المؤلفون: Hohenegger, Andreas, Krummeck, Gerald, Baños, Janie, Ortega, Alvaro, Hager, Michal, Sterba, Jiri, Kertis, Tomaš, Prochazka, Jan, Novobilsky, Petr, Caracuel, Benito, Ramos, Francisco, Lourdes Sanz, Ana, Eschweiler, Dominik, Gries, Caspar, Blasum, Holger, Vögler, Torsten, Neškudla, Jan, Rollo, Jan, Burgstaller, Lisa, Truskaller, Martina, Koch, Klaus-Michael, Hametner, Reinhard, Rauscher, Sandro, Tummeltshammer, Peter, Golatowski, Frank, Schulz, Thorsten

المصدر: ICPS, 4th IEEE International Conference on Industrial Cyber-Physical Systems, 10-12 May 2021

مصطلحات موضوعية: MILS, cyberphysical systems, security certification, common criteria

Relation: https://doi.org/10.1109/ICPS49255.2021.9468241; https://zenodo.org/communities/certmils; https://zenodo.org/communities/eu; https://doi.org/10.5281/zenodo.4773135; https://doi.org/10.5281/zenodo.4773136; oai:zenodo.org:4773136

الاتاحة: https://doi.org/10.5281/zenodo.4773136

المؤلفون: Schulz, Thorsten, Gries, Caspar, Golatowski, Frank, Timmermann, Dirk

المصدر: SIES 2018, Graz, Austria, 5 - 8 June 2018

مصطلحات موضوعية: CPS, MILS, certified security assurance

Relation: https://zenodo.org/communities/certmils; https://zenodo.org/communities/eu; https://doi.org/10.1109/SIES.2018.8442081; oai:zenodo.org:1404622

الاتاحة: https://doi.org/10.1109/SIES.2018.8442081

المؤلفون: Braun, Bastian, Gries, Caspar, Petschkuhn, Benedikt, Posegga, Joachim

المساهمون: University of Passau, Nora Cuppens-Boulahia, Frédéric Cuppens, Sushil Jajodia, Anas Abou El Kalam, Thierry Sans, TC 11

المصدر: IFIP Advances in Information and Communication Technology ; 29th IFIP International Information Security Conference (SEC) ; https://hal.inria.fr/hal-01370372 ; 29th IFIP International Information Security Conference (SEC), Jun 2014, Marrakech, Morocco. pp.264-277, ⟨10.1007/978-3-642-55415-5_22⟩

مصطلحات موضوعية: [INFO]Computer Science [cs]

جغرافية الموضوع: Marrakech, Morocco

Relation: hal-01370372; https://hal.inria.fr/hal-01370372; https://hal.inria.fr/hal-01370372/document; https://hal.inria.fr/hal-01370372/file/978-3-642-55415-5_22_Chapter.pdf

الاتاحة: https://hal.inria.fr/hal-01370372
https://hal.inria.fr/hal-01370372/document
https://hal.inria.fr/hal-01370372/file/978-3-642-55415-5_22_Chapter.pdf
https://doi.org/10.1007/978-3-642-55415-5_22

المؤلفون: Schulz, Thorsten, Hohenegger, Andreas, Persson, Staffan, Ortega, Alvaro, Hametner, Reinhard, Paulitsch, Michael, Gries, Caspar, Tverdyshev, Sergey, Blasum, Holger, Tomáš, Kertis

مصطلحات موضوعية: security framework, security testing, analysis, fuzz-test methodology

Relation: https://zenodo.org/communities/mils; https://zenodo.org/communities/certmils; https://zenodo.org/communities/eu; https://doi.org/10.5281/zenodo.2586590; https://doi.org/10.5281/zenodo.2586591; oai:zenodo.org:2586591

الاتاحة: https://doi.org/10.5281/zenodo.2586591

المؤلفون: Azarmipour, Mahyar, Elfahaam, Haitham Ahmed, Gries, Caspar, Kleinert, Tobias Theodor, Epple, Ulrich

المصدر: Piscataway, NJ : IEEE 217-222 (2020). doi:10.1109/INDIN45582.2020.9442083 ; Proceedings : 2020 IEEE 18th International Conference on Industrial Informatics (INDIN) : Warwick, United Kingdom - Online, 21 - 23 July, 2020 / Organized by WMG, International Manufacturing Centre, University of Warwick, United Kingdom ; Sponsored by The Institute of Electrical and Electronics Engineers (IEEE), IEEE Industrial Electronics Society (IES) ; Sponsored by The Institute of Electrical and Electronics Engineers (IEEE), IEEE Industrial Electronics Society (IES) 18. IEEE International Conference on Industrial Informatics, INDIN, online, 2020-07-21 - 2020-07-23

جغرافية الموضوع: DE

Relation: info:eu-repo/semantics/altIdentifier/issn/2378-363X; info:eu-repo/semantics/altIdentifier/isbn/978-1-7281-4964-6; info:eu-repo/semantics/altIdentifier/issn/1935-4576; info:eu-repo/semantics/altIdentifier/wos/WOS:000907230200034; info:eu-repo/semantics/altIdentifier/isbn/978-1-7281-4963-9; info:eu-repo/semantics/altIdentifier/isbn/978-1-7281-4965-3; https://publications.rwth-aachen.de/record/804738; https://publications.rwth-aachen.de/search?p=id:%22RWTH-2020-10503%22

الاتاحة: https://publications.rwth-aachen.de/record/804738
https://publications.rwth-aachen.de/search?p=id:%22RWTH-2020-10503%22

المؤلفون: Azarmipour, Mahyar, von Trotha, Christian, Gries, Caspar, Kleinert, Tobias Theodor, Epple, Ulrich

المصدر: Piscataway, NJ : IEEE 53-58 (2020). doi:10.1109/IECON43393.2020.9254634 ; IECON 2020 - the 46th Annual Conference of the IEEE Industrial Electronics Society : online, Singapore, 19-21 October, 2020 : proceedings / organized by: Nangyang Technological University, Singapore ; sponsored by: the Institute of Electrical and Electronics Engineers (IEEE), IEEE Industrial Electronics Society (IES) ; co-sponsored by: SPECS - Smart Grid + Power Electronics Consortium Singapore ; general chairs: Changyun Wen (Singapore), Terry Martin (USA), Huijun Gao (China), Luis Gomes (Portugal) ; publication chairs: Xing Zhu (Singapore), Daswin de Silva (Australia) ; publication chairs: Xing Zhu (Singapore), Daswin de Silva (Australia) ....

جغرافية الموضوع: DE

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000637323700006; info:eu-repo/semantics/altIdentifier/isbn/978-1-72815-414-5; info:eu-repo/semantics/altIdentifier/isbn/978-1-72815-413-8; info:eu-repo/semantics/altIdentifier/issn/1553-572X; info:eu-repo/semantics/altIdentifier/isbn/978-1-72815-415-2; info:eu-repo/semantics/altIdentifier/issn/2577-1647; https://publications.rwth-aachen.de/record/804737; https://publications.rwth-aachen.de/search?p=id:%22RWTH-2020-10502%22

الاتاحة: https://publications.rwth-aachen.de/record/804737
https://publications.rwth-aachen.de/search?p=id:%22RWTH-2020-10502%22

المؤلفون: Azarmipour, Mahyar, Elfahaam, Haitham Ahmed, Gries, Caspar, Epple, Ulrich

المصدر: Piscataway, NJ : IEEE 5513-5518 (2019). doi:10.1109/IECON.2019.8927026 ; IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society : Convention Center, Lisbon, Portugal, 14-17 October, 2019 : proceedings / organized by Universidade Nova de Lisboa ; sponsored by IEEE, IEEE Industrial Electronics Society (IES) ; sponsored by IEEE, IEEE Industrial Electronics Society (IES) 45. Annual Conference of the IEEE Industrial Electronics Society, IECON 2019, Lisbon, Portugal, 2019-10-14 - 2019-10-17

جغرافية الموضوع: DE

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-7281-4878-6; info:eu-repo/semantics/altIdentifier/wos/WOS:000522050605082; info:eu-repo/semantics/altIdentifier/isbn/978-1-7281-4879-3; info:eu-repo/semantics/altIdentifier/issn/2577-1647; info:eu-repo/semantics/altIdentifier/issn/1553-572X; https://publications.rwth-aachen.de/record/770462; https://publications.rwth-aachen.de/search?p=id:%22RWTH-2019-09600%22

الاتاحة: https://publications.rwth-aachen.de/record/770462
https://publications.rwth-aachen.de/search?p=id:%22RWTH-2019-09600%22

المؤلفون: Azarmipour, Mahyar, von Trotha, Christian, Epple, Ulrich, Ansar, Zeeshan, Gries, Caspar

المصدر: atp Magazin 2020(5), 62-67 (2020).

مصطلحات موضوعية: info:eu-repo/classification/ddc/620

جغرافية الموضوع: DE

Relation: info:eu-repo/semantics/altIdentifier/issn/2364-3137; info:eu-repo/semantics/altIdentifier/issn/2190-4111; info:eu-repo/semantics/altIdentifier/issn/0178-2320; https://publications.rwth-aachen.de/record/791668; https://publications.rwth-aachen.de/search?p=id:%22RWTH-2020-05528%22

الاتاحة: https://publications.rwth-aachen.de/record/791668
https://publications.rwth-aachen.de/search?p=id:%22RWTH-2020-05528%22

المؤلفون: Azarmipour, Mahyar, Elfaham, Haitham, Grothoff, Julian, von Trotha, Christian, Gries, Caspar, Epple, Ulrich

المصدر: IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society

الاتاحة: http://dx.doi.org/10.1109/iecon.2018.8591622
http://xplorestaging.ieee.org/ielx7/8560606/8591058/08591622.pdf?arnumber=8591622

المؤلفون: Gries, Caspar

مصطلحات موضوعية: mixed-criticality, separation kernel, ComputerApplications_COMPUTERSINOTHERSYSTEMS, security, MILS, Hardware_CONTROLSTRUCTURESANDMICROPROGRAMMING

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::68b6f77c2e9f4475b197eaf43cc6bdb5

المؤلفون: Gries, Caspar

مصطلحات موضوعية: Electrical engineering

وصف الملف: application/pdf

الاتاحة: https://dx.doi.org/10.2314/kxp:1690472502
https://www.tib.eu/suchen/id/TIBKAT:1690472502/