المؤلفون: Stig Helveg, Pleun Dona, J.F. Creemer, R. van Rijn, Hanne Falsig, I. Puspitasan, Luigi Mele, Ib Chorkendorff, Bruno Morana, Christian Fink Elkjær, Patricia J. Kooyman, B. J. Nelissen, Søren Bastholm Vendelbo

المصدر: Microscopy and Microanalysis. 21:419-420

مصطلحات موضوعية: law, Atomic resolution, Chemistry, Physical chemistry, Nanotechnology, Electron microscope, Instrumentation, law.invention, Ambient pressure, Catalysis

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3a40185340221985c19db904f1a8043c
https://doi.org/10.1017/s1431927615002895