edge (geometry), Quantum Hall effect, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Tunnel effect, Condensed Matter::Superconductivity, Electrical and Electronic Engineering, Quantum tunnelling
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9
المؤلفون: J. Rychen, Thomas Ihn, P. Studerus, A. Herrmann, Klaus Ensslin
المصدر: Review of Scientific Instruments. 70:2765-2768
مصطلحات موضوعية: Materials science, business.industry, Condensed Matter (cond-mat), Mode (statistics), FOS: Physical sciences, Condensed Matter, Piezoelectric quartz, Scanning Force Microscope, law.invention, Magnetic field, Loop (topology), Operation mode, law, Optoelectronics, Tuning fork, business, Instrumentation
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10
المؤلفون: Hans J. Hug, Peter Reimann, H.-J. Güntherodt, J. Rychen, W. Lu, R. Hoffmann, P. Kappenberger, S. Martin
المصدر: IEEE International Digest of Technical Papers on Magnetics Conference.
مصطلحات موضوعية: Microscope, Materials science, business.industry, Magnetic resonance microscopy, Resolution (electron density), Measure (physics), High resolution, Magnetic resonance force microscopy, law.invention, Magnetic field, Optics, Nuclear magnetic resonance, law, Magnetic force microscope, business
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11
المؤلفون: Thomas Ihn, J. Rychen, T. Cilento, Werner Wegscheider, Klaus Ensslin, Max Bichler, R. Held
مصطلحات موضوعية: Physics, Scanning probe techniques, Quantum wires, Phase coherence effects, Condensed matter physics, business.industry, Quantum wire, Transconductance, Quantum point contact, Perturbation (astronomy), Electron, Local field potential, Condensed Matter Physics, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, 530 Physik, 73.40.Gk, Atomic and Molecular Physics, and Optics, Scanning Force Microscope, Electronic, Optical and Magnetic Materials, Semiconductor, business
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12
المؤلفون: Thomas Ihn, T. Vancura, J. Rychen, Max Bichler, Klaus Ensslin, Werner Wegscheider
مصطلحات موضوعية: Physics, Scanning Hall probe microscope, Condensed matter physics, Scattering, Quantum point contact, Conductance, Quantum Hall effect, Condensed Matter Physics, 530 Physik, Edge channels, Scanning probe techniques, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Fermi gas, Spectroscopy, Quantum tunnelling
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13
المؤلفون: Klaus Ensslin, A. Herrmann, J. Rychen, H.J. Guentherodt, P. J. A. van Schendel, Hans J. Hug, Thomas Ihn, P. Studerus
مصطلحات موضوعية: Materials science, business.industry, Condensed Matter (cond-mat), FOS: Physical sciences, General Physics and Astronomy, chemistry.chemical_element, Surfaces and Interfaces, General Chemistry, Substrate (electronics), Condensed Matter, Tungsten, Condensed Matter Physics, Piezoelectricity, Surfaces, Coatings and Films, law.invention, Power (physics), Quality (physics), Optics, chemistry, law, Calibration, Tuning fork, business, Harmonic oscillator
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14
المؤلفون: Thomas Ihn, Klaus Ensslin, P. Studerus, P. J. A. van Schendel, A. Herrmann, Hans J. Hug, J. Rychen, H.J. Guentherodt
مصطلحات موضوعية: Admittance, Materials science, business.industry, Liquid helium, Condensed Matter (cond-mat), FOS: Physical sciences, Condensed Matter, Piezoelectric quartz, Force sensor, law.invention, Magnetic field, Scanning probe microscopy, Interferometry, law, Optoelectronics, Tuning fork, business, Instrumentation, Computer Science::Operating Systems
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15
المؤلفون: Oliver Schaff, J. Rychen, Stefan Torbrügge
المصدر: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 28:C4E12-C4E20
مصطلحات موضوعية: Materials science, business.industry, Process Chemistry and Technology, Scanning tunneling spectroscopy, Analytical chemistry, Spin polarized scanning tunneling microscopy, Scanning capacitance microscopy, Conductive atomic force microscopy, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Scanning probe microscopy, law, Materials Chemistry, Scanning ion-conductance microscopy, Optoelectronics, Electrical and Electronic Engineering, Scanning tunneling microscope, business, Instrumentation, Non-contact atomic force microscopy
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16
المؤلفون: Nicola Naujoks, Livia Seemann, Dominik Ziegler, J. Rychen, A. Stemmer
المصدر: Journal of Physics: Conference Series. 142:012048
مصطلحات موضوعية: Kelvin probe force microscope, History, Chemistry, Electrostatic force microscope, Atomic force acoustic microscopy, Scanning capacitance microscopy, Conductive atomic force microscopy, Atomic physics, Electric charge, Non-contact atomic force microscopy, Photoconductive atomic force microscopy, Computer Science Applications, Education