المؤلفون: Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich

المصدر: Journal of Electronic Testing. 39:27-40

مصطلحات موضوعية: Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2dc676418451be131f3ebf565a83edc1
https://doi.org/10.1007/s10836-023-06044-z

المؤلفون: Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:5644-5656

مصطلحات موضوعية: Electrical and Electronic Engineering, Computer Graphics and Computer-Aided Design, Software

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2385452ab9b9d8efc0a02518ac1ebb59
https://doi.org/10.1109/tcad.2022.3158250

المؤلفون: Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich

المصدر: Journal of Electronic Testing. 38:603-621

مصطلحات موضوعية: Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::287eb46569259c842e9168aa84eda502
https://doi.org/10.1007/s10836-022-06038-3

المؤلفون: Somayeh Sadeghi-Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich

المصدر: Journal of Electronic Testing. 37:715-728

مصطلحات موضوعية: Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8e9977bbb1cc1af3d3bc0795f21c082a
https://doi.org/10.1007/s10836-021-05979-5

المؤلفون: Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich

المصدر: 2022 IEEE 31st Asian Test Symposium (ATS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::24df7812a60ddcbac8815b9d4935d1ae
https://doi.org/10.1109/ats56056.2022.00026

المؤلفون: Hans-Joachim Wunderlich

المصدر: Machine Learning Support for Fault Diagnosis of System-on-Chip ISBN: 9783031196386

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::42fa63614fe13b35e61d337c7995e5a4
https://doi.org/10.1007/978-3-031-19639-3_4

المؤلفون: Yiwen Liao, Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich, Bin Yang

المصدر: 2022 IEEE International Test Conference (ITC).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dc34dde3ca367a76f8d8b0074aedc024
https://doi.org/10.1109/itc50671.2022.00026

المؤلفون: Zahra Paria Najafi-Haghi, Florian Klemme, Hussam Amrouch, Hans-Joachim Wunderlich

المصدر: 2022 IEEE European Test Symposium (ETS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::65eba3f0f7eede35540004bfa8ecc27f
https://doi.org/10.1109/ets54262.2022.9810443

المؤلفون: Hans-Joachim Wunderlich

المصدر: Taschenbuch Digitaltechnik ISBN: 9783446432635
Taschenbuch Digitaltechnik

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ad85d66ef069eee86bf0f5aeb55d9337
https://doi.org/10.3139/9783446470453.009

المؤلفون: Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich

المصدر: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b1f8b7844c06f0b393a9219d16fe0ecc
https://doi.org/10.23919/date54114.2022.9774770

المؤلفون: Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich

المصدر: 2021 IEEE 22nd Latin American Test Symposium (LATS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::334d687c58bcd251772e658d43c02d89
https://doi.org/10.1109/lats53581.2021.9651857

المؤلفون: Hans-Joachim Wunderlich, Chih-Hao Wang, Natalia Lylina

المصدر: ITC

مصطلحات موضوعية: business.industry, Computer science, Embedded system, business, Testability

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c11f4e350e7348ffebceadce9895fd9d
https://doi.org/10.1109/itc50571.2021.00009

المؤلفون: Hans-Joachim Wunderlich, Eric Schneider, Chang Liu, Matthias Kampmann, Michael A. Kochte, Sybille Hellebrand

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 38:1956-1968

مصطلحات موضوعية: Computer science, Reliability (computer networking), 02 engineering and technology, Automatic test pattern generation, Fault (power engineering), Computer Graphics and Computer-Aided Design, Field (computer science), 020202 computer hardware & architecture, Reliability engineering, Built-in self-test, Logic gate, 0202 electrical engineering, electronic engineering, information engineering, Overhead (computing), Electrical and Electronic Engineering, Software

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5bd52a7db130fe90659267beecbe3dfd
https://doi.org/10.1109/tcad.2018.2864255

المؤلفون: Ahmed Atteya, Chih-Hao Wang, Natalia Lylina, Tong-Yu Hsieh, Hans-Joachim Wunderlich

المصدر: IOLTS

مصطلحات موضوعية: Scheme (programming language), Exploit, Computer science, business.industry, System integrity, Built-in self-test, Embedded system, Scalability, Dependability, Software system, State (computer science), business, computer, computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::228d68c82c56867d65d8237aabd685d4
https://doi.org/10.1109/iolts52814.2021.9486710

المؤلفون: Hans-Joachim Wunderlich, Ahmed Atteya, Natalia Lylina

المصدر: VTS

مصطلحات موضوعية: Very-large-scale integration, Scheme (programming language), Sequence, Computer science, Distributed computing, 0211 other engineering and technologies, 02 engineering and technology, 020202 computer hardware & architecture, Filter (video), User group, Information leakage, Scalability, 0202 electrical engineering, electronic engineering, information engineering, Overhead (computing), computer, 021106 design practice & management, computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::11be600f4b1c2329ab71b664e2ebf422
https://doi.org/10.1109/vts50974.2021.9441029

المؤلفون: M. Wagner, H. -j. Wunderlich, Marcus Wagner, Hans-joachim Wunderlich

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2013/DATE_WagneW2013.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.641.4901; http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2013/DATE_WagneW2013.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.641.4901
http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2013/DATE_WagneW2013.pdf

المؤلفون: Hans-Joachim Wunderlich, Eric Schneider, Jorg Henkel, Lars Bauer, Hongyan Zhang, Michael A. Kochte

المصدر: Dependable Embedded Systems ISBN: 9783030520168

مصطلحات موضوعية: Placement method, business.industry, Computer science, Reliability (computer networking), 020206 networking & telecommunications, 02 engineering and technology, Fault detection and isolation, 020202 computer hardware & architecture, Embedded system, 0202 electrical engineering, electronic engineering, information engineering, Online test, Dependability, business, Field-programmable gate array, Combined method, AND gate

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::454408b934d13fcbb7eb2ca49f1225a8
https://doi.org/10.1007/978-3-030-52017-5_12

المؤلفون: Hans-Joachim Wunderlich, Chih-Hao Wang, Ahmed Atteya, Natalia Lylina

المصدر: ITC

مصطلحات موضوعية: Heuristic (computer science), Computer science, business.industry, media_common.quotation_subject, 0211 other engineering and technologies, Scan chain, 02 engineering and technology, Multi-commodity flow problem, 020202 computer hardware & architecture, Debugging, Minimum cut, Embedded system, Information leakage, 0202 electrical engineering, electronic engineering, information engineering, Device under test, business, Integer programming, 021106 design practice & management, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8451aca84881e926262d3e061dff1638
https://doi.org/10.1109/itc44778.2020.9325227

المؤلفون: Xiaoqing Wen, Alexander Sprenger, Hans-Joachim Wunderlich, Stefan Holst, Jan Dennis Reimer, Sybille Hellebrand, Matthias Kampmann

المصدر: ITC

مصطلحات موضوعية: education.field_of_study, Computer science, Reliability (computer networking), Population, 0211 other engineering and technologies, 02 engineering and technology, Fault injection, Fault (power engineering), 020202 computer hardware & architecture, Data modeling, Reliability engineering, Scalability, 0202 electrical engineering, electronic engineering, information engineering, Benchmark (computing), education, 021106 design practice & management, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::43efc066ab5dec9c56946b450dda2bf2
https://doi.org/10.1109/itc44778.2020.9325234

المؤلفون: Hans-Joachim Wunderlich, Marzieh Hashemipour-Nazari, Zahra Paria Najafi-Haghi

المصدر: ETS

مصطلحات موضوعية: System failure, Computer science, Statistical learning, Hardware_PERFORMANCEANDRELIABILITY, Cellular level, Classifier (UML), Reliability engineering, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ff48feac514a05f41f5bb990e5bd810e
https://doi.org/10.1109/ets48528.2020.9131600