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1Academic Journal
المؤلفون: Department of Materials Science and Engineering, University of Florida, PO BOX 116400 Rhines Hall, Gainesville, FL 32611, USA ( host institution ), Lee, K.N ( author ), Cao, X.A ( author ), Abernathy, C.R ( author ), Pearton, S.J ( author ), Zhang, A.P ( author ), Ren, F ( author ), Hickman, R ( author ), Van Hove, J.M ( author )
مصطلحات موضوعية: GaN, Schottky diode, Annealing thermal damage, I– V ozone/HCl treatment
وصف الملف: Pages 1203-1208
Relation: Solid State Electronics; S0038-1101(00)00041-1; SSE; 2417; http://ufdc.ufl.edu/LS00509515/00001
الاتاحة: https://doi.org/10.1016/S0038-1101(00)00041-1
http://ufdc.ufl.edu/LS00509515/00001 -
2Academic Journal
المؤلفون: Department of Chemical Engineering, University of Florida, PO Box 116005, Gainesville, FL 32611, USA ( host institution ), Ren, F ( author ), Han, J ( author ), Hickman, R ( author ), Van Hove, J.M ( author ), Chow, P.P ( author ), Klaassen, J.J ( author ), LaRoche, J.R ( author ), Jung, K.B ( author ), Cho, H ( author ), Cao, X.A ( author ), Donovan, S.M ( author ), Kopf, R.F ( author ), Wilson, R.G ( author ), Baca, A.G ( author ), Shul, R.J ( author ), Zhang, L ( author ), Willison, C.G ( author ), Abernathy, C.R ( author ), Pearton, S.J ( author )
وصف الملف: Pages 239-244
Relation: Solid State Electronics; S0038-1101(99)00229-4; SSE; 2277; http://ufdc.ufl.edu/LS00509508/00001
الاتاحة: https://doi.org/10.1016/S0038-1101(99)00229-4
http://ufdc.ufl.edu/LS00509508/00001 -
3Academic Journal
المؤلفون: Blue Lotus Micro Devices Executive Dr., Eden Prairie, MN 55344, USA ( host institution ), Hickman, R ( author ), Van Hove, J.M ( author ), Chow, P.P ( author ), Klaassen, J.J ( author ), Wowchak, A.M ( author ), Polley, C.J ( author ), King, D.J ( author ), Ren, F ( author ), Abernathy, C.R ( author ), Pearton, S.J ( author ), Jung, K.B ( author ), Cho, H ( author ), La Roche, J.R ( author )
وصف الملف: Pages 377-381
Relation: Solid State Electronics; S0038-1101(99)00245-2; SSE; 2293; http://ufdc.ufl.edu/LS00509509/00001
الاتاحة: https://doi.org/10.1016/S0038-1101(99)00245-2
http://ufdc.ufl.edu/LS00509509/00001