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1Dissertation/ Thesis
المؤلفون: Giaffreda, Daniele <1981>
Thesis Advisors: Fiegna, Claudio, Metra, Cecilia
مصطلحات موضوعية: ING-INF/01 Elettronica
وصف الملف: application/pdf
الاتاحة: http://amsdottorato.unibo.it/5717/
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2
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3Academic Journal
المساهمون: Rossi, Daniele, Omana, Martin, Giaffreda, Daniele, Metra, Cecilia
مصطلحات موضوعية: Energy efficiency, hotspot, photovoltaic systems, reliability
وصف الملف: STAMPA
Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000355218000004; volume:23; issue:6; firstpage:1031; lastpage:1039; numberofpages:9; journal:IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS; http://hdl.handle.net/11585/518667; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85027921212
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4Conference
المؤلفون: Barbato M., Meneghini M., Giliberto V., Meneghesso G., GIAFFREDA, DANIELE, MAGNONE, PAOLO, DE ROSE, RAFFAELE, FIEGNA, CLAUDIO
المساهمون: Barbato M., Meneghini M., Giliberto V., Giaffreda D., Magnone P., De Rose R., Fiegna C., Meneghesso G.
مصطلحات موضوعية: LED SOLAR SIMULATOR, DARK I-V CHARACTERIZATION, MC-SI SOLAR CELL, MODELING, THERMOGRAPHIC PULSED CHARACTERIZATION
وصف الملف: STAMPA
Relation: info:eu-repo/semantics/altIdentifier/isbn/9781467300643; info:eu-repo/semantics/altIdentifier/wos/WOS:000309917801121; ispartofbook:Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE; Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE; firstpage:1241; lastpage:1245; numberofpages:5; http://hdl.handle.net/11585/131902; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84869412383
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5ConferenceA Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells
المؤلفون: GIAFFREDA, DANIELE, MAGNONE, PAOLO, DE ROSE, RAFFAELE, SANGIORGI, ENRICO, FIEGNA, CLAUDIO, M. Barbato, M. Meneghini, V. Giliberto, G. Meneghesso
المساهمون: D. Giaffreda, P. Magnone, R. De Rose, M. Barbato, M. Meneghini, V. Giliberto, G. Meneghesso, E. Sangiorgi, C. Fiegna
مصطلحات موضوعية: DEFECTS, SHUNT, SIMULATION, SOLAR CELL, DISTRIBUTED ELECTRICAL NETWORK
وصف الملف: STAMPA
Relation: info:eu-repo/semantics/altIdentifier/isbn/3936338280; ispartofbook:27th European Photovoltaic Solar Energy Conference and Exhibition; 27th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC); firstpage:1453; lastpage:1456; numberofpages:4; http://hdl.handle.net/11585/131897
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6Conference
المؤلفون: Giaffreda, Daniele, Omana, Martin, Rossi, Daniele, Metra, Cecilia
وصف الملف: text
Relation: https://eprints.soton.ac.uk/368914/1/dft_2011_HS.pdf; Giaffreda, Daniele, Omana, Martin, Rossi, Daniele and Metra, Cecilia (2011) Model for thermal behavior of shaded PV cells under hot-spot condition. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Vancouver, Canada. 03 - 05 Oct 2011. pp. 252-258 . (doi:10.1109/DFT.2011.47 ).
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7Conference
المؤلفون: Rossi, Daniele, Omana, Martin, Giaffreda, Daniele, Metra, Cecilia
وصف الملف: text
Relation: https://eprints.soton.ac.uk/368911/1/ewdts10.pdf; Rossi, Daniele, Omana, Martin, Giaffreda, Daniele and Metra, Cecilia (2010) Secure communication protocol for wireless sensor networks. 8th IEEE East-West Design & Test Symposium (EWDTS), St. Petersburg, Russian Federation. 17 - 20 Sep 2010. pp. 17-20 . (doi:10.1109/EWDTS.2010.5742155 ).
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8Conference
المؤلفون: OMANA, MARTIN EUGENIO, GIAFFREDA, DANIELE, METRA, CECILIA, TM Mak, S. Tam, A. Rahman
المساهمون: M. Omaña, D. Giaffreda, C. Metra, TM Mak, S. Tam, A. Rahman
وصف الملف: STAMPA
Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000409548800034; ispartofbook:Proceedings of The 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems; The 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems; firstpage:265; lastpage:272; numberofpages:8; http://hdl.handle.net/11585/99017; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-79952035135
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9Academic Journal
المصدر: IEEE Journal of Photovoltaics ; volume 5, issue 2, page 552-558 ; ISSN 2156-3381 2156-3403
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10Academic Journal
المؤلفون: Rossi, Daniele, Omana, Martin, Giaffreda, Daniele, Metra, Cecilia
وصف الملف: text
Relation: https://eprints.soton.ac.uk/368664/1/tvlsi14-hotspot.pdf; Rossi, Daniele, Omana, Martin, Giaffreda, Daniele and Metra, Cecilia (2014) Modeling and detection of hot-spot in shaded photovoltaic cells. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1-9. (doi:10.1109/TVLSI.2014.2333064 ).
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11Academic Journal
المؤلفون: Omana, Martin, Rossi, Daniele, Giaffreda, Daniele, Metra, Cecilia, Mak, T.M., Raman, Asifur, Tam, Simon
وصف الملف: text
Relation: https://eprints.soton.ac.uk/368663/1/tvlsi14-jitter.pdf; Omana, Martin, Rossi, Daniele, Giaffreda, Daniele, Metra, Cecilia, Mak, T.M., Raman, Asifur and Tam, Simon (2014) Low-cost on-chip clock jitter measurement scheme. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1-9. (doi:10.1109/TVLSI.2014.2312431 ).
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12Academic Journal
المؤلفون: GIAFFREDA, DANIELE, MAGNONE, PAOLO, SANGIORGI, ENRICO, FIEGNA, CLAUDIO, Matteo Meneghini, Marco Barbato, Gaudenzio Meneghesso, Enrico Zanoni
المساهمون: Daniele Giaffreda, Paolo Magnone, Matteo Meneghini, Marco Barbato, Gaudenzio Meneghesso, Enrico Zanoni, Enrico Sangiorgi, Claudio Fiegna
مصطلحات موضوعية: Distributed model, defect, hot spot, photovoltaic (PV), shunt, simulation, solar cell, thermal simulation
وصف الملف: STAMPA
Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000329038800007; volume:4; issue:1; firstpage:40; lastpage:47; numberofpages:8; journal:IEEE JOURNAL OF PHOTOVOLTAICS; http://hdl.handle.net/11585/281914; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84891557199
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13Academic Journal
المؤلفون: Omana, Martin, Rossi, Daniele, Giaffreda, Daniele, Specchia, Roberto, Metra, Cecilia, Marzencki, Marcin, Kaminska, Bozena
وصف الملف: text
Relation: https://eprints.soton.ac.uk/368666/1/tvlsi13.pdf; Omana, Martin, Rossi, Daniele, Giaffreda, Daniele, Specchia, Roberto, Metra, Cecilia, Marzencki, Marcin and Kaminska, Bozena (2013) Faults affecting energy harvesting circuits of self-powered wireless sensors and their possible concurrent detection. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 21 (12), 2286-2294. (doi:10.1109/TVLSI.2012.2230036 ).
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14Academic Journal
المؤلفون: OMANA, MARTIN EUGENIO, ROSSI, DANIELE, GIAFFREDA, DANIELE, METRA, CECILIA, Specchia R., Marzencki M., Kaminska B.
المساهمون: Omaña M., Rossi D., Giaffreda D., Specchia R., Metra C., Marzencki M., Kaminska B.
مصطلحات موضوعية: ENERGY HARVESTING, FAULT TOLERANCE, high reliability, self-powered sensors
وصف الملف: STAMPA
Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000326107500011; volume:21; issue:12; firstpage:2286; lastpage:2294; numberofpages:9; journal:IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS; http://hdl.handle.net/11585/134654; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84886718554
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15Electronic Resource
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16Academic Journal
المؤلفون: Omana, Martin, Rossi, Daniele, Giaffreda, Daniele, Metra, Cecilia, Mak, T. M., Rahman, Asifur, Tam, Simon
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Mar2015, Vol. 23 Issue 3, p435-443, 9p
مصطلحات موضوعية: MICROPROCESSORS, DEBUGGING, POWER resources, ELECTRIC noise, TIMING jitter measurement, ELECTRIC power consumption
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17
المؤلفون: Cecilia Metra, Daniele Giaffreda, Daniele Rossi, Martin Omana
المساهمون: Rossi, Daniele, Omana, Martin, Giaffreda, Daniele, Metra, Cecilia
مصطلحات موضوعية: Engineering, business.industry, photovoltaic (PV) systems, Voltage control, Photovoltaic system, Reliability, Energy efficiency, hotspot, photovoltaic systems, reliability, Energy efficiency, Hardware and Architecture, Hotspot (geology), Electronic engineering, hotspot, Electrical and Electronic Engineering, business, Electrical efficiency, Software, Efficient energy use
وصف الملف: text; STAMPA