المؤلفون: Iraj Moghaddasi, Byeong-Gyu Nam

المصدر: Machine Learning and Knowledge Extraction, Vol 6, Iss 3, Pp 1484-1493 (2024)

مصطلحات موضوعية: systolic array, DNN accelerator, serial inference engine, TPU, energy efficiency, Computer engineering. Computer hardware, TK7885-7895

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2504-4990/6/3/70; https://doaj.org/toc/2504-4990

URL الوصول: https://doaj.org/article/2ee3adbb86c845e6b391cab1e91cd59b

المؤلفون: Iraj Moghaddasi, Ghassem Jaberipur, Danial Javaheri, Byeong-Gyu Nam

المصدر: IEEE Access, Vol 12, Pp 96552-96564 (2024)

مصطلحات موضوعية: DNN accelerator, redundant number system, serial inference, MSDF, pruning, real-time, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10595090/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/8887401f535643c9815ec104d79705e4

المؤلفون: Iraj Moghaddasi, Saeid Gorgin, Jeong-A Lee

المصدر: IEEE Access, Vol 11, Pp 89803-89834 (2023)

مصطلحات موضوعية: Deep learning, AI accelerator, dependability management, resilience, safety-critical systems, fault tolerance, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10198265/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/63b423e2810342b796a75b8b67f31afc

المؤلفون: Mostafa Ersali Salehi Nasab, Iraj Moghaddasi, Mehdi Kargahi

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 28:433-442

مصطلحات موضوعية: Negative-bias temperature instability, Computer science, media_common.quotation_subject, Static timing analysis, 02 engineering and technology, 020202 computer hardware & architecture, Reliability engineering, Reliability (semiconductor), CMOS, Debugging, Hardware and Architecture, Metric (mathematics), 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, Throughput (business), Software, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7f4cac41b91b34cbf34767fcd45f1b9f
https://doi.org/10.1109/tvlsi.2019.2947757

المؤلفون: Mehdi Kargahi, Iraj Moghaddasi, Mostafa E. Salehi, Arash Fouman

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 38:1427-1437

مصطلحات موضوعية: SIMPLE (military communications protocol), Computer science, Reliability (computer networking), 02 engineering and technology, Computer Graphics and Computer-Aided Design, 020202 computer hardware & architecture, Reliability engineering, Stress (mechanics), CMOS, Factor (programming language), 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, computer, Software, computer.programming_language, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::72ec2d85c0e2fa292120610dfccadd6a
https://doi.org/10.1109/tcad.2018.2846629