المؤلفون: Iglesias Santiso, Vanessa

المساهمون: University/Department: Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica

Thesis Advisors: Porti i Pujal, Marc

المصدر: TDX (Tesis Doctorals en Xarxa)

مصطلحات موضوعية: CAFM, Leakage current, Polycrystalline HfO2, Tecnologies

وصف الملف: application/pdf

URL الوصول: http://hdl.handle.net/10803/107890

المؤلفون: Perez-Tomas, Amador, Catalan, Gustau, Fontserè Recuenco, Abel, Iglesias Santiso, Vanessa, Chen, H., Gammon, Peter, Jennings, M. R., Thomas, M., Fisher, C. A., Sharma, Y. K., Placidi, Marcel, Chmielowska, M., Chenot, S., Porti i Pujal, Marc, Nafría i Maqueda, Montserrat, Cordier, Y.

وصف الملف: application/pdf

Relation: Ministerio de Economía y Competitividad SEV-2013-0295; Nanotechnology; Vol. 26, Issue 11 (March 2015), art. 115203; https://ddd.uab.cat/record/212894; urn:oai:ddd.uab.cat:212894; urn:scopus_id:84923668519; urn:articleid:13616528v26n11p115203; urn:wos_id:000350568900006; urn:icn2uab:4129953

الاتاحة: https://ddd.uab.cat/record/212894

المؤلفون: Iglesias Santiso, Vanessa, Porti i Pujal, Marc, Nafría i Maqueda, Montserrat, Aymerich Humet, Xavier, Dudek, P., Schroeder, T., Bersuker, G., American Physical Society

المصدر: Recercat. Dipósit de la Recerca de Catalunya
instname
Recercat: Dipósit de la Recerca de Catalunya
Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
Dipòsit Digital de Documents de la UAB
Universitat Autònoma de Barcelona

مصطلحات موضوعية: Materials science, Physics and Astronomy (miscellaneous), Analytical chemistry, Conductive atomic force microscopy, Dielectric, Dielectric thin films, Conductivity, Leakage currents, Electrical resistivity and conductivity, Electric currents, Grain boundaries, Electrical properties, Grain boundary, Crystallite, Electric current, Composite material, Crystallization, Electrical conductor

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6bc7e372e822bc4a636d51e30cf036d0
http://hdl.handle.net/2072/401664

المؤلفون: Fontserè Recuenco, Abel, Perez-Tomas, Amador, Placidi, Marcel, Aguiló Llobet, Jordi, Baron, N., Chenot, S., Cordier, Y., Moreno, J. C., Iglesias Santiso, Vanessa, Porti i Pujal, Marc, Bayerl, Albin, Lanza, Mario, Nafría i Maqueda, Montserrat

مصطلحات موضوعية: III-V semiconductors, MODFETs, Atomic force microscopy, Leakage currents, Epitaxy

وصف الملف: application/pdf

Relation: Applied physics letters; Vol. 101, Issue 9 (August 2012), p. 093505/1-093505/4; https://ddd.uab.cat/record/117260; urn:10.1063/1.4748115; urn:oai:ddd.uab.cat:117260; urn:recercauab:ARE-75510; urn:articleid:10773118v101n9p93505/1; urn:scopus_id:84865840118; urn:wos_id:000308408100078; urn:oai:egreta.uab.cat:publications/5eb9a410-13d9-4a9d-aea1-d6d135aaa5a8

الاتاحة: https://ddd.uab.cat/record/117260

المؤلفون: Lanza, Mario, Iglesias Santiso, Vanessa, Porti i Pujal, Marc, Nafría i Maqueda, Montserrat, Aymerich Humet, Xavier

مصطلحات موضوعية: Ultra High Vacuum, Polycrystalline Structure, Amorphous Sample, Contact Potential Difference, Al₂O₃ Layer

وصف الملف: application/pdf

Relation: Ministerio de Ciencia e Innovación TEC2007-61294; Ministerio de Educación y Ciencia HA2007-0029; Nanoscale Research Letters; Vol. 6 (January 2011), art. 108; https://ddd.uab.cat/record/184751; urn:10.1186/1556-276X-6-108; urn:oai:ddd.uab.cat:184751; urn:pmid:21711617; urn:pmcid:PMC3211152; urn:pmc-uid:3211152; urn:articleid:19317573v6p108; urn:recercauab:ARE-74799; urn:wos_id:000289104200085; urn:oai:egreta.uab.cat:publications/e1732eed-fdf4-4861-a09c-4f1fe63bbff7; urn:scopus_id:84255173397; urn:oai:pubmedcentral.nih.gov:3211152

الاتاحة: https://ddd.uab.cat/record/184751

المؤلفون: Iglesias Santiso, Vanessa, Lanza, Mario, Zhang, K., Bayerl, Albin, Porti i Pujal, Marc, Nafría i Maqueda, Montserrat, Aymerich Humet, Xavier, Benstetter, Guenther, Shen, Z. Y., Bersuker, G.

مصطلحات موضوعية: Dielectric thin films, Dielectrics, Electric currents, Electrical properties, Leakage currents

وصف الملف: application/pdf

Relation: Applied physics letters; Vol. 99, Issue 10 (September 2011), p. 103510/1-103510/3; https://ddd.uab.cat/record/117259; urn:10.1063/1.3637633; urn:oai:ddd.uab.cat:117259; urn:recercauab:ARE-75502; urn:articleid:10773118v99n10p103510/1; urn:scopus_id:80052803508; urn:wos_id:000294739100062; urn:altmetric_id:452556; urn:oai:egreta.uab.cat:publications/7ec98343-5a9e-4b76-acb0-46cf89f2610e

الاتاحة: https://ddd.uab.cat/record/117259

المؤلفون: Iglesias Santiso, Vanessa, Porti i Pujal, Marc, Nafría i Maqueda, Montserrat, Aymerich Humet, Xavier, Dudek, P., Schroeder, T., Bersuker, G., American Physical Society

مصطلحات موضوعية: Dielectric thin films, Electrical properties, Leakage currents, Crystallization, Electric currents, Grain boundaries

وصف الملف: application/pdf

Relation: Applied physics letters; Vol. 97, Issue 26 (December 2010), p. 262906/1-262906/3; https://ddd.uab.cat/record/115987; urn:10.1063/1.3533257; urn:oai:ddd.uab.cat:115987; urn:recercauab:ARE-74798; urn:articleid:10773118v97n26p262906/1; urn:scopus_id:78650893982; urn:wos_id:000285768100060; urn:altmetric_id:16157811; urn:oai:egreta.uab.cat:publications/aa00ce83-16fd-4867-8b22-530e332eed91

الاتاحة: https://ddd.uab.cat/record/115987

المؤلفون: Iglesias Santiso, Vanessa

المساهمون: Porti i Pujal, Marc, Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica

المصدر: TDX (Tesis Doctorals en Xarxa)

مصطلحات موضوعية: CAFM, Leakage current, Polycrystalline HfO2, Tecnologies

Time: 62

وصف الملف: 148 p.; application/pdf

Relation: http://hdl.handle.net/10803/107890; B-7747-2013

الاتاحة: http://hdl.handle.net/10803/107890

المؤلفون: Porti i Pujal, Marc, Iglesias Santiso, Vanessa, Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica

مصطلحات الفهرس: Metall òxid semiconductors complementaris, Dielèctrics, Microscòpia de força atòmica, Tesis i dissertacions electròniques, info:eu-repo/semantics/doctoralThesis

URL: http://ddd.uab.cat/record/106905

المؤلفون: Lanza Martínez, Mario, Iglesias Santiso, Vanessa, Porti i Pujal, Marc, Nafría i Maqueda, Montserrat, Aymerich Humet, Xavier

مصطلحات الفهرس: Ultra High Vacuum, Polycrystalline Structure, Amorphous Sample, Contact Potential Difference, Al₂O₃ Layer, Article

URL: Ministerio de Ciencia e Innovación TEC2007-61294
info:eu-repo/grantAgreement/MEC/HA2007-0029
Nanoscale Research Letters ; Vol. 6 (January 2011), art. 108