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1Academic Journal
المؤلفون: Di Zhang, Katherine J. Harmon, Michael J. Zachman, Ping Lu, Doyun Kim, Zhan Zhang, Nicholas Cucciniello, Reid Markland, Ken William Ssennyimba, Hua Zhou, Yue Cao, Matthew Brahlek, Hao Zheng, Matthew M. Schneider, Alessandro R. Mazza, Zach Hughes, Chase Somodi, Benjamin Freiman, Sarah Pooley, Sundar Kunwar, Pinku Roy, Qing Tu, Rodney J. McCabe, Aiping Chen
المصدر: InfoMat, Vol 6, Iss 9, Pp n/a-n/a (2024)
مصطلحات موضوعية: ferroelectrics, high‐resolution x‐ray diffraction, high‐throughput combinatorial synthesis, pulsed laser deposition, scanning transmission electron microscopy, superlattices, Materials of engineering and construction. Mechanics of materials, TA401-492, Information technology, T58.5-58.64
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2567-3165
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2Academic JournalA Comparative Study of Methods for Calculating the Dislocation Density in GaN-on-Si Epitaxial Wafers
المصدر: Micromachines, Vol 15, Iss 8, p 954 (2024)
مصطلحات موضوعية: GaN-on-Si, epitaxial wafers, dislocation density, characterization methods, high-resolution X-ray diffraction, Mechanical engineering and machinery, TJ1-1570
وصف الملف: electronic resource
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3Academic Journal
المؤلفون: Bauer, Sondes, Nergis, Berkin, Jin, Xiaowei, Schneider, Reinhard, Wang, Di, Kübel, Christian, Machovec, Petr, Horak, Lukas, Holy, Vaclav, Seemann, Klaus, Baumbach, Tilo, Ulrich, Sven
المصدر: Nanomaterials, 14 (8), Art.-Nr.: 711 ; ISSN: 2079-4991
مصطلحات موضوعية: heterostructures, temperature-dependent magnetic properties, pulsed laser deposition, interfacial quality, high-resolution transmission electron microscopy, high-resolution X-ray diffraction reciprocal space mapping, growth sequence, ddc:600, Technology, info:eu-repo/classification/ddc/600
وصف الملف: application/pdf
Relation: info:eu-repo/semantics/altIdentifier/wos/001211418900001; info:eu-repo/semantics/altIdentifier/issn/2079-4991; https://publikationen.bibliothek.kit.edu/1000170673; https://publikationen.bibliothek.kit.edu/1000170673/152856542; https://doi.org/10.5445/IR/1000170673
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4Academic Journal
المؤلفون: Sondes Bauer, Berkin Nergis, Xiaowei Jin, Reinhard Schneider, Di Wang, Christian Kübel, Petr Machovec, Lukas Horak, Vaclav Holy, Klaus Seemann, Tilo Baumbach, Sven Ulrich
المصدر: Nanomaterials, Vol 14, Iss 8, p 711 (2024)
مصطلحات موضوعية: heterostructures, temperature-dependent magnetic properties, pulsed laser deposition, interfacial quality, high-resolution transmission electron microscopy, high-resolution X-ray diffraction reciprocal space mapping, Chemistry, QD1-999
Relation: https://www.mdpi.com/2079-4991/14/8/711; https://doaj.org/toc/2079-4991; https://doaj.org/article/96164670925e404c825a7c2e0389bd67
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5Academic Journal
المؤلفون: Zhe Chuan Feng, Jiamin Liu, Deng Xie, Manika Tun Nafisa, Chuanwei Zhang, Lingyu Wan, Beibei Jiang, Hao-Hsiung Lin, Zhi-Ren Qiu, Weijie Lu, Benjamin Klein, Ian T. Ferguson, Shiyuan Liu
المصدر: Materials, Vol 17, Iss 12, p 2921 (2024)
مصطلحات موضوعية: gallium nitride (GaN), molecular beam epitaxy (MBE), high-resolution X-ray diffraction (HR-XRD), Nomarski microscopy (NM), Raman scattering, photoluminescence (PL), Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
Relation: https://www.mdpi.com/1996-1944/17/12/2921; https://doaj.org/toc/1996-1944; https://doaj.org/article/ba9752e518824bcc952da569dc862ff4
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6Academic Journal
المؤلفون: Simone Dolabella, Alexandre Reinhardt, Ausrine Bartasyte, Samuel Margueron, Amit Sharma, Xavier Maeder, Alex Dommann, Antonia Neels, Aurelio Borzì
المصدر: Materials & Design, Vol 231, Iss , Pp 112001- (2023)
مصطلحات موضوعية: LiNbO3, Crystal ion-slicing, High-resolution X-ray diffraction, Diffuse X-ray scattering, Materials of engineering and construction. Mechanics of materials, TA401-492
وصف الملف: electronic resource
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7Academic Journal
المؤلفون: Lovergine N., Miccoli I., Tapfer L., Prete P.
المساهمون: Lovergine, N., Miccoli, I., Tapfer, L., Prete, P.
مصطلحات موضوعية: GaAs heteroepitaxy, High resolution X-ray diffraction, Metalorganic vapor phase epitaxy, Mosaicity, Reciprocal space mapping, Rotational twins, Silicon substrate, X-ray polar figures
وصف الملف: ELETTRONICO
Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001013836000001; volume:634; firstpage:1; lastpage:9; numberofpages:9; journal:APPLIED SURFACE SCIENCE; https://hdl.handle.net/11587/503007; https://www.sciencedirect.com/science/article/pii/S0169433223013065?via=ihub
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8Academic Journal
المؤلفون: Kim, Yeongho, Alotaibi, Saud, Henini, Mohamed, Chun, Byong Sun, Lee, Sang Jun
مصطلحات موضوعية: Electric currents, Heterostructures, Photodetectors, Semiconductor structures, Crystallographic defects, Crystallography, Epitaxy, High resolution X-ray diffraction, Laplace deep level transient spectroscopy
Relation: https://nottingham-repository.worktribe.com/output/23877118; APL Materials; Volume 11; Issue 8; https://nottingham-repository.worktribe.com/file/23877118/1/Uncooled%20mid-wavelength%20InAsSb%2FAlAsSb%20heterojunction%20photodetectors
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9Academic Journal
المؤلفون: Paola Prete, Daniele Calabriso, Emiliano Burresi, Leander Tapfer, Nico Lovergine
المصدر: Materials; Volume 16; Issue 12; Pages: 4254
مصطلحات موضوعية: GaAsP, III-V heterostructures, strain relaxation, critical thickness, metastable heterostructures, metalorganic vapor phase epitaxy, solid-vapor segregation coefficient, high-resolution X-ray diffraction, field emission scanning electron microscopy, III-V based solar cells
وصف الملف: application/pdf
Relation: https://dx.doi.org/10.3390/ma16124254
الاتاحة: https://doi.org/10.3390/ma16124254
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10Academic Journal
المؤلفون: Felix N. Chukhovskii, Petr V. Konarev, Vladimir V. Volkov
المصدر: Crystals, Vol 13, Iss 4, p 561 (2023)
مصطلحات موضوعية: high-resolution X-ray diffraction microtomography, Coulomb-type point defects in a crystal, statistical noise filtering, signal-to-noise ratio, χ 2 -target function, figure of merit, Crystallography, QD901-999
Relation: https://www.mdpi.com/2073-4352/13/4/561; https://doaj.org/toc/2073-4352; https://doaj.org/article/c988d3c0195c4e1f81404c819f24025d
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11Academic Journal
المساهمون: Geisz, John [National Renewable Energy Lab. (NREL), Golden, CO (United States)]
المصدر: Journal of Crystal Growth; 464; C
وصف الملف: Medium: ED; Size: p. 20-27
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12Academic Journal
المساهمون: Veal, T. [Univ. of Liverpool, Liverpool (United Kingdom). Stephenson Inst. for Renewable Energy and Dept. of Physics.] (ORCID:0000000206105626)
المصدر: Journal of Crystal Growth; 425; C
وصف الملف: Medium: ED; Size: p. 241-244
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13Academic Journal
المساهمون: Kim, J. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)]
المصدر: Journal of Crystal Growth; 425
وصف الملف: Medium: ED; Size: p. 110-114
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14Academic Journal
المؤلفون: Yichao Liu, Cangmin Wang, Wenyu Huang, Shaoting Wang, Huaili Qiu, Weifeng Ge, Meixia Chen, Hui Zhang, Yueliang Gu, Xingmin Zhang, Xiaolong Li, Xingyu Gao, Yuanjun Yang
المصدر: Frontiers in Materials, Vol 9 (2022)
مصطلحات موضوعية: metal-insulator transition, structural phase transformation, VO2 epitaxial film, lattice constants and mismatch angle, high-resolution X-ray diffraction, Technology
وصف الملف: electronic resource
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15Academic Journal
المؤلفون: Stanionytė, Sandra, Malinauskas, Tadas, Niaura, Gediminas, Skapas, Martynas, Devenson, Jan, Krotkus, Arūnas
المصدر: Materials., Basel : MDPI AG, 2022, vol. 15, iss. 14, art. no. 4847, p. 1-12. ; eISSN 1996-1944
مصطلحات موضوعية: bismuth thin film, molecular beam epitaxy, high-resolution X-ray diffraction
وصف الملف: application/pdf
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16Academic Journal
المؤلفون: Geon-Hyeong Kang, Ki Chul Jung, Jongbum Kim, JoonHyun Kang, In Soo Kim, Young-Hwan Kim
المصدر: Coatings; Volume 12; Issue 11; Pages: 1787
مصطلحات موضوعية: ferroelectricity, high-resolution X-ray diffraction, potassium tantalate niobate, RF magnetron co-sputtering, Raman spectroscopy, spectroscopic ellipsometry, thin films
وصف الملف: application/pdf
Relation: Thin Films; https://dx.doi.org/10.3390/coatings12111787
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17Academic Journal
المؤلفون: Sandra Stanionytė, Tadas Malinauskas, Gediminas Niaura, Martynas Skapas, Jan Devenson, Arūnas Krotkus
المصدر: Materials; Volume 15; Issue 14; Pages: 4847
مصطلحات موضوعية: bismuth thin film, molecular beam epitaxy, high-resolution X-ray diffraction
وصف الملف: application/pdf
Relation: https://dx.doi.org/10.3390/ma15144847
الاتاحة: https://doi.org/10.3390/ma15144847
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18Academic Journal
المؤلفون: Tomasz Sochacki, Robert Kucharski, Karolina Grabianska, Jan L. Weyher, Malgorzata Iwinska, Michal Bockowski, Lutz Kirste
المصدر: Materials; Volume 15; Issue 13; Pages: 4621
مصطلحات موضوعية: GaN, crystal growth, basic ammonothermal method, X-ray topography, high-resolution X-ray diffraction, diffuse scattering
وصف الملف: application/pdf
Relation: Electronic Materials; https://dx.doi.org/10.3390/ma15134621
الاتاحة: https://doi.org/10.3390/ma15134621
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19Academic Journal
المؤلفون: Wenyu Yang, Zhengxia Yang, Mengqi Wang, Hongyan Yu, Yejin Zhang, Wei Wang, Xuliang Zhou, Jiaoqing Pan
المصدر: Crystals; Volume 12; Issue 4; Pages: 476
مصطلحات موضوعية: high-resolution X-ray diffraction, growth models, metal-organic chemical vapor deposition, nanomaterials, semiconducting III–V materials, semiconducting silicon
وصف الملف: application/pdf
Relation: Inorganic Crystalline Materials; https://dx.doi.org/10.3390/cryst12040476
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20Academic Journal
المساهمون: Noyan, I. [Columbia Univ., New York, NY (United States)]
المصدر: Applied Physics Letters; 107; 25
وصف الملف: Medium: ED; Size: Article No. 251905