المؤلفون: Hyeong-Chan Son, Hyunwoo Kim

المصدر: IEEE Access, Vol 12, Pp 145393-145399 (2024)

مصطلحات موضوعية: Soft error, single-event transient (SET), gate-all-around (GAA), band-to-band tunneling (BTBT), ternary CMOS, heavy-ion effect, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10701305/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/11fb6963d4c64a0a989683d2ae32b1e7