المؤلفون: Iyenghar, Padma, Gracic, Emil, Pawelke, Gregor

المصدر: IEEE Access ; volume 12, page 179600-179627 ; ISSN 2169-3536

الاتاحة: https://doi.org/10.1109/access.2024.3506333
http://xplorestaging.ieee.org/ielx8/6287639/10380310/10767223.pdf?arnumber=10767223

المؤلفون: Gracić, Emil

المساهمون: Kassel, Universität Kassel, Fachbereich Elektrotechnik / Informatik, Börcsök, Josef (Prof. Dr.), Schepers, David (Prof. Dr.)

مصطلحات موضوعية: funktionale Sicherheit, FPGA, On-Chip-Redundanz, SIL2, thermodynamische Analyse, functional safety, PFGA, On-Chip-Redundancy, thermodynamical analysis, ddc:004, swd:Funktionssicherheit, swd:Thermodynamik, swd:Analyse, swd:Field programmable gate array

Relation: http://doi.org/doi:10.17170/kobra-202008101548

الاتاحة: https://doi.org/10.17170/kobra-202008101548

المؤلفون: Gracic, Emil, Hayek, Ali, Borcsok, Josef

المصدر: 2017 2nd International Conference on System Reliability and Safety (ICSRS) ; page 386-390

الاتاحة: http://dx.doi.org/10.1109/icsrs.2017.8272853
http://xplorestaging.ieee.org/ielx7/8264984/8272780/08272853.pdf?arnumber=8272853

المؤلفون: Gracic, Emil, Hayek, Ali, Borcsok, Josef

المصدر: 2014 X International Symposium on Telecommunications (BIHTEL) ; page 1-6

الاتاحة: http://dx.doi.org/10.1109/bihtel.2014.6987642
http://xplorestaging.ieee.org/ielx7/6971977/6987620/06987642.pdf?arnumber=6987642