المؤلفون: Kamal, Surya, Hailstone, Richard K.

مصطلحات موضوعية: Condensed Matter - Materials Science, Physics - Instrumentation and Detectors, Physics - Optics

URL الوصول: http://arxiv.org/abs/2407.01439

المؤلفون: Kamal, Surya, Prajapati, Harshkumar S, Cahill, Nathan D, Hailstone, Richard K

المصدر: Microscopy and Microanalysis ; volume 29, issue Supplement_1, page 739-740 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1093/micmic/ozad067.364
https://academic.oup.com/mam/article-pdf/29/Supplement_1/739/50933101/ozad067.364.pdf

المؤلفون: Kamal, Surya, Hailstone, Richard K

المصدر: Microscopy and Microanalysis ; volume 29, issue Supplement_1, page 487-488 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1093/micmic/ozad067.231
https://academic.oup.com/mam/article-pdf/29/Supplement_1/487/50931784/ozad067.231.pdf

المؤلفون: Kamal, Surya, Hailstone, Richard K

المصدر: Microscopy and Microanalysis ; volume 29, issue Supplement_1, page 454-455 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1093/micmic/ozad067.213
https://academic.oup.com/mam/article-pdf/29/Supplement_1/454/50932318/ozad067.213.pdf

المؤلفون: Kamal, Surya, Hailstone, Richard K

المصدر: Microscopy and Microanalysis ; volume 29, issue Supplement_1, page 491-492 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1093/micmic/ozad067.233
https://academic.oup.com/mam/article-pdf/29/Supplement_1/491/50932540/ozad067.233.pdf

المؤلفون: Kamal, Surya, Hailstone, Richard K

المصدر: Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p

المؤلفون: Kamal, Surya, Hailstone, Richard K.

المساهمون: Shahriar, Selim M., Scheuer, Jacob

المصدر: Quantum Sensing, Imaging, and Precision Metrology

الاتاحة: http://dx.doi.org/10.1117/12.2647634

المؤلفون: Leggiero, Anthony P., Driess, Shannon D., Loughran, Erin D., McIntyre, Dylan J., Hailstone, Richard K., Cress, Cory D., Puchades, Ivan, Landi, Brian J.

المساهمون: Advanced Manufacturing Office, Office of Energy Efficiency and Renewable Energy, U.S. Department of Energy

المصدر: Carbon ; volume 168, page 290-301 ; ISSN 0008-6223

الاتاحة: http://dx.doi.org/10.1016/j.carbon.2020.07.009
https://api.elsevier.com/content/article/PII:S0008622320306692?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0008622320306692?httpAccept=text/plain

المؤلفون: Nevins, Mandy C., Quoi, Kathryn, Hailstone, Richard K., Lifshin, Eric

المصدر: Microscopy and Microanalysis ; volume 25, issue 05, page 1167-1182 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927619014806
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619014806

المؤلفون: Nevins, Mandy C., Hailstone, Richard K., Lifshin, Eric

المصدر: Microscopy and Microanalysis ; volume 25, issue 05, page 1183-1194 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927619014831
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619014831

المؤلفون: Alharbi, Najat A., Hailstone, Richard K., Varela, Benjamin

المصدر: Microscopy and Microanalysis ; volume 24, issue S1, page 788-789 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927618004439
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927618004439

المؤلفون: Lifshin, Eric, Zotta, Matthew D., Hailstone, Richard K., Nevins, Mandy C.

المصدر: Microscopy and Microanalysis ; volume 24, issue S1, page 600-601 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927618003495
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927618003495

المؤلفون: Nevins, Mandy C., Zotta, Matthew D., Hailstone, Richard K., Lifshin, Eric

المصدر: Microscopy and Microanalysis ; volume 24, issue S1, page 604-605 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927618003513
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927618003513

المؤلفون: Alharbi, Najat A., Hailstone, Richard K., Varela, Benjamin

المصدر: Microscopy and Microanalysis ; volume 23, issue S1, page 1094-1095 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927617006134
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927617006134

المؤلفون: Nevins, Mandy C., Hailstone, Richard K., Zotta, Matthew D., Lifshin, Eric

المصدر: Microscopy and Microanalysis ; volume 23, issue S1, page 126-127 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927617001313
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927617001313

المؤلفون: Kamal, Surya, Hailstone, Richard K.

المصدر: Microscopy and Microanalysis ; volume 28, issue 2, page 441-453 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927622000198
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927622000198

المؤلفون: Scheuer, Jacob, Shahriar, Selim M., Kamal, Surya, Hailstone, Richard K.

المصدر: Proceedings of SPIE; March 2023, Vol. 12447 Issue: 1 p124470R-124470R-6, 1120237p