المؤلفون: Joan Y.W. Liu, Hassan B. Hawsawi, Niraj Sharma, David W. Carmichael, Beate Diehl, Maria Thom, Louis Lemieux

المصدر: NeuroImage, Vol 254, Iss , Pp 119129- (2022)

مصطلحات موضوعية: IcEEG-fMRI safety, Brain implants, Brain injury, RF heating, Histopathology, Immunohistochemistry, Neurosciences. Biological psychiatry. Neuropsychiatry, RC321-571

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S1053811922002579; https://doaj.org/toc/1095-9572

URL الوصول: https://doaj.org/article/d3682edd74024e299151625b7ade05c5

المؤلفون: Liu, Joan YW, Hawsawi, Hassan B, Sharma, Niraj, Carmichael, David W, Diehl, Beate, Thom, Maria, Lemieux, Louis

المصدر: NeuroImage , Article 119129. (2022)

مصطلحات موضوعية: IcEEG-fMRI safety, RF heating, brain implants, brain injury, histopathology, immunohistochemistry

وصف الملف: text

Relation: https://discovery.ucl.ac.uk/id/eprint/10145940/1/Carmichael_Safety%20of%20Intracranial%20Electroencephalography%20During%20Functional%20Electromagnetic%20Resonance%20Imaging_Pre-proof.pdf; https://discovery.ucl.ac.uk/id/eprint/10145940/

الاتاحة: https://discovery.ucl.ac.uk/id/eprint/10145940/1/Carmichael_Safety%20of%20Intracranial%20Electroencephalography%20During%20Functional%20Electromagnetic%20Resonance%20Imaging_Pre-proof.pdf
https://discovery.ucl.ac.uk/id/eprint/10145940/