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1Conference
المؤلفون: Badger, Karen D., Yonetani, Masashi, Toda, Yusuke, Kagawa, Masayuki, Isogawa, Takeshi, Heumann, Jan
المساهمون: Rankin, Jed H., Gallagher, Emily E.
المصدر: Photomask Technology 2018
الاتاحة: http://dx.doi.org/10.1117/12.2502560
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2Conference
المؤلفون: Seki, Kazunori, Badger, Karen, Yonetani, Masashi, Birnstein, Anka, Heumann, Jan, Isogawa, Takeshi, Konishi, Toshio, Kodera, Yutaka
المساهمون: Takehisa, Kiwamu
المصدر: Photomask Japan 2018: XXV Symposium on Photomask and Next-Generation Lithography Mask Technology
الاتاحة: http://dx.doi.org/10.1117/12.2502006
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3Conference
المؤلفون: Faure, Thomas, Sakamoto, Yoshifumi, Toda, Yusuke, Badger, Karen, Seki, Kazunori, Lawliss, Mark, Isogawa, Takeshi, Zweber, Amy, Kagawa, Masayuki, Wistrom, Richard, Xu, Yongan, Lobb, Granger, Viswanathan, Ramya, Hu, Lin, Inazuki, Yukio, Nishikawa, Kazuhiro
المساهمون: Yoshioka, Nobuyuki
المصدر: SPIE Proceedings ; Photomask Japan 2016: XXIII Symposium on Photomask and Next-Generation Lithography Mask Technology ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2241480
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4Conference
المؤلفون: Zweber, Amy, Toda, Yusuke, Sakamoto, Yoshifumi, Faure, Thomas, Rankin, Jed, Nash, Steven, Kagawa, Masayuki, Fahrenkopf, Michael, Isogawa, Takeshi, Wistrom, Richard
المساهمون: Kasprowicz, Bryan S., Buck, Peter D.
المصدر: SPIE Proceedings ; Photomask Technology 2016 ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2243683
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5Academic Journal
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6Conference
المؤلفون: Seki, Kazunori, Isogawa, Takeshi, Kagawa, Masayuki, Akima, Shinji, Kodera, Yutaka, Badger, Karen, Qi, Zhengqing John, Lawliss, Mark, Rankin, Jed, Bonam, Ravi
المساهمون: Yoshioka, Nobuyuki
المصدر: Photomask Japan 2015: Photomask and Next-Generation Lithography Mask Technology XXII ; SPIE Proceedings ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2197763
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7Conference
المؤلفون: Isogawa, Takeshi, Seki, Kazunori, Lawliss, Mark, Qi, Zhengqing John, Rankin, Jed, Akima, Shinji
المساهمون: Hayashi, Naoya, Kasprowicz, Bryan S.
المصدر: SPIE Proceedings ; Photomask Technology 2015 ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2197761
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8Conference
المؤلفون: Turley, Christina, Rankin, Jed, Kindt, Louis, Lawliss, Mark, Bolton, Luke, Collins, Kevin, Cheong, Lin, Bonam, Ravi, Poro, Richard, Isogawa, Takeshi, Narita, Eisuke, Kagawa, Masayuki
المساهمون: Yoshioka, Nobuyuki
المصدر: Photomask Japan 2015: Photomask and Next-Generation Lithography Mask Technology XXII ; SPIE Proceedings ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2197383
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9Academic Journal
المؤلفون: Isogawa, Takeshi, Seki, Kazunori, Lawliss, Mark, Qi, Zhengqing John, Rankin, Jed, Akima, Shinji
المصدر: Journal of Micro/Nanolithography, MEMS, and MOEMS ; volume 15, issue 2, page 021010 ; ISSN 1932-5150
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10Academic Journal
المؤلفون: Seki, Kazunori, Isogawa, Takeshi, Kagawa, Masayuki, Akima, Shinji, Kodera, Yutaka, Badger, Karen, Qi, Zhengqing John, Lawliss, Mark, Rankin, Jed, Bonam, Ravi
المصدر: Journal of Micro/Nanolithography, MEMS, and MOEMS ; volume 15, issue 2, page 021004 ; ISSN 1932-5150
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11Conference
المؤلفون: Lawliss, Mark, Gallagher, Emily, Hibbs, Michael, Seki, Kazunori, Isogawa, Takeshi, Robinson, Tod, LeClaire, Jeff
المساهمون: Ackmann, Paul W., Hayashi, Naoya
المصدر: SPIE Proceedings ; Photomask Technology 2014 ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2069787
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12Conference
المؤلفون: Gallagher, Emily, Wagner, Alfred, Lawliss, Mark, McIntyre, Gregory, Seki, Kazunori, Isogawa, Takeshi, Nash, Steven
المساهمون: Kato, Kokoro
المصدر: SPIE Proceedings ; Photomask and Next-Generation Lithography Mask Technology XXI ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2070871
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13Conference
المؤلفون: Isogawa, Takeshi, Seki, Kazunori, Lawliss, Mark, Gallagher, Emily, Akima, Shinji, Konishi, Toshio
المساهمون: Kato, Kokoro
المصدر: SPIE Proceedings ; Photomask and Next-Generation Lithography Mask Technology XXI ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2070251
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14Conference
المؤلفون: Wistrom, Richard, Sakamoto, Yoshifumi, Panton, Jeffery, Faure, Thomas, Isogawa, Takeshi, McGuire, Anne
المساهمون: Faure, Thomas B., Ackmann, Paul W.
المصدر: SPIE Proceedings ; Photomask Technology 2013 ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.2026853
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15Conference
المؤلفون: Fukugami, Norihito, Matsui, Kazuaki, Watanabe, Genta, Isogawa, Takeshi, Kondo, Shinpei, Kodera, Yutaka, Sakata, Yo, Akima, Shinji, Kotani, Jun, Morimoto, Hiroaki, Tanaka, Tsuyoshi
المساهمون: Kato, Kokoro
المصدر: SPIE Proceedings ; Photomask and Next-Generation Lithography Mask Technology XIX ; ISSN 0277-786X
الاتاحة: http://dx.doi.org/10.1117/12.965536
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16Periodical
المؤلفون: Ando, Akihiko, Yonetani, Masashi, Badger, Karen, Rankin, Jed, Akima, Shinji, Toda, Yusuke, Yoshida, Itaru, Kagawa, Masayuki, Isogawa, Takeshi, Kodera, Yutaka, Heumann, Jan, Birnstein, Anka
المصدر: Proceedings of SPIE; June 2019, Vol. 11178 Issue: 1 p111780D-111780D-7, 1006028p
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17
المؤلفون: Yutaka Kodera, Sakata Yo, Takagi Noriaki, Isogawa Takeshi, Kazuaki Matsui, Akima Shinji
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Engineering drawing, Fabrication, Materials science, business.industry, Fabrication methods, Extreme ultraviolet lithography, parasitic diseases, technology, industry, and agriculture, Optoelectronics, business, Multi layer, Blank, Characterization (materials science)
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18Periodical
المؤلفون: Takehisa, Kiwamu, Seki, Kazunori, Badger, Karen, Yonetani, Masashi, Birnstein, Anka, Heumann, Jan, Isogawa, Takeshi, Konishi, Toshio, Kodera, Yutaka
المصدر: Proceedings of SPIE; June 2018, Vol. 10807 Issue: 1 p108070D-108070D-8, 972639p
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19Periodical
المؤلفون: Kasprowicz, Bryan S., Buck, Peter D., Zweber, Amy, Toda, Yusuke, Sakamoto, Yoshifumi, Faure, Thomas, Rankin, Jed, Nash, Steven, Kagawa, Masayuki, Fahrenkopf, Michael, Isogawa, Takeshi, Wistrom, Richard
المصدر: Proceedings of SPIE; October 2016, Vol. 9985 Issue: 1 p99851J-99851J-12, 9885262p
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20Periodical
المؤلفون: Yoshioka, Nobuyuki, Seki, Kazunori, Isogawa, Takeshi, Kagawa, Masayuki, Akima, Shinji, Kodera, Yutaka, Badger, Karen, Qi, Zhengqing J., Lawliss, Mark, Rankin, Jed, Bonam, Ravi
المصدر: Proceedings of SPIE; July 2015, Vol. 9658 Issue: 1 p96580G-96580G-9, 869230p