المؤلفون: Inho Seong, Sijun Kim, Minsu Choi, Woobeen Lee, Wonnyoung Jeong, Chulhee Cho, Yebin You, Youngseok Lee, Youbin Seol, Shinjae You

المصدر: Materials; Volume 16; Issue 17; Pages: 5746

مصطلحات موضوعية: ion flux, ion energy distribution function, He addition, charge transfer collision, heterogeneous charge transfer collision

وصف الملف: application/pdf

Relation: https://dx.doi.org/10.3390/ma16175746

الاتاحة: https://doi.org/10.3390/ma16175746

المؤلفون: Inho Seong, Sijun Kim, Minsu Choi, Woobeen Lee, Wonnyoung Jeong, Chulhee Cho, Yebin You, Youngseok Lee, Youbin Seol, Shinjae You

المصدر: Materials, Vol 16, Iss 5746, p 5746 (2023)

مصطلحات موضوعية: ion flux, ion energy distribution function, He addition, charge transfer collision, heterogeneous charge transfer collision, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85

Relation: https://www.mdpi.com/1996-1944/16/17/5746; https://doaj.org/toc/1996-1944; https://doaj.org/article/33c43fe95ad24d479f006f4d0a852f83

الاتاحة: https://doi.org/10.3390/ma16175746
https://doaj.org/article/33c43fe95ad24d479f006f4d0a852f83