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1Academic Journal
المؤلفون: Atsushi OHBUCHI, Go FUJINAWA, Kiyoshi NOMURA, Kotaro OCHI, Takayuki KONYA, Toshihiro NAKAMURA, Yasujiro YAMADA, Yuya KOIKE, 中村 利廣, 大渕 敦司, 小池 裕也, 山田 康治郎, 紺谷 貴之, 藤縄 剛, 越智 康太郎, 野村 貴美
المصدر: X線分析の進歩 / Advances in X-Ray Chemical Analysis, Japan. 2016, 47:225
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2Academic Journal
المؤلفون: Atsushi OHBUCHI, Go FUJINAWA, Takayuki KONYA, 大渕 敦司, 紺谷 貴之, 藤縄 剛
المصدر: X線分析の進歩 / Advances in X-Ray Chemical Analysis, Japan. 2015, 46:245
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3Academic Journal
المؤلفون: Atsuko OONO, Go FUJINAWA, Takayuki KONYA, Tetsuya OZAWA, Toshihiro NAKAMURA, 中村 利廣, 大野 敦子, 小澤 哲也, 紺谷 貴之, 藤縄 剛
المصدر: 分析化学 / BUNSEKI KAGAKU. 2006, 55(6):397
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4Academic Journal
المؤلفون: Go FUJINAWA, Kenichi NAKAYAMA, Shinji KOBAYASHI, Takayuki KONYA, Tomoharu ASAHI, Toshihiro NAKAMURA
المصدر: Analytical Sciences. 2011, 27(12):1217
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5
المؤلفون: Go Fujinawa, Takayuki Konya, Atsushi Ohbuchi
المصدر: Powder Diffraction. 28:249-253
مصطلحات موضوعية: Diffraction, Radiation, Materials science, Silicon, Scattering, business.industry, Detector, chemistry.chemical_element, Mineralogy, Radius, Condensed Matter Physics, Optics, chemistry, Goniometer, General Materials Science, business, Instrumentation, Intensity (heat transfer), Diffractometer
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6
المؤلفون: Toru Mitsunaga, Mari Saigo, Go Fujinawa
المصدر: Powder Diffraction. 17:173-177
مصطلحات موضوعية: Diffraction, Spectrum analyzer, Phase transition, Radiation, Materials science, business.industry, X-ray, Analytical chemistry, Condensed Matter Physics, Thermal expansion, symbols.namesake, Optics, Lattice (order), symbols, General Materials Science, business, Instrumentation, Electron backscatter diffraction, Debye
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7
المؤلفون: J.-L. Staudenmann, Hideo Toraya, Go Fujinawa
المصدر: Journal of Applied Crystallography. 32:1145-1151
مصطلحات موضوعية: Diffraction, Materials science, business.industry, chemistry.chemical_element, Radiation, engineering.material, Tungsten, General Biochemistry, Genetics and Molecular Biology, Collimated light, Optics, chemistry, engineering, Beryllium, Composite material, Bronze, Thin film, business, FOIL method
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8
المؤلفون: Go Fujinawa, Shogo Tobe
المصدر: Advances in X-ray Analysis. 35:197-203
مصطلحات موضوعية: Materials science, chemistry.chemical_element, General Medicine, Durability, Titanium nitride, chemistry.chemical_compound, Lattice constant, chemistry, Molybdenum, Residual stress, Crystallite, Composite material, Thin film, Thermal spraying
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9
المؤلفون: Aya Takase, Atsushi Ebina, Ikuto Sugiyama, Masao Hirasaka, Go Fujinawa
المصدر: Japanese Journal of Applied Physics. 41:2189-2190
مصطلحات موضوعية: Diffraction, Materials science, Physics and Astronomy (miscellaneous), Resolution (electron density), General Engineering, Analytical chemistry, Physics::Optics, General Physics and Astronomy, Crystal structure, GeSbTe, Condensed Matter::Materials Science, chemistry.chemical_compound, Crystallography, Lattice constant, chemistry, Condensed Matter::Superconductivity, X-ray crystallography, sense organs, Crystallite, Thin film
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10
المؤلفون: Miki Suetake, Yoshihiko Kobayashi, Toru Mitsunaga, Jimpei Harada, Kichizo Asai, Tadashi Arii, Go Fujinawa
المصدر: Journal of the Physical Society of Japan. 69:3468-3469
مصطلحات موضوعية: Diffraction, Crystal, Phase transition, Materials science, Powder Diffractometer, Differential thermal analysis, Neutron diffraction, Analytical chemistry, General Physics and Astronomy, Single crystal, Powder diffraction
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11
المؤلفون: Atsushi Ebina, Jun Isemoto, Go Fujinawa, Masao Hirasaka, Ikuto Sugiyama, Aya Takase
المصدر: Japanese Journal of Applied Physics. 40:1569
مصطلحات موضوعية: Diffraction, Materials science, business.industry, Diffusion, General Engineering, General Physics and Astronomy, Adhesion, GeSbTe, Contact angle, chemistry.chemical_compound, Optics, chemistry, Transmission electron microscopy, Optical recording, Optoelectronics, business, Layer (electronics)