يعرض 1 - 11 نتائج من 11 نتيجة بحث عن '"Garrity, K. F."', وقت الاستعلام: 0.43s تنقيح النتائج
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    Report
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    Academic Journal
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    Academic Journal
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    Academic Journal

    المساهمون: Lejaeghere, K., Bihlmayer, G., Bjorkman, T., Blaha, P., Blugel, S., Blum, V., Caliste, D., Castelli, I. E., Clark, S. J., Dal Corso, A., De Gironcoli, S., Deutsch, T., Dewhurst, J. K., Di Marco, I., Draxl, C., Dulak, M., Eriksson, O., Flores-Livas, J. A., Garrity, K. F., Genovese, L., Giannozzi, P., Giantomassi, M., Goedecker, S., Gonze, X., Granas, O., Gross, E. K. U., Gulans, A., Gygi, F., Hamann, D. R., Hasnip, P. J., Holzwarth, N. A. W., Iusan, D., Jochym, D. B., Jollet, F., Jones, D., Kresse, G., Koepernik, K., Kucukbenli, E., Kvashnin, Y. O., Locht, I. L. M., Lubeck, S., Marsman, M., Marzari, N., Nitzsche, U., Nordstrom, L., Ozaki, T., Paulatto, L., Pickard, C. J., Poelmans, W., Probert, M. I. J., Refson, K., Richter, M., Rignanese, G. -M., Saha, S., Scheffler, M., Schlipf, M., Schwarz, K., Sharma, S., Tavazza, F., Thunstrom, P., Tkatchenko, A., Torrent, M., Vanderbilt, D., Van Setten, M. J., Van Speybroeck, V., Wills, J. M., Yates, J. R., Zhang, G. -X., Cottenier, S.

    مصطلحات موضوعية: DFT, first principle, delta test

    Relation: info:eu-repo/semantics/altIdentifier/pmid/27013736; info:eu-repo/semantics/altIdentifier/wos/WOS:000372756200038; volume:351; issue:6280; firstpage:aad3000-1; lastpage:aad3000-7; numberofpages:9; journal:SCIENCE; http://hdl.handle.net/11573/1416710; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84962221807

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    Academic Journal

    المساهمون: Di Sante, D., Barone, P., Stroppa, A., Garrity, K.F., Vanderbilt, D., Picozzi, S.

    مصطلحات موضوعية: DFT, Rashba Effect, Topological Insulators, Weyl Fermions

    وصف الملف: ELETTRONICO

    Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000381477200009; volume:117; issue:7; firstpage:076401; lastpage:076401; numberofpages:5; journal:PHYSICAL REVIEW LETTERS; http://hdl.handle.net/11585/871528; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84982190105; https://www.scopus.com/inward/record.uri?eid=2-s2.0-84982190105&doi=10.1103/PhysRevLett.117.076401&partnerID=40&md5=c11e45929bb3f0d86c115b468f182495

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    Electronic Resource
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    Academic Journal
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    Academic Journal

    المصدر: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; Jul2009, Vol. 27 Issue 4, p2015-2019, 5p, 1 Black and White Photograph, 1 Diagram, 4 Graphs

    مصطلحات موضوعية: ELECTRONS, X-ray diffraction, ATOMS, OXIDES, SILICON, STOICHIOMETRY