المؤلفون: J. D. Gilpatrick, D. Barr, L. Day, D. Kerstiens, M. Stettler, R. Valdiviez, Los Alamos National, M. Gruchalla, Honeywell Corporation

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://epaper.kek.jp/d01/papers/ct05.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.624.382; http://epaper.kek.jp/d01/papers/ct05.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.624.382
http://epaper.kek.jp/d01/papers/ct05.pdf

المؤلفون: J. Cunningham, Honeywell Corporation, R. Valentin, C. Hillman, A. Dasgupta, M. Osterman

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.dfrsolutions.com/assets/2001_vq_hillman.cunningham.pdf.

مصطلحات موضوعية: Virtual Qualification, Physics of Failure, Circuit Card Assemblies, Interconnect Failure

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.129.8688; http://www.dfrsolutions.com/assets/2001_vq_hillman.cunningham.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.129.8688
http://www.dfrsolutions.com/assets/2001_vq_hillman.cunningham.pdf

المؤلفون: Human Resource Development Department, Honeywell Corporation

المصدر: Journal of Organizational Behavior Management; Sep1982, Vol. 3 Issue 4, p97-102, 6p

المؤلفون: He, Yuxin, Khan, M. Arif, Drake, Andrew D., Ladipo, Folami, Rankin, Stephen E., Knutson, Barbara L.

المساهمون: Division of Electrical, Communications and Cyber Systems, Division of Chemical, Bioengineering, Environmental, and Transport Systems, Honeywell Corporation

المصدر: Industrial & Engineering Chemistry Research ; volume 61, issue 33, page 12107-12117 ; ISSN 0888-5885 1520-5045

الاتاحة: http://dx.doi.org/10.1021/acs.iecr.2c00236
https://pubs.acs.org/doi/pdf/10.1021/acs.iecr.2c00236

المؤلفون: Yan, Wei, Tehranipoor, Fatemeh, Chandy, John A.

المساهمون: Comcast Corporation and Honeywell Corporation through the Center for Hardware Assurance, Security, and Engineering

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; volume 36, issue 9, page 1445-1457 ; ISSN 0278-0070 1937-4151

الاتاحة: http://dx.doi.org/10.1109/tcad.2016.2638445
http://xplorestaging.ieee.org/ielx7/43/8013181/07781645.pdf?arnumber=7781645

المؤلفون: Tehranipoor, Fatemeh, Karimian, Nima, Yan, Wei, Chandy, John A.

المساهمون: Comcast Corporation and Honeywell Corporation

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; volume 25, issue 3, page 1085-1097 ; ISSN 1063-8210 1557-9999

الاتاحة: http://dx.doi.org/10.1109/tvlsi.2016.2606658
http://xplorestaging.ieee.org/ielx7/92/7862316/07579621.pdf?arnumber=7579621

المؤلفون: Nguyen, Triet S., Nanguneri, Ravindra, Parkhill, John

المساهمون: Honeywell Corporation, University of Notre Dame, National Science Foundation

المصدر: The Journal of Chemical Physics ; volume 142, issue 13 ; ISSN 0021-9606 1089-7690

الاتاحة: http://dx.doi.org/10.1063/1.4916822
https://pubs.aip.org/aip/jcp/article-pdf/doi/10.1063/1.4916822/14805866/134113_1_online.pdf

المؤلفون: Prestigiacomo, Anthony R., Effler, Steven W., Matthews, David A.

المساهمون: Honeywell Corporation, Onondaga County Department of Water and Environmental Protection

المصدر: JAWRA Journal of the American Water Resources Association ; volume 51, issue 1, page 200-213 ; ISSN 1093-474X 1752-1688

الاتاحة: http://dx.doi.org/10.1111/jawr.12243
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1111%2Fjawr.12243
https://onlinelibrary.wiley.com/doi/pdf/10.1111/jawr.12243

المؤلفون: Schiavazzi, Daniele, Coletti, Filippo, Iaccarino, Gianluca, Eaton, John K.

المساهمون: Lawrence Livermore National Security, Department of Energy National Nuclear Security Administration for the Management and Operation of the Lawrence Livermore National Laboratory, Honeywell Corporation

المصدر: Journal of Computational Physics ; volume 263, page 206-221 ; ISSN 0021-9991

الاتاحة: http://dx.doi.org/10.1016/j.jcp.2013.12.049
https://api.elsevier.com/content/article/PII:S0021999113008577?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0021999113008577?httpAccept=text/plain

المؤلفون: Dunn, Patrick F., Thomas, Flint O., Leighton, James B., Lv, Dayu

المساهمون: Honeywell Corporation

المصدر: Fuel ; volume 90, issue 3, page 1257-1263 ; ISSN 0016-2361

الاتاحة: http://dx.doi.org/10.1016/j.fuel.2010.11.039
https://api.elsevier.com/content/article/PII:S001623611000654X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S001623611000654X?httpAccept=text/plain