المؤلفون: Gebreselasie, E.G., Voldman, S. H., He, Z. X., Coolbaugh, D., Rassel, R. M., Kirihata, T., Paganini, A., Cox, C.G., Mongeon, S.A., Onge, S.A. St., Dunn, J.S., Halbach, R. E., Lukaitis, J.M.

المصدر: 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting ; page 238-241 ; ISSN 1088-9299

الاتاحة: http://dx.doi.org/10.1109/bipol.2007.4351878
http://xplorestaging.ieee.org/ielx5/4351813/4351814/04351878.pdf?arnumber=4351878

المؤلفون: Iben, I.E.T., Gebreselasie, E.G., Loiseau, A., Gauthier, R.

المصدر: 2011 33rd NO POD PERMISSION Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD); 2011, p1-11, 11p

المؤلفون: Voldman, S.H., Gebreselasie, E.G.

المصدر: 2005 Electrical Overstress/Electrostatic Discharge Symposium; 2005, p1-10, 10p

المؤلفون: Voldman, S.H., Gebreselasie, E.G.

المصدر: 2004 Electrical Overstress/Electrostatic Discharge Symposium; 2004, p1-10, 10p

المؤلفون: Voldman, S.H., Gebreselasie, E.G., Zhong-Xiang He

المصدر: 2007 IEEE International Reliability Physics Symposium Proceedings 45th Annual; 2007, p586-587, 2p