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1Dissertation/ Thesis
المؤلفون: Norouzpour, Mana
Thesis Advisors: Herring, Rodney A.
مصطلحات موضوعية: Atomic Displacement, Strain, Electron Interferometry, Higher Order Laue Zone Lines, Electron Diffraction, SIS-HOLZ, Diffracted Beam Interferometry, Self-Interference of Split HOLZ lines
الاتاحة: http://hdl.handle.net/1828/8033
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2Academic Journal
المساهمون: Laboratoire d'Etude des Matériaux par Microscopie Avancée (LEMMA), Modélisation et Exploration des Matériaux (MEM), Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), University of Illinois at Urbana-Champaign Urbana (UIUC), University of Illinois System, Nanostructures et Rayonnement Synchrotron (NRS)
المصدر: ISSN: 0304-3991 ; Ultramicroscopy ; https://cea.hal.science/cea-01851578 ; Ultramicroscopy, 2016, 160, pp.64-73. ⟨10.1016/j.ulisamic.2014.12.009⟩.
مصطلحات موضوعية: Lattice parameter determination, Gradient Tensor, CBED Patterns, Strain-Measurements, Holz Lines, EBSD, [PHYS]Physics [physics]
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3Academic Journal
المؤلفون: A. SPESSOT, R. BALBONI, A. ARMIGLIATO, FRABBONI, Stefano
المساهمون: A., Spessot, Frabboni, Stefano, R., Balboni, A., Armigliato
مصطلحات موضوعية: convergent beam electron diffraction strain fields in nanodevices holz lines splitting
وصف الملف: STAMPA
Relation: info:eu-repo/semantics/altIdentifier/pmid/17444943; info:eu-repo/semantics/altIdentifier/wos/WOS:000245744400005; volume:226; issue:2; firstpage:140; lastpage:155; journal:JOURNAL OF MICROSCOPY; http://hdl.handle.net/11380/451899; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-34247255401
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4Academic Journal
المؤلفون: Zou, Huamin, Liu, Jun, Ding, Di-hua, Wang, Renhui, Froyen, Ludo, Delaey, Lucas
مصطلحات موضوعية: lacbed, strain, interface, elastic relaxation, holz lines, dislocations, layers
Relation: Ultramicroscopy vol:72 issue:1-2 pages:1-15; https://lirias.kuleuven.be/handle/123456789/80247; https://lirias.kuleuven.be/bitstream/123456789/80247/1//pub00543.pdf
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5
المؤلفون: Pike, W. T.
مصطلحات موضوعية: crystal growth Laue zone atomic level CBM electron source holz lines
وصف الملف: 243496 bytes; application/pdf
Relation: Cincinnati, Ohio, USA; 93-1154; http://hdl.handle.net/2014/35495
الاتاحة: http://hdl.handle.net/2014/35495