المؤلفون: Ibrahim G. Elhoussieny, Thomas J. Rehaag, Gavin R. Bell

المصدر: Advanced Electronic Materials, Vol 10, Iss 3, Pp n/a-n/a (2024)

مصطلحات موضوعية: atomic force microscope, flexible, hall, kapton, nano‐crystalline, optical bandgap, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2199-160X

URL الوصول: https://doaj.org/article/dcf7843cb4e44082bc49d22dcc770a7b