المؤلفون: Petryk, M., Hinbern, K., Kaye, W., Zhang, F., Streicher, M., Boucher, A., He, Z.

المصدر: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) ; page 1-1

الاتاحة: https://doi.org/10.1109/nss/mic/rtsd57108.2024.10658416
http://xplorestaging.ieee.org/ielx8/10654796/10654808/10658416.pdf?arnumber=10658416