نتائج البحث - "Guerre, F. X."

1

Academic Journal

Heavy-Ion Testing Method and Results of Normally OFF GaN-Based High-Electron-Mobility Transistor

المؤلفون: Sauveplane, Jean-Baptiste, Dufour, Arnaud, Marcault, Emmanuel, Orsatelli, Marc, Duran, G., Burky, J., Forgerit, B., Tilhac, F., Guerre, F.-X.

المساهمون: CNES under Research and Technology 2017 Program

المصدر: IEEE Transactions on Nuclear Science ; volume 68, issue 10, page 2488-2495 ; ISSN 0018-9499 1558-1578

الاتاحة: http://dx.doi.org/10.1109/tns.2021.3109990
http://xplorestaging.ieee.org/ielx7/23/9577237/09528357.pdf?arnumber=9528357

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2

Book

On line neutron dose evaluation in patients under radiotherapy

المصدر: IFMBE Proceedings ; World Congress on Medical Physics and Biomedical Engineering, September 7 - 12, 2009, Munich, Germany ; page 259-261 ; ISSN 1680-0737 1433-9277 ; ISBN 9783642034725 9783642034749

الاتاحة: http://dx.doi.org/10.1007/978-3-642-03474-9_74
http://link.springer.com/content/pdf/10.1007/978-3-642-03474-9_74

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3

Conference

Design, Testing and Calibration of a 'Reference SEU Monitor' System

المؤلفون: Harboe-Sorensen, R., Guerre, F.-X., Roseng, A.

المصدر: 2005 8th European Conference on Radiation and Its Effects on Components and Systems ; ISSN 0379-6566

الاتاحة: http://dx.doi.org/10.1109/radecs.2005.4365561
http://xplorestaging.ieee.org/ielx5/4365537/4365538/04365561.pdf?arnumber=4365561

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4

Academic Journal

Estimation of neutron-equivalent dose in organs of patients undergoing radiotherapy by the use of a novel online digital detector

المصدر: Physics in Medicine and Biology ; volume 57, issue 19, page 6167-6191 ; ISSN 0031-9155 1361-6560

الاتاحة: http://dx.doi.org/10.1088/0031-9155/57/19/6167

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5

Academic Journal

PROBA-II Technology Demonstration Module In-Flight Data Analysis

المؤلفون: Harboe-Sorensen, R., Poivey, C., Zadeh, A., Keating, A., Fleurinck, N., Puimege, K., Guerre, F.-X., Lochon, F., Kaddour, M., Li, L., Walter, D.

المصدر: IEEE Transactions on Nuclear Science ; volume 59, issue 4, page 1086-1091 ; ISSN 0018-9499 1558-1578

الاتاحة: http://dx.doi.org/10.1109/tns.2012.2185062
http://xplorestaging.ieee.org/ielx5/23/6268392/06153408.pdf?arnumber=6153408

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6

Academic Journal

The Technology Demonstration Module On-Board PROBA-II

المؤلفون: Harboe-Sorensen, R., Poivey, C., Fleurinck, N., Puimege, K., Zadeh, A., Guerre, F.-X., Lochon, F., Kaddour, M., Li, L., Walter, D., Keating, A., Jaksic, A., Poizat, M.

المصدر: IEEE Transactions on Nuclear Science ; volume 58, issue 3, page 1001-1007 ; ISSN 0018-9499 1558-1578

الاتاحة: http://dx.doi.org/10.1109/tns.2010.2095468
http://xplorestaging.ieee.org/ielx5/23/5875997/05677450.pdf?arnumber=5677450

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7

Proton and Heavy Ion induced SELs in the Xilinx XC95108 CPLD

المؤلفون: Wijnands, T J, Dubettier-Grenier, S, King, Q, Todd, B, Guerre, F X

مصطلحات موضوعية: Nuclear Theory, Nuclear Experiment, Accelerators and Storage Rings

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od________65::d963f743e7d6f6d0a832c04c0dfa2647
http://cds.cern.ch/record/1319603

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8

Academic Journal

From the Reference SEU Monitor to the Technology Demonstration Module On-Board PROBA-II

المؤلفون: Harboe-Sorensen, R., Poivey, C., Guerre, F. -X., Roseng, A., Lochon, F., Berger, Guy, Hajdas, W., Virtanen, A., Kettunen, H., Duzellier, S.

المساهمون: UCL

المصدر: IEEE Transactions on Nuclear Science, Vol. 55, no. 6, p. 3082-3087 (2008)

مصطلحات موضوعية: Facility calibration, radiation experiment, radiation testing, SEE characterization, SEL monitor, SEU monitor, single event effects (SEE), single event latch-up (SEL), single event upset (SEU), SRAM, test facilities, test sites

Relation: boreal:35848; http://hdl.handle.net/2078.1/35848; urn:ISSN:0018-9499; urn:EISSN:1558-1578

الاتاحة: http://hdl.handle.net/2078.1/35848
https://doi.org/10.1109/TNS.2008.2006896

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9

Electronic Resource

From the Reference SEU Monitor to the Technology Demonstration Module On-Board PROBA-II

المؤلفون: UCL, Harboe-Sorensen, R., Poivey, C., Guerre, F. -X., Roseng, A., Lochon, F., Berger, Guy, Hajdas, W., Virtanen, A., Kettunen, H., Duzellier, S.

المصدر: IEEE Transactions on Nuclear Science, Vol. 55, no. 6, p. 3082-3087 (2008)

مصطلحات الفهرس: Facility calibration, radiation experiment, radiation testing, SEE characterization, SEL monitor, SEU monitor, single event effects (SEE), single event latch-up (SEL), single event upset (SEU), SRAM, test facilities, test sites, info:eu-repo/semantics/article

URL: http://hdl.handle.net/2078.1/35848

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10

Conference

SRAMs SEL and SEU in-flight data from PROBA-II spacecraft.

المؤلفون: D'Alessio, M., Poivey, C., Ferlet-Cavrois, V., Evans, H., Harboe-Sorensen, R., Keating, A., Lopez-Calle, I., Guerre, F. X., Lochon, F., Santandrea, S., Zadeh, A., Muschitiello, M., Markgraf, M., Montenbruck, O., Grillenberger, A., Fleurinck, N., Puimege, K., Gerrits, D., Matthijs, P.

المصدر: 2013 14th European Conference on Radiation & Its Effects on Components & Systems (RADECS); 2013, p1-8, 8p

11

Conference

PROBA-II Technology Demonstration Module in-flight data analysis.

المؤلفون: Harboe-Sorensen, R., Poivey, C., Zadeh, A., Keating, A., Fleurinck, N., Puimege, K., Guerre, F.-X., Lochon, F., Kaddour, M., Li, L., Walter, D.

المصدر: 2011 12th European Conference on Radiation & Its Effects on Components & Systems; 1/ 1/2011, p581-586, 6p

12

Academic Journal

Heavy-Ion SEE Test Concept and Results for DDR-II Memories.

المؤلفون: Harboe-Sørensen, Reno¹ Reno.Harboe.Sorensen@esa.int, Guerre, F.-X.² FX.Guerre@hirex.fr, Lewis, G.² G.Lewis@Hirex.fr

المصدر: IEEE Transactions on Nuclear Science. Dec2007 Part 1 of 2, Vol. 54 Issue 6, p2125-2130. 6p. 5 Black and White Photographs, 1 Diagram, 3 Charts, 4 Graphs.

مصطلحات موضوعية: *RANDOM access memory, *COMPUTER storage devices, HEAVY ions, IONS, IRRADIATION, DYNAMIC random access memory