المؤلفون: J. Bendik, M. Cenky, J. Paulech, V. Goga

المصدر: Electrical engineering & Electromechanics, Vol 2024, Iss 5, Pp 64-69 (2024)

مصطلحات موضوعية: substation, asymmetrical span, tension section, state change, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: http://eie.khpi.edu.ua/article/view/305200/300588; https://doaj.org/toc/2074-272X; https://doaj.org/toc/2309-3404

URL الوصول: https://doaj.org/article/ae87d1ca43f34d21bfd762f9b5507871

المؤلفون: P Janiga, J Bendik, M Cenky, M Celeda, D Gasparovsky, T Novak, J Raditschova

المصدر: IOP Conference Series: Earth and Environmental Science. 1151:012031

مصطلحات موضوعية: General Medicine, General Chemistry

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::90272323d5c75a716a57282ee693065a
https://doi.org/10.1088/1755-1315/1151/1/012031

المؤلفون: Marc Schaekers, Joseph J. Bendik, P. Gopalan, Will Conley, F. Zhang, M. Op de Beeck, Mircea Dusa, Kurt G. Ronse, Hareen Gangala

المصدر: Microelectronic Engineering. 46:51-54

مصطلحات موضوعية: Materials science, business.industry, Substrate (electronics), Condensed Matter Physics, Reflectivity, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Optics, Reflection (mathematics), Resist, Wafer, Electrical and Electronic Engineering, business, Lithography, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::24696e1f0966dd11f7df785d05d13da3
https://doi.org/10.1016/s0167-9317(99)00013-1

المؤلفون: Joseph J. Bendik, Ivan Lalovic, Nigel R. Farrar, Mark D. Smith, Oleg Kritsun, Sarah N. McGowan

المصدر: Photomask Technology 2008.

مصطلحات موضوعية: Engineering, business.industry, Gaussian, Bandwidth (signal processing), Fingerprint recognition, Laser, Numerical aperture, law.invention, symbols.namesake, Optical proximity correction, Robustness (computer science), law, Chromatic aberration, symbols, Electronic engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e02148172d0792992d112f2172ea6dad
https://doi.org/10.1117/12.801556

المؤلفون: Chris Sallee, Ivan Lalovic, Joseph J. Bendik, Mark D. Smith, William B. Howard, Nigel R. Farrar

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Excimer laser, business.industry, Computer science, Gaussian, medicine.medical_treatment, Bandwidth (signal processing), PROLITH, Laser, Excimer, Spectral line, law.invention, symbols.namesake, Optics, law, Chromatic aberration, symbols, medicine, Photolithography, business, Lithography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::15275712f3f12b54bda24ab9935d9c6a
https://doi.org/10.1117/12.714102

المؤلفون: Adlai H. Smith, Calvin Chen Chii Wean, Joseph J. Bendik, Yuji Yamaguchi, Venky Subramony, Ranjan Khurana

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Scanner, Engineering, Exit pupil, business.industry, Distortion (optics), Overlay, Synchronization, Metrology, Electronic engineering, Reticle, Computer vision, Artificial intelligence, business, Lithography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::33f45c7c243c8ab32075dbe9de1f2df2
https://doi.org/10.1117/12.674471

المؤلفون: Lyle G. Finkner, Adlai H. Smith, Yuji Yamaguchi, Joseph J. Bendik

المصدر: Optical Microlithography XVIII.

مصطلحات موضوعية: Engineering, Scanner, business.industry, Exit pupil, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, law.invention, Metrology, Lens (optics), Transmission (telecommunications), law, Distortion, Synchronization (computer science), Electronic engineering, Focus (optics), business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c705fa57c454e2e565583b5cfe83ed05
https://doi.org/10.1117/12.600135

المؤلفون: Joseph J. Bendik, Fred L. Terry

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Engineering, business.industry, PROLITH, law.invention, Metrology, Optics, Resist, law, Specular reflection, Photolithography, business, Reflectometry, Critical dimension, Lithography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9abc0d3542ea1c3b18c8dec9fe2b42ee
https://doi.org/10.1117/12.599135

المؤلفون: Joseph J. Bendik, Willard E. Conley

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Wavelength, Materials science, Process integration, Nanotechnology, Photoresist, Photomask, Lithography, Engineering physics, Effective solution

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b624b6c101503cda9aae775119e85ae3
https://doi.org/10.1117/12.537609

المؤلفون: John S. Petersen, Joseph J. Bendik, Kim Dean, Will Conley, Paul Zimmerman, Jeff D. Byers, Daniel Miller

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Transparency (projection), Fluorinated hydrocarbons, Materials science, Resist, business.industry, Nanotechnology, Photoresist, Process engineering, business, Lithography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3d2f808ad8a4ee8c388698b54f508e83
https://doi.org/10.1117/12.474174

المؤلفون: Joseph J. Bendik, Chris A. Mack, Cesar M. Garza, Mircea Dusa, Robert John Socha, Will Conley

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Engineering, business.industry, law.invention, Lens (optics), Optics, Optical proximity correction, law, Reticle, Imaging technology, Process window, Photolithography, business, Lithography, Critical dimension

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::80278dbbd99a034cf2873b9f94017317
https://doi.org/10.1117/12.435725

المؤلفون: Nigel R. Farrar, Christopher G. Rowan, Joseph J. Bendik, Chris A. Mack, Armen Kroyan, Olivier Semprez

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Materials science, Excimer laser, business.industry, medicine.medical_treatment, Extreme ultraviolet lithography, Laser, Excimer, law.invention, Optics, law, Chromatic aberration, medicine, Optoelectronics, X-ray lithography, Photolithography, business, Lithography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0b8b78a5a2f82dc7e3989608b202612f
https://doi.org/10.1117/12.389057

المؤلفون: Xinhui Niu, Costas J. Spanos, Joseph J. Bendik, Nickhil Jakatdar, Junwei Bao

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Diffraction, Engineering, Optics, business.industry, Surface metrology, Optical engineering, Specular reflection, Profilometer, business, Diffraction grating, Light scattering, Metrology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::80bf132b0c45eb5238f947a47507ab54
https://doi.org/10.1117/12.386454

المؤلفون: Junwei Bao, Joseph J. Bendik, Xinhui Niu, Costas J. Spanos, Nickhil Jakatdar, Stephen L. Hill

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Process modeling, Materials science, Resist, Electronic engineering, Calibration, Wafer, Extraction (military), Lithography, Global optimization, Data modeling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d09273b180dee25ae956e4b1051a8c52
https://doi.org/10.1117/12.350831

المؤلفون: Mircea Dusa, Xuelong Shi, Robert John Socha, Joseph J. Bendik, Will Conley, Bo Su

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Coupling, Materials science, business.industry, law.invention, Optics, Resist, Optical proximity correction, Control line, law, Reticle, Photolithography, Line (text file), Diffusion (business), business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::60d6e259a06de93e2950f949fe2e373b
https://doi.org/10.1117/12.350266

المؤلفون: Nickhil Jakatdar, Costas J. Spanos, Xinhui Niu, Ronald P. Kovacs, Joseph J. Bendik

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Optics, Materials science, Resist, business.industry, Dispersion (optics), Simulated annealing, Photoresist, business, Lithography, Refractive index, Global optimization, Metrology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::63d56e135fca754644c25a8504eb84dc
https://doi.org/10.1117/12.308750

المؤلفون: Nickhil Jakatdar, Xinhui Niu, Costas J. Spanos, Andrew R. Romano, Joseph J. Bendik, Ronald P. Kovacs, Stephen L. Hill

المصدر: SPIE Proceedings.

مصطلحات موضوعية: chemistry.chemical_classification, business.industry, Infrared spectroscopy, Polymer, Photoresist, law.invention, Semiconductor, Resist, chemistry, law, Optoelectronics, Photolithography, Fourier transform infrared spectroscopy, business, Lithography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::71e0cde427a7869c697db7c1c8aa3613
https://doi.org/10.1117/12.308771

المؤلفون: Junwei Bao, Xinhui Niu, Nickhil Jakatdar, Costas Spanos, Joseph J. Bendik

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://bcam.berkeley.edu/archive/conference/Spie_Junwei.pdf.

مصطلحات موضوعية: Specular spectroscopic profilometry, DUV lithography, spectroscopic ellipsometry, metal

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.458.867; http://bcam.berkeley.edu/archive/conference/Spie_Junwei.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.458.867
http://bcam.berkeley.edu/archive/conference/Spie_Junwei.pdf

المؤلفون: Jiri Vlach, J. Bendik

المصدر: Radio and Electronic Engineer. 33:305

مصطلحات موضوعية: Materials science, Electronic filter topology, General Engineering, General Medicine, Distributed element filter, Constant k filter, Control theory, Prototype filter, sense organs, skin and connective tissue diseases, Driven element, Active filter, m-derived filter, Negative impedance converter

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ae6cf6f050ba5df4a13285bb07b17821
https://doi.org/10.1049/ree.1967.0045

المؤلفون: J. Bendik

المصدر: IEEE Transactions on Circuit Theory. 14:98-98

مصطلحات موضوعية: Gyrator, Engineering, business.industry, General Engineering, Electrical engineering, Electronic engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f393f0c1933c795d0d2c181e90c2f8fb
https://doi.org/10.1109/tct.1967.1082671