المؤلفون: Hayoung Lee, Hyunggoy Oh, Sungho Kang

المصدر: IEEE Access, Vol 9, Pp 56443-56456 (2021)

مصطلحات موضوعية: Post-silicon debug, error detection, dynamic random-access memory (DRAM) usage, debug time, area overhead, built-in self-repair (BISR), Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9398706/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/9865f20309de46f193ca144c6cd8a675

المؤلفون: Inhyuk Choi, Won Jung, Hyunggoy Oh, Sungho Kang

المصدر: PLoS ONE, Vol 13, Iss 9, p e0202216 (2018)

مصطلحات موضوعية: Medicine, Science

وصف الملف: electronic resource

Relation: http://europepmc.org/articles/PMC6122784?pdf=render; https://doaj.org/toc/1932-6203

URL الوصول: https://doaj.org/article/8b45e8e9a14b4a639b6a4006188cd8b4

المؤلفون: Heetae Kim, Hyunggoy Oh, Jaeil Lim, Sungho Kang

المصدر: IEICE Electronics Express. 2017, 14(13):20170415

المؤلفون: Heetae Kim, Hyunggoy Oh, Jaeil Lim, Sungho Kang

المصدر: IEICE Electronics Express. 2017, 14(23):20171093

المؤلفون: Younsun Kim, Hyunggoy Oh, Sungho Kang

المصدر: Sensors; Volume 17; Issue 6; Pages: 1289

مصطلحات موضوعية: connected vehicle, virtual personal assistant

وصف الملف: application/pdf

Relation: Sensor Networks; https://dx.doi.org/10.3390/s17061289

الاتاحة: https://doi.org/10.3390/s17061289

المؤلفون: Hyunggoy Oh, Hayoung Lee, Sungho Kang

المصدر: IEEE Access, Vol 9, Pp 56443-56456 (2021)

مصطلحات موضوعية: General Computer Science, Computer science, media_common.quotation_subject, built-in self-repair (BISR), 02 engineering and technology, Maintenance engineering, area overhead, 020204 information systems, error detection, debug time, 0202 electrical engineering, electronic engineering, information engineering, General Materials Science, System on a chip, dynamic random-access memory (DRAM) usage, Observability, media_common, business.industry, General Engineering, Signature (logic), TK1-9971, 020202 computer hardware & architecture, Post-silicon debug, Debugging, Built-in self-test, Embedded system, Electrical engineering. Electronics. Nuclear engineering, business, Error detection and correction, Dram

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::272eff4ac648da8cc96ae3e5434863d6
https://doi.org/10.1109/access.2021.3071517

المؤلفون: Young-woo Lee, Inhyuk Choi, Sungho Kang, Hyunggoy Oh

المصدر: IEEE Transactions on Computers. 67:1835-1839

مصطلحات موضوعية: Scheme (programming language), business.industry, Computer science, media_common.quotation_subject, 02 engineering and technology, Resource (Windows), Reuse, 020202 computer hardware & architecture, Theoretical Computer Science, Silicon debug, Computational Theory and Mathematics, Debugging, Hardware and Architecture, Embedded system, 0202 electrical engineering, electronic engineering, information engineering, Routing (electronic design automation), business, computer, Software, media_common, computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cb24b6f9e73e9c76c2b47575888e0b4e
https://doi.org/10.1109/tc.2018.2835462

المؤلفون: Sungho Kang, Heetae Kim, Jaeil Lim, Hyunggoy Oh

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 37:906-910

مصطلحات موضوعية: 010302 applied physics, Engineering, business.industry, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Dissipation, 01 natural sciences, Computer Graphics and Computer-Aided Design, 020202 computer hardware & architecture, Reliability engineering, Thermal aware, Robustness (computer science), 0103 physical sciences, Thermal, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, business, Test scheduling, Software, Efficient energy use, Voltage, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::33d7d351587d848b567d2aa30492ca87
https://doi.org/10.1109/tcad.2017.2729282

المؤلفون: Hyunggoy Oh, Inhyuk Choi, Sungho Kang

المصدر: IEEE Transactions on Computers. 66:1504-1517

مصطلحات موضوعية: Multi-core processor, Computer science, Background debug mode interface, business.industry, x86 debug register, media_common.quotation_subject, 02 engineering and technology, 020202 computer hardware & architecture, Theoretical Computer Science, Computational Theory and Mathematics, Debugging, Hardware and Architecture, Embedded system, 0202 electrical engineering, electronic engineering, information engineering, System on a chip, Session (computer science), Error detection and correction, business, Software, Dram, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::92ab14596ca15b721660e0e0b95a6bf8
https://doi.org/10.1109/tc.2017.2678504

المؤلفون: Sungho Kang, Hyunggoy Oh, Jihye Kim, Kyunghwan Cho, Sangjun Lee

المصدر: ISOCC

مصطلحات موضوعية: Front and back ends, Bit (horse), Disk formatting, business.industry, Computer science, Scan chain, Benchmark (computing), Cell relay, business, Circuit reliability, Computer hardware, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cf5696aca33723c58ac324341f1854c4
https://doi.org/10.1109/isocc47750.2019.9078527

المؤلفون: Taewoo Han, Sungho Kang, Hyunggoy Oh, Inhyuk Choi

المصدر: IEEE Transactions on Computers. 66:38-44

مصطلحات موضوعية: business.industry, Computer science, Background debug mode interface, Circuit design, media_common.quotation_subject, Process (computing), 02 engineering and technology, 020202 computer hardware & architecture, Theoretical Computer Science, Data modeling, Silicon debug, Computational Theory and Mathematics, Debugging, Hardware and Architecture, Embedded system, 0202 electrical engineering, electronic engineering, information engineering, System on a chip, Error detection and correction, business, Software, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8fabbe1d3631376147105f687afa14f4
https://doi.org/10.1109/tc.2016.2561920

المؤلفون: Inhyuk Choi, Hyunggoy Oh, Taewoo Han, Sungho Kang

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 35:1219-1223

مصطلحات موضوعية: Multi-core processor, Engineering, business.industry, 020208 electrical & electronic engineering, Bandwidth (signal processing), Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Parallel computing, Chip, Computer Graphics and Computer-Aided Design, 020202 computer hardware & architecture, Network on a chip, Embedded system, 0202 electrical engineering, electronic engineering, information engineering, Overhead (computing), Single-core, System on a chip, Electrical and Electronic Engineering, Routing (electronic design automation), business, Software

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::22fc538698316b66be2046cbbe07dde4
https://doi.org/10.1109/tcad.2015.2481872

المؤلفون: Heetae Kim, Sangjun Lee, Sungho Kang, Hyunggoy Oh

المصدر: ISOCC

مصطلحات موضوعية: Induced path, Computer science, 020208 electrical & electronic engineering, Delay analysis, 02 engineering and technology, 020202 computer hardware & architecture, Power (physics), Threshold voltage, Control theory, 0202 electrical engineering, electronic engineering, information engineering, Sensitivity (control systems), Voltage drop, Efficient energy use, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2cc3c586206b3f60792d6a86c13067d8
https://doi.org/10.1109/isocc.2018.8649911

المؤلفون: Heetae Kim, Sungho Kang, Hyunggoy Oh, Sangjun Lee

المصدر: ISOCC

مصطلحات موضوعية: Digital electronics, Computer science, business.industry, 020208 electrical & electronic engineering, Scan chain, Volume (computing), 02 engineering and technology, 020202 computer hardware & architecture, Power (physics), Controllability, Test power, Logic gate, 0202 electrical engineering, electronic engineering, information engineering, business, Computer hardware, Test data

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f01954460e3f690a76b8a1618d766558
https://doi.org/10.1109/isocc.2018.8649956

المؤلفون: Hyunggoy Oh, Heetae Kim, Sungho Kang, Jaeil Lim

المصدر: ISOCC

مصطلحات موضوعية: Multi-core processor, business.industry, Computer science, media_common.quotation_subject, Automatic identification and data capture, 02 engineering and technology, 020202 computer hardware & architecture, Reduction (complexity), Debugging, Embedded system, 0202 electrical engineering, electronic engineering, information engineering, Key (cryptography), Overhead (computing), System on a chip, business, Dram, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7b7a8c8b90134bd2d7e93046397dca19
https://doi.org/10.1109/isocc.2017.8368799

المؤلفون: Inhyuk Choi, Hyunggoy Oh, Sungho Kang

المصدر: APCCAS

مصطلحات موضوعية: 010302 applied physics, Engineering, Job shop scheduling, business.industry, Test compression, 02 engineering and technology, Integrated circuit, Automatic test pattern generation, 01 natural sciences, 020202 computer hardware & architecture, law.invention, Test (assessment), Reduction (complexity), Stack (abstract data type), law, Embedded system, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, business, Test scheduling, Simulation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::88b7f7bdba9b27dd7b22646f44d767b8
https://doi.org/10.1109/apccas.2016.7804019

المؤلفون: Hyunggoy Oh, Sungho Kang, Inhyuk Choi

المصدر: APCCAS

مصطلحات موضوعية: Engineering, business.industry, media_common.quotation_subject, Real-time computing, Automotive industry, Image processing, Test (assessment), Debugging, Embedded system, Online test, Time overhead, Camera image, business, Reliability (statistics), media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::90ebea4c8e0d06625bf5c1bfd95e1e2e
https://doi.org/10.1109/apccas.2016.7803978

المؤلفون: Sungho Kang, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Heetae Kim

المصدر: ISOCC

مصطلحات موضوعية: Engineering, Resistive touchscreen, business.industry, 020208 electrical & electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Structural engineering, Bridge (interpersonal), 020202 computer hardware & architecture, Reliability engineering, Process variation, Reliability (semiconductor), Logic gate, 0202 electrical engineering, electronic engineering, information engineering, Fault analysis, business, Analysis method

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e8d051809af1e8e4ae5e956bd47be128
https://doi.org/10.1109/isocc.2016.7799830

المؤلفون: Hyunggoy Oh, Won Jai Jung, Dongho Kang, Sungho Kang

المصدر: 2015 International SoC Design Conference (ISOCC).

مصطلحات موضوعية: Reduction (complexity), Debugging, Computer science, media_common.quotation_subject, Real-time computing, Compaction, System on a chip, Observability, Post-silicon validation, Macro, Algorithm, media_common, Block (data storage)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5d17f3666a3cd3ca6fbf9d64bbae864f
https://doi.org/10.1109/isocc.2015.7401690

المؤلفون: Sungho Kang, Byungin Moon, Won Jai Jung, Inhyuk Choi, Taewoo Han, Hyunggoy Oh

المصدر: 2014 International SoC Design Conference (ISOCC).

مصطلحات موضوعية: Engineering, Signal processing, business.industry, media_common.quotation_subject, Circuit design, Overhead (engineering), Automotive industry, Image processing, Debugging, Embedded system, Computer-aided manufacturing, business, Reliability (statistics), media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::051d9edd3dac78b38a6e9da8e8590d89
https://doi.org/10.1109/isocc.2014.7087618