المؤلفون: Heulbi Ahn, Jaeseok Bae, Jungjae Park, Jonghan Jin

المصدر: Scientific Reports, Vol 8, Iss 1, Pp 1-9 (2018)

مصطلحات موضوعية: Through-silicon Vias (TSV), Three-dimensional Profile, Major Uncertainty Components, Optical Path Difference (OPD), International Standard Guidelines, Medicine, Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2045-2322

URL الوصول: https://doaj.org/article/f47fd52793a441f998c37807c90ec457

المؤلفون: Jonghan Jin, Yeongjun Kim, Heulbi Ahn, Jungjae Park

المصدر: Optical Manufacturing and Testing XIV.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2271f472f6e0261854c2f5c12d4b58e0
https://doi.org/10.1117/12.2632344

المؤلفون: Jungjae Park, Jonghan Jin, Heulbi Ahn, Yeoungjun Kim

المصدر: Journal of the Korean Society for Precision Engineering. 37:181-186

مصطلحات موضوعية: Physics, Interferometry, Optics, business.industry, Mechanical Engineering, Spectral domain, Safety, Risk, Reliability and Quality, business, Polarization (waves), Industrial and Manufacturing Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::54c32d5966f27c02ab67caa6e74f2187
https://doi.org/10.7736/jkspe.019.130

المؤلفون: Jong-Ahn Kim, Jaeseok Bae, Jungjae Park, Jonghan Jin, Heulbi Ahn

المصدر: International Journal of Precision Engineering and Manufacturing. 20:463-477

مصطلحات موضوعية: 0209 industrial biotechnology, Materials science, business.industry, Mechanical Engineering, 02 engineering and technology, Industrial and Manufacturing Engineering, Interferometry, Laser interferometry, 020303 mechanical engineering & transports, 020901 industrial engineering & automation, Semiconductor, Optics, 0203 mechanical engineering, Interference (communication), Metre, Monochromatic color, Electrical and Electronic Engineering, business, Analysis method

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::93e5bf69ea821bdf9ee361adc1067eb6
https://doi.org/10.1007/s12541-019-00105-0

المؤلفون: Jungjae Park, Jaeseok Bae, Jonghan Jin, Heulbi Ahn

المصدر: Scientific Reports, Vol 8, Iss 1, Pp 1-9 (2018)
Scientific Reports

مصطلحات موضوعية: Materials science, Silicon, Semiconductor device fabrication, Science, Measure (physics), chemistry.chemical_element, 02 engineering and technology, 01 natural sciences, Article, law.invention, 010309 optics, Reliability (semiconductor), Optical microscope, International Standard Guidelines, law, 0103 physical sciences, Major Uncertainty Components, Multidisciplinary, Optical Path Difference (OPD), business.industry, Process (computing), 021001 nanoscience & nanotechnology, Through-silicon Vias (TSV), Interferometry, chemistry, Three-dimensional Profile, Optoelectronics, Medicine, 0210 nano-technology, business, Realization (systems)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f27cc370b598e481064530975c2d2684
https://doaj.org/article/f47fd52793a441f998c37807c90ec457

المؤلفون: Jungjae Park, Jonghan Jin, Jaeseok Bae, Heulbi Ahn

المصدر: Optics Express. 29:31615

مصطلحات موضوعية: Observational error, Materials science, Silicon, business.industry, chemistry.chemical_element, Substrate (electronics), Spectral bands, Atomic and Molecular Physics, and Optics, Interferometry, Optics, chemistry, Measurement uncertainty, Thin film, business, Beam (structure)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::955b594f9816c97449af8162d94a3abd
https://doi.org/10.1364/oe.440507

المؤلفون: Jungjae Park, Jonghan Jin, Jong-Ahn Kim, Heulbi Ahn

المصدر: Journal of Lightwave Technology. 34:5462-5466

مصطلحات موضوعية: Materials science, Microscope, Optical fiber, Silicon, business.industry, Confocal, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, law.invention, 010309 optics, Interferometry, Light intensity, Optics, chemistry, law, Confocal microscopy, 0103 physical sciences, 0210 nano-technology, business, Refractive index

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b4e37ab17722d2ff0a53a516f1b1bcb6
https://doi.org/10.1109/jlt.2016.2618419

المؤلفون: Heulbi Ahn, Jungjae Park, Jonghan Jin, Jaeseok Bae

المصدر: OPTICS EXPRESS(25): 11

مصطلحات موضوعية: Materials science, business.industry, Measure (physics), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, law.invention, 010309 optics, Optical comb, Interferometry, Optics, law, 0103 physical sciences, Wafer, Photolithography, 0210 nano-technology, business, Refractive index, Layer (electronics), Optical depth

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::04fecae8afe32918103ca3569584ae5c
https://pubmed.ncbi.nlm.nih.gov/28786623

المؤلفون: Jungjae Park, Heulbi Ahn, Jonghan Jin, Jaeseok Bae

المصدر: Imaging and Applied Optics 2016.

مصطلحات موضوعية: Materials science, business.industry, Substrate (electronics), Interference (wave propagation), Standard deviation, Interferometry, symbols.namesake, Fourier transform, Optics, Transmission (telecommunications), symbols, business, Refractive index, Optical depth

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::17998fffb800e4652da96e6293c46ea4
https://doi.org/10.1364/3d.2016.jt3a.2

المؤلفون: Heulbi Ahn, Jonghan Jin, Jaeseok Bae, Jungjae Park

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Materials science, Microscope, Silicon, Physics::Instrumentation and Detectors, business.industry, Confocal, chemistry.chemical_element, Spectral domain, law.invention, Interferometry, Optics, chemistry, law, business, Uncertainty analysis

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::095982bccc1d2b9dfd1cc44010c7d361
http://www.scopus.com/inward/record.url?eid=2-s2.0-85029137194&partnerID=MN8TOARS