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المؤلفون: T. Mota Frutuoso, X. Garros, P. Batude, L. Brunet, J. Lacord, B. Sklenard, V. Lapras, C. Fenouillet-Beranger, M. Ribotta, A. Magalhaes-Lucas, J. Kanyandekwe, R. Kies, G. Romano, E. Catapano, M. Casse, J. Lugo-Alvarez, P. Ferrari, F. Gaillard
المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Reliable RF and Mixed-signal Systems (TIMA-RMS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), IEEE
المصدر: IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022)
IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Jun 2022, Honolulu (HI), United States. ⟨10.1109/VLSITechnologyandCir46769.2022.9830504⟩
IEEELinkمصطلحات موضوعية: resistance, silicon-on-insulator, three-dimensional displays, VLSI (Very Large Scale Integration), PACS 85.42, capacitance, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, predictive models, performance evaluation
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المؤلفون: P. Batude, O. Billoint, S. Thuries, P. Malinge, C. Fenouillet-Beranger, A. Peizerat, G. Sicard, P. Vivet, S. Reboh, C. Cavalcante, L. Brunet, M. Ribotta, L. Brevard, X. Garros, T. Mota Frutuoso, B. Sklenard, J. Lacord, J. Kanyandekwe, S. Kerdiles, P. Sideris, C. Theodorou, V. Lapras, M. Mouhdach, G. Gaudin, G. Besnard, I. Radu, F. Ponthenier, A. Farcy, E. Jesse, F. Guyader, T. Matheret, P. Brunet, F. Milesi, L. Le Van-Jodin, A. Sarrazin, B. Perrin, C. Moulin, S. Maitrejean, M. Alepidis, I. Ionica, S. Cristoloveanu, F. Gaillard, M. Vinet, F. Andrieu, J. Arcamone, E. Ollier
المصدر: 2021 IEEE International Electron Devices Meeting (IEDM).
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المؤلفون: J.M. Hartmann, J. Kanyandekwe
المصدر: Journal of Crystal Growth. 582:126543
مصطلحات موضوعية: Inorganic Chemistry, Materials Chemistry, Condensed Matter Physics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::78c9a4d678efb0eeea053b7b0c340fc7
https://doi.org/10.1016/j .jcrysgro.2022.126543 -
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المؤلفون: J. Kanyandekwe, D. Barge, P. Morin, L. Grenouillet, M. Labrot, S. Maitrejean, E. Augendre, V. Lapras, Y. Morand, D. Dutartre, M. Gros-Jean, O. Gourhant, C. Gaumer, N. Rambal, D. Cooper, L. Clement
المصدر: Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Planar, Materials science, CMOS, business.industry, Optoelectronics, Epitaxy, business, PMOS logic
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المؤلفون: M. Ribotta, C. Vizioz, X. Garros, J.-M. Pedini, Joris Lacord, Perrine Batude, Sebastien Kerdiles, J. Arcamone, D. Bosch, Benoit Sklenard, A. Tavernier, Maud Vinet, L. Brevard, R. Gassilloud, A. Magalhaes-Lucas, P. Acosta-Alba, Laurent Brunet, J. Kanyandekwe, Francois Andrieu, M. Casse, Pascal Besson, Claire Fenouillet-Beranger, C. Cavalcante, V. Lapras, Frédéric Mazen
المصدر: IEEE Transactions on Electron Devices
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Silicon on insulator, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Electronic, Optical and Magnetic Materials, PMOS logic, Back end of line, CMOS, 0103 physical sciences, Optoelectronics, Wafer, Field-effect transistor, Electrical and Electronic Engineering, 0210 nano-technology, business, Front end of line, NMOS logic