المؤلفون: Badr, N., White, I.H., Tan, M.R.T., Houng, Y.M., Wang, S.Y.

المصدر: Conference on Lasers and Electro-Optics Europe ; page 198-199

الاتاحة: http://dx.doi.org/10.1109/cleoe.1994.636351
http://xplorestaging.ieee.org/ielx3/5030/13794/00636351.pdf?arnumber=636351

المؤلفون: Tan, M.R.T., Hahn, K.H., Houng, Y.M., Wang, S.Y., Yuen, A.T., Tao Zhang, Chun Lei

المصدر: Proceedings of IEEE 14th International Semiconductor Laser Conference ; page 177-178

الاتاحة: http://dx.doi.org/10.1109/islc.1994.519322
http://xplorestaging.ieee.org/ielx3/3955/11437/00519322.pdf?arnumber=519322

المؤلفون: Houng, Y.M., Tan, M.R.T., Liang, B.W., Wang, S.Y., Mars, D.E.

المصدر: Proceedings of 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM) ; page 619

الاتاحة: http://dx.doi.org/10.1109/iciprm.1994.328308
http://xplorestaging.ieee.org/ielx2/1091/7763/00328308.pdf?arnumber=328308

المؤلفون: Matine, N., Dvorak, M.W., Lam, S., Bolognesi, C.R., Houng, Y.M., Moll, N.

المصدر: Conference Proceedings. 2000 International Conference on Indium Phosphide and Related Materials (Cat. No.00CH37107) ; page 239-242

الاتاحة: http://dx.doi.org/10.1109/iciprm.2000.850276
http://xplorestaging.ieee.org/ielx5/6848/18406/00850276.pdf?arnumber=850276

المؤلفون: Dowd, P., White, I.H., Tan, M.R.T., Houng, Y.M., Wang, S.Y.

المصدر: LEOS '95. IEEE Lasers and Electro-Optics Society 1995 Annual Meeting. 8th Annual Meeting. Conference Proceedings ; volume 2, page 139-140

الاتاحة: http://dx.doi.org/10.1109/leos.1995.484635
http://xplorestaging.ieee.org/ielx2/3480/10309/00484635.pdf?arnumber=484635

المؤلفون: Houng, Y.M., Tan, M.R.T., Wang, S.Y.

المصدر: Proceedings of LEOS'94 ; volume 1, page 251

الاتاحة: http://dx.doi.org/10.1109/leos.1994.586987
http://xplorestaging.ieee.org/ielx2/4484/12750/00586987.pdf?arnumber=586987

المؤلفون: Tan, M.R.T., Houng, Y.M., Hahn, K.H., Weber, A.G., Wang, S.Y., Carey, K.W., Yuen, A., Dudley, J.

المصدر: LEOS '95. IEEE Lasers and Electro-Optics Society 1995 Annual Meeting. 8th Annual Meeting. Conference Proceedings ; volume 1, page 107-108

الاتاحة: http://dx.doi.org/10.1109/leos.1995.484531
http://xplorestaging.ieee.org/ielx2/3480/10308/00484531.pdf?arnumber=484531

المؤلفون: Tan, R.T., Corzine, S.W., Schneider, R.P., Houng, Y.M., Hahn, K.H., Huag, T.C., Wang, S.Y., Dudley, J.

المصدر: Optical Fiber Communications, OFC. ; page 11-12

الاتاحة: http://dx.doi.org/10.1109/ofc.1996.907595
http://xplorestaging.ieee.org/ielx5/7254/19564/00907595.pdf?arnumber=907595

المؤلفون: Houng, Y.M., Tan, M.R.T.

المصدر: Journal of Crystal Growth ; volume 175-176, page 352-358 ; ISSN 0022-0248

الاتاحة: http://dx.doi.org/10.1016/s0022-0248(96)00881-0
https://api.elsevier.com/content/article/PII:S0022024896008810?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0022024896008810?httpAccept=text/plain

المؤلفون: Houng, Y.M., Tan, M.R.T., Liang, B.W., Wang, S.Y., Yang, L., Mars, D.E.

المصدر: Journal of Crystal Growth ; volume 136, issue 1-4, page 216-220 ; ISSN 0022-0248

الاتاحة: http://dx.doi.org/10.1016/0022-0248(94)90412-x
https://api.elsevier.com/content/article/PII:002202489490412X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:002202489490412X?httpAccept=text/plain

المؤلفون: Lee, B.J., Houng, Y.M., Miller, J.N., Turner, J.E.

المصدر: Journal of Crystal Growth ; volume 105, issue 1-4, page 168-177 ; ISSN 0022-0248

الاتاحة: http://dx.doi.org/10.1016/0022-0248(90)90356-p
https://api.elsevier.com/content/article/PII:002202489090356P?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:002202489090356P?httpAccept=text/plain

المؤلفون: Matine, N., Dvorak, M.W., Lam, S., Bolognesi, C.R., Houng, Y.M., Moll, N.

المصدر: Conference Proceedings 2000 International Conference on Indium Phosphide & Related Materials (Cat. No.00CH37107); 2000, p239-242, 4p

المؤلفون: Escher, J.S., Gregory, P.E., Hyder, S.B., Houng, Y.M., Antypas, G.A.

المصدر: 1977 International Electron Devices Meeting; 1977, p460-464, 5p

المؤلفون: Houng, Y.M., Morkoç, H.

المصدر: Thin Solid Films ; volume 71, issue 1, page 141-145 ; ISSN 0040-6090

الاتاحة: http://dx.doi.org/10.1016/0040-6090(80)90193-5
https://api.elsevier.com/content/article/PII:0040609080901935?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:0040609080901935?httpAccept=text/plain

المؤلفون: Dowd, P., Summers, H.D., White, I.H., Tan, M.R.T., Houng, Y.M., Wang, S.Y.

المصدر: Electronics Letters (Institution of Engineering & Technology); 03/30/1995, Vol. 31 Issue 7, p557-559, 3p

المؤلفون: Badr, N., White, I.H., Tan, M.R.T., Houng, Y.M., Wang, S.Y.

المصدر: Electronics Letters (Institution of Engineering & Technology); 07/21/1994, Vol. 30 Issue 15, p1227-1229, 3p

المؤلفون: Ram, R.J., Yang, L., Nauka, K., Houng, Y.M., Ludowise, M., Mars, D.E., Dudley, J.J., Wang, S.Y.

المصدر: Applied Physics Letters; 5/17/1993, Vol. 62 Issue 20, p2474, 3p, 1 Black and White Photograph, 1 Diagram, 2 Graphs

مصطلحات موضوعية: SURFACE defects, SEMICONDUCTOR wafers, INTERFACES (Physical sciences)

المؤلفون: Badr, N., White, I.H., Tan, M.R.T., Houng, Y.M., Wang, S.Y.

المصدر: Conference on Lasers & Electro-Optics Europe; 1994, p198-199, 2p

المؤلفون: Tan, M.R.T., Hahn, K.H., Houng, Y.M., Wang, S.Y., Yuen, A.T., Tao Zhang, Chun Lei

المصدر: Proceedings of IEEE 14th International Semiconductor Laser Conference; 1994, p177-178, 2p

المؤلفون: Hahn, K.H., Tan, M.R., Houng, Y.M., Wang, S.Y.

المصدر: Electronics Letters (Institution of Engineering & Technology); 08/05/1993, Vol. 29 Issue 16, p1482-1483, 2p