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1Academic Journal
المؤلفون: H. FUKUTOME, Y. SHIMOI, 下位 幸弘, 福留 秀雄
المصدر: Meeting Abstracts of the Physical Society of Japan. 1991, :326
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2Academic Journal
المؤلفون: H. Fukutome, N. Tomita, 富田 憲一, 福留 秀雄
المصدر: Meeting Abstracts of the Physical Society of Japan. 1991, :326
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3Academic Journal
المصدر: Meeting Abstracts of the Physical Society of Japan. 1993, :347
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4Academic Journal
المؤلفون: A. Ikawa, A. Yamashiro, H. Fukutome, 井川 淳, 山城 敦, 福留 秀雄
المصدر: Meeting Abstracts of the Physical Society of Japan. 1993, :338
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5Academic Journal
المؤلفون: A. Ikawa, H. Fukutome, 井川 淳志, 福留 秀雄
المصدر: Meeting Abstracts of the Physical Society of Japan. 1989, :162
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6Academic JournalTe,Se金属相のvector charge density waveモデルII / Vector charge density wave model of metallic Te and Se II
المؤلفون: H. FUKUTOME, Y. SHIMOI, 下位 幸弘, 福留 秀雄
المصدر: Meeting Abstracts of the Physical Society of Japan. 1990, :189
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7Academic Journal
المؤلفون: H. FUKUTOME, Y. SHIMOI, 下位 幸弘, 福留 秀雄
المصدر: Meeting Abstracts of the Physical Society of Japan. 1989, :165
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8Academic Journal
المصدر: Meeting Abstracts of the Physical Society of Japan. 1993, :485
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9Academic Journal
المؤلفون: A. Ikawa, H. Fukutome, H. Mizouchi, 井川 淳志, 溝内 秀男, 福留 秀雄
المصدر: Meeting Abstracts of the Physical Society of Japan. 1996, :407
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10Academic Journal
المؤلفون: A. Ikawa, A. Yamashiro, H. Fukutome, 井川 淳志, 山城 敦, 福留 秀雄
المصدر: Meeting Abstracts of the Physical Society of Japan. 1996, :407
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11Academic Journal
المؤلفون: A. Takahashi, H. Fukutome, 福留 秀雄, 高橋 聡
المصدر: Meeting Abstracts of the Physical Society of Japan. 1990, :317
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12Academic Journal
المؤلفون: A. Takahashi, H. Fukutome, S. Yamamoto, 山本 昌司, 福留 秀雄, 高橋 聡
المصدر: Meeting Abstracts of the Physical Society of Japan. 1990, :317
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13
المؤلفون: H. Fukutome, K. Suh, W. Kim, Y. Moriyama, S. Kang, B. Eom, J. Kim, C. Yoon, W. Kwon, Y. Chung, Y. Nam, Y. Kim, S. Park, J. Park, H. -J. Cho, K. Rim, S. D. Kwon
المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
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14
المؤلفون: H.-J. Cho, H.S. Oh, K.J. Nam, Y.H. Kim, K.H. Yeo, W.D. Kim, Y.S. Chung, Y.S. Nam, S.M. Kim, W.H. Kwon, M.J. Kang, I.R. Kim, H. Fukutome, C.W. Jeong, H.J. Shin, Y.S. Kim, D.W. Kim, S.H. Park, J.H. Jeong, S.B. Kim, D.W. Ha, J.H. Park, H.S. Rhee, S.J. Hyun, D.S. Shin, D.H. Kim, H.Y. Kim, S. Maeda, K.H. Lee, M.C. Kim, Y.S. Koh, B. Yoon, K. Shin, N.I. Lee, S.B. Kangh, K.H. Hwang, J.H. Lee, J.-H. Ku, S.W. Nam, S.M. Jung, H.K. Kang, J.S. Yoon, E.S. Jung
المصدر: 2016 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Contact resistance, Doping, Gate stack, Electrical engineering, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Fin (extended surface), Power (physics), 0103 physical sciences, Optoelectronics, Node (circuits), Static random-access memory, 0210 nano-technology, business
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15
المؤلفون: Masato Sone, Yutaka Shinoda, T. Misaki, H. Fukutome, Takashi Akatsu, N. Kobayashi, Fumihiro Wakai, Yuji Higo
المصدر: Acta Materialia. 60:507-516
مصطلحات موضوعية: Surface diffusion, Materials science, Polymers and Plastics, Misorientation, Metals and Alloys, Sintering, Mechanics, Electronic, Optical and Magnetic Materials, Grain growth, Ceramics and Composites, Effective diffusion coefficient, Grain boundary diffusion coefficient, Grain boundary, Grain boundary strengthening
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16
المؤلفون: Y. Momiyama, Y. Tagawa, H. Fukutome, Tomohiro Kubo, Takayuki Aoyama, Hiroshi Arimoto
المصدر: IEEE Transactions on Electron Devices. 53:2755-2763
مصطلحات موضوعية: Surface diffusion, Materials science, business.industry, Analytical chemistry, Surface finish, Line edge roughness, Electronic, Optical and Magnetic Materials, law.invention, Ion implantation, Nanoelectronics, law, MOSFET, Electrical performance, Optoelectronics, Electrical and Electronic Engineering, Scanning tunneling microscope, business
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17
المؤلفون: S. Satoh, M. Tajima, K. Hosaka, H. Fukutome, E. Yoshida, Y. Momiyama
المصدر: IEEE Electron Device Letters. 31:240-242
مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, High voltage, Drain-induced barrier lowering, Surface finish, Electronic, Optical and Magnetic Materials, law.invention, Threshold voltage, law, Electrode, MOSFET, Optoelectronics, Electrical and Electronic Engineering, business, Voltage
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18
المؤلفون: H. Ohta, K. Kawamura, Y. Uchino, T. Aoyama, H. Fukutome, K. Hosaka, S. Akiyama
المصدر: IEEE Electron Device Letters. 29:765-767
مصطلحات موضوعية: Materials science, business.industry, International Electron Devices Meeting, Transistor, Nanotechnology, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, chemistry, CMOS, law, Etching (microfabrication), Chemical-mechanical planarization, Logic gate, Silicide, Optoelectronics, Electrical and Electronic Engineering, business, Layer (electronics)
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19
المؤلفون: H. Fukutome, Hideo Mizouchi, A. Ikawa
المصدر: Journal of the American Chemical Society. 117:3260-3269
مصطلحات موضوعية: Electron transfer, Colloid and Surface Chemistry, Spins, Chemical physics, Chemistry, General Chemistry, Photochemistry, Biochemistry, Catalysis
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20
المؤلفون: H. Fukutome, Shigenobu Maeda, K. Cheon, S. D. Kwon, Jae Gon Lee, U. J. Roh, D. K. Sohn, Jongchol Kim, Seungwon Cha, Jong Pyo Kim
المصدر: 2012 International Electron Devices Meeting.
مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, Extensibility, Capacitance, Threshold voltage, law.invention, law, Low-power electronics, MOSFET, Optoelectronics, business, Metal gate, High-κ dielectric