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1Periodical
المؤلفون: Seok-Geun Ahn, Ju-Hyeon Oh, Gwang-Jae Jeon, Dae-Ho Lee, Sun-Woo Choi, Kyoung-A Kim, Hyo-Kyeong Yun, Jin-Young Choi, Seok-Hyun Lee, Su-Jin Ahn
المصدر: Advancing Microelectronics; 2024, Vol. 51 Issue 5, p16-20, 5p
مصطلحات موضوعية: DIFFUSION barriers, ENERGY dispersive X-ray spectroscopy, SOLDER joints, INTERMETALLIC compounds, FOCUSED ion beams, X-ray emission spectroscopy