يعرض 1 - 20 نتائج من 112 نتيجة بحث عن '"Houston, P.A."', وقت الاستعلام: 0.58s تنقيح النتائج
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    Academic Journal
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    Academic Journal
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    Academic Journal

    وصف الملف: text

    Relation: http://eprints.gla.ac.uk/117294/1/117294.pdf; Roberts, J.W., Chalker, P.R., Lee, K.B., Houston, P.A., Cho, S.-J. , Thayne, I.G. , Guiney, I., Wallis, D. and Humphreys, C.J. (2016) Control of threshold voltage in E-mode and D-mode GaN-on-Si metal-insulator-semiconductor heterostructure field effect transistors by in-situ fluorine doping of atomic layer deposition Al2O3 gate dielectrics. Applied Physics Letters , 108(7), 072901. (doi:10.1063/1.4942093 )

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    Academic Journal

    وصف الملف: text

    Relation: https://eprints.whiterose.ac.uk/161402/1/624V%205A%20all-GaN%20integrated%20cascode_Jiang%20et%20al.pdf; Jiang, S., Lee, K.B. orcid.org/0000-0002-5374-2767 , Pinchbeck, J. et al. (2 more authors) (2020) A 624 V 5 A all‐GaN integrated cascode for power‐switching applications. physica status solidi (a), 217 (7). 1900783. ISSN 1862-6300

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    Academic Journal

    وصف الملف: text

    Relation: https://eprints.whiterose.ac.uk/149262/1/gain_variation%20%28accepted%29.pdf; Alt, A., Hirshy, H., Jiang, S. et al. (6 more authors) (2019) Analysis of gain variation with changing supply voltages in GaN HEMTs for envelope tracking power amplifiers. IEEE Transactions on Microwave Theory and Techniques, 67 (7). pp. 2495-2504. ISSN 0018-9480

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    Academic Journal

    Relation: Singh, M., Karboyan, S., Uren, M.J. et al. (4 more authors) (2019) Lateral charge spreading and device-to-device coupling in C-doped AlGaN/GaN-on-Si wafers. Microelectronics Reliability, 95. pp. 81-86. ISSN 0026-2714

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    Academic Journal

    وصف الملف: text

    Relation: https://eprints.whiterose.ac.uk/143101/3/Field%20Plate%20Designs%20In%20All%20GaN%20Integrated%20Cascode%20-%20Final%20submitted%20version.pdf; Jiang, S. orcid.org/0000-0002-3687-1882 , Lee, K.B. orcid.org/0000-0002-5374-2767 , Zaidi, Z.H. et al. (3 more authors) (2019) Field plate designs in all-GaN cascode heterojunction field-effect transistors. IEEE Transactions on Electron Devices, 66 (4). pp. 1688-1693. ISSN 0018-9383

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    Academic Journal
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    Academic Journal
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    Academic Journal
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    Report

    Relation: Chatterjee, I., Uren, M.J., Pooth, A. et al. (9 more authors) (2016) Impact of Buffer Charge on the Reliability of Carbon Doped AlGaN/GaN-on-Si HEMTs. In: 2016 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). 2016 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 17-21 Apr 2016, Pasadena, USA. IEEE .

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    Conference
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    Academic Journal
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    Conference

    المصدر: The 10th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications ; page 316-320

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    Conference
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    Conference
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    Conference
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    Conference