المؤلفون: Hsiao-Hsuan Liu, Shairfe M. Salahuddin, Boon Teik Chan, Pieter Schuddinck, Yang Xiang, Geert Hellings, Pieter Weckx, Julien Ryckaert, Francky Catthoor

المصدر: IEEE Transactions on Electron Devices. 70:883-890

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f1362dec8358a99a5a8f729c88739a9f
https://doi.org/10.1109/ted.2023.3235701

المؤلفون: Sybren Santermans (10035460), Franz Schanovsky (10035463), Mihir Gupta (10035466), Geert Hellings (10035469), Marc Heyns (1435552), Willem Van Roy (10035472), Koen Martens (153653)

مصطلحات موضوعية: Biophysics, Cell Biology, Biotechnology, Space Science, Environmental Sciences not elsewhere classified, Biological Sciences not elsewhere classified, Chemical Sciences not elsewhere classified, Physical Sciences not elsewhere classified, nonlinear screening, 1.5 mM PBS, pH interference effect, Pre-existing surface charges, sensitivity, pH-sensitive surface groups, pH interference mechanism, pH interference contributions, DNA signal increases, Field-Effect Transistor Molecular S., liquid-gated field-effect transistor, TCAD, Debye, silicon FET sensors, model

Relation: https://figshare.com/articles/journal_contribution/The_Significance_of_Nonlinear_Screening_and_the_pH_Interference_Mechanism_in_Field-Effect_Transistor_Molecular_Sensors/13643977

الاتاحة: https://doi.org/10.1021/acssensors.0c02285.s001

المؤلفون: Sybren Santermans, Geert Hellings, Marc Heyns, Willem Van Roy, Koen Martens

المصدر: Nanoscale. 15:2354-2368

مصطلحات موضوعية: General Materials Science

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::937c2b40ad673649e72922a2e02a4f9b
https://doi.org/10.1039/d2nr05267a

المؤلفون: Dawit Burusie Abdi, Shairfe M. Salahuddin, Juergen Boemmels, Edouard Giacomin, Pieter Weckx, Julien Ryckaert, Geert Hellings, Francky Catthoor

المصدر: IEEE Transactions on Circuits and Systems I: Regular Papers. :1-10

مصطلحات موضوعية: Hardware and Architecture, Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2b9f38705635caeac08946ff3358465a
https://doi.org/10.1109/tcsi.2023.3272658

المؤلفون: Giuliano Sisto, Odysseas Zografos, Bilal Chehab, Naveen Kakarla, Yang Xiang, Dragomir Milojevic, Pieter Weckx, Geert Hellings, Julien Ryckaert

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 30:1497-1506

مصطلحات موضوعية: Hardware and Architecture, Electrical and Electronic Engineering, Software

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d631190da7edac2f66fd109d7c170df0
https://doi.org/10.1109/tvlsi.2022.3190080

المؤلفون: S. S. Teja Nibhanupudi, Divya Prasad, Shidhartha Das, Odysseas Zografos, Alex Robinson, Anshul Gupta, Alessio Spessot, Peter Debacker, Diederik Verkest, Julien Ryckaert, Geert Hellings, James Myers, Brian Cline, Jaydeep P. Kulkarni

المصدر: IEEE Transactions on Electron Devices. 69:4453-4459

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3ce4f049a68c97db20fe30a94e14c916
https://doi.org/10.1109/ted.2022.3186657

المؤلفون: Gioele Mirabelli, Anne Vandooren, Cesar Roda Neve, Victor Vega Gonzalez, Hans Mertens, Anita Farokhnejad, Pieter Schuddinck, Gayle Murdoch, Shairfe Muhammad Salahuddin, Odysseas Zografos, Lars Ragnarsson, Pieter Weckx, Zsolt Tokei, Geert Hellings, Julien Ryckaert

المصدر: DTCO and Computational Patterning II.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e71062f4e385f63c97b6615098f3e10f
https://doi.org/10.1117/12.2656456

المؤلفون: Gioele Mirabelli, Pieter Schuddinck, Hsiao-Hsuan Liu, Sheng Yang, Odysseas Zografos, Shairfe Muhammad Salahuddin, Pieter Weckx, Gaspard Hiblot, Geert Hellings, Julien Ryckaert

المصدر: DTCO and Computational Patterning II.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b3aaa259089707d2181ea1c67f43ebf6
https://doi.org/10.1117/12.2657726

المؤلفون: Giuliano Sisto, Odysseas Zografos, Pieter Weckx, Geert Hellings, Julien Ryckaert

المصدر: DTCO and Computational Patterning II.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::39582804a76952d9e78aef391209f9a6
https://doi.org/10.1117/12.2656337

المؤلفون: Hsiao-Hsuan Liu, Shairfe Muhammad . Salahuddin, Boon Teik Chan, Pieter Schuddinck, Yang Xiang, Pieter Weckx, Geert Hellings, Francky Catthoor

المصدر: DTCO and Computational Patterning II.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b0e33bf390a9fc13eebf88170155ec39
https://doi.org/10.1117/12.2657524

المؤلفون: Michiel Vandemaele, Ben Kaczer, Erik Bury, Jacopo Franco, Adrian Chasin, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6e9e103b75b87d8398d643fd14ea1061
https://doi.org/10.1109/irps48203.2023.10118211

المؤلفون: Gautam Gaddemane, Krishna K. Bhuwalka, Philippe Matagne, Gerhard Rzepa, Maarten Van de Put, Sybren Santermans, Oskar Baumgartner, Hao Wu, Geert Hellings

المصدر: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1d066442f1626bf897b938ed1cb26041
https://doi.org/10.1109/essderc55479.2022.9947139

المؤلفون: Wen-Chieh Chen, Shih-Hung Chen, Thomas Chiarella, Geert Hellings, Dimitri Linten, Guido Groeseneken

مصطلحات موضوعية: Technology, Bulk FinFET, electrostatic discharge (ESD), Science & Technology, transmission line pulse (TLP), DEVICES, power-rail ESD clamp, Physics, Engineering, Electrical & Electronic, PERFORMANCE, Electronic, Optical and Magnetic Materials, Physics, Applied, Engineering, DESIGN, CLAMP, Physical Sciences, very-fast transmission line pulse (vfTLP), grounded-gate NMOS (ggNMOS), Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::baf47d95bc0066be1470d30ad0a7478f
https://lirias.kuleuven.be/handle/20.500.12942/719378

المؤلفون: Mihir Gupta, Liesbet Lagae, Willem Van Roy, Koen Martens, Geert Hellings, Sybren Santermans

المصدر: IEEE Sensors Journal. 21:4143-4151

مصطلحات موضوعية: Analyte, Materials science, 010401 analytical chemistry, 01 natural sciences, Molecular physics, 0104 chemical sciences, Ion, Zeta potential, Field-effect transistor, Surface charge, Electric potential, Electrical and Electronic Engineering, Surface plasmon resonance, Instrumentation, Biosensor

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::59d87fd6bc992fd967630a3720564b7f
https://doi.org/10.1109/jsen.2020.3031469

المؤلفون: M. H. Na, Doyoung Jang, Geert Hellings, F. M. Bufler, Alessio Spessot, Geert Eneman, Philippe Matagne

المصدر: IEEE Transactions on Electron Devices. 67:4701-4704

مصطلحات موضوعية: 010302 applied physics, Materials science, Access resistance, Silicon, business.industry, Doping, Monte Carlo method, chemistry.chemical_element, 01 natural sciences, Electronic, Optical and Magnetic Materials, Ion, Stress (mechanics), chemistry, Logic gate, 0103 physical sciences, Optoelectronics, Electrical and Electronic Engineering, Device simulation, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6fe7378d174e6c678b8d138deef136b2
https://doi.org/10.1109/ted.2020.3024267

المؤلفون: Geert Hellings, Sybren Santermans, Mihir Gupta, Liesbet Lagae, Rita Vos, Willem Van Roy, Bert Du Bois, Koen Martens, Simone Severi

المصدر: IEEE Sensors Journal. 20:8956-8964

مصطلحات موضوعية: Materials science, business.industry, 010401 analytical chemistry, Transistor, Charge density, 01 natural sciences, 0104 chemical sciences, law.invention, Transducer, CMOS, law, Optoelectronics, Field-effect transistor, Area density, Sensitivity (control systems), Electrical and Electronic Engineering, business, Instrumentation, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e045ab27076b19cf3c287e4cc77a891b
https://doi.org/10.1109/jsen.2020.2987627

المؤلفون: Geert Hellings, Alessio Spessot, Jane Wang, R. H. Kim, Gioele Mirabelli, Darko Trivkovic, Julien Ryckaert, Kurt G. Ronse, Pieter Weckx

المصدر: International Conference on Extreme Ultraviolet Lithography 2021.

مصطلحات موضوعية: Physical limitations, Computer science, Extreme ultraviolet lithography, Perspective (graphical), Process integration, New materials, Node (circuits), Cost of ownership, High volume manufacturing, Reliability engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6a619aaceeba9d741c3579eb4fd84367
https://doi.org/10.1117/12.2600804

المؤلفون: Shih-Hung Chen, Gaspard Hiblot, Kateryna Serbulova, Geert Hellings

المصدر: 2021 International Semiconductor Conference (CAS).

مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, business.industry, Semiconductor device modeling, Hardware_PERFORMANCEANDRELIABILITY, Substrate (electronics), Wafer thinning, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Wafer, Transient (oscillation), Sensitivity (control systems), Resilience (materials science), business, Hardware_LOGICDESIGN, Loop gain

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7b20492f19e8f65fa009abc3d9d11dac
https://doi.org/10.1109/cas52836.2021.9604133

المؤلفون: Geert Hellings, Krishna K. Bhuwalka, Julien Ryckaert, Bjorn Vermeersch, Hao Wu, Philippe Matagne, Amita Rawat, Changze Liu

المصدر: ESSCIRC

مصطلحات موضوعية: Stress (mechanics), Reduction (complexity), Parasitic capacitance, Computer science, Logic gate, Benchmark (computing), Field-effect transistor, Nanosheet, Reliability engineering, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::052202e5894171f3b917a37d9176d3c7
https://doi.org/10.1109/esscirc53450.2021.9567879

المؤلفون: Anabela Veloso, Geert Hellings, Koen Martens, Sybren Santermans, Mihir Gupta, Zheng Tao, Liesbet Lagae, Willem Van Roy, W. Li

المصدر: IEEE Sensors Journal. 19:6578-6586

مصطلحات موضوعية: Materials science, business.industry, 010401 analytical chemistry, Electrolyte, 01 natural sciences, 0104 chemical sciences, Fin (extended surface), Ion, Resist, CMOS, Electrode, Optoelectronics, Field-effect transistor, Electrical and Electronic Engineering, business, Instrumentation, Sensitivity (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a06ea47cc2b6672d1022389c0d5fa163
https://doi.org/10.1109/jsen.2019.2912503