-
1Academic Journal
المؤلفون: Houser, Ethan1 (AUTHOR) ephouser@ncsu.edu, Shashaani, Sara1 (AUTHOR), Harrysson, Ola1 (AUTHOR), Jeon, Yongseok1 (AUTHOR)
المصدر: IISE Transactions. Sep2024, Vol. 56 Issue 9, p1001-1019. 19p.
مصطلحات موضوعية: *MANUFACTURING defects, *MANUFACTURING processes, FEATURE selection, ELECTRON beam furnaces, ELECTRON beams, IMAGE registration
-
2Conference
المؤلفون: Houser, Ethan, Shashaani, Sara
المساهمون: National Science Foundation
المصدر: 2024 Winter Simulation Conference (WSC) ; page 3229-3240