يعرض 1 - 20 نتائج من 126 نتيجة بحث عن '"Garner, C. Michael"', وقت الاستعلام: 0.51s تنقيح النتائج
  1. 1
    Report
    Characterization of electronic structure of periodically strained graphene

    المؤلفون: Aslani, Marjan, Garner, C. Michael, Kumar, Suhas, Nordlund, Dennis, Pianetta, Piero, Nishi, Yoshio

    المصدر: Appl. Phys. Lett. 107, 183507 (2015)

    مصطلحات موضوعية: Condensed Matter - Materials Science

    URL الوصول: http://arxiv.org/abs/1511.01921

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  2. 2
    Academic Journal
    Lithography for enabling advances in integrated circuits and devices

    المؤلفون: Garner, C. Michael

    المصدر: Philosophical Transactions: Mathematical, Physical and Engineering Sciences, 2012 Aug . 370(1973), 4015-4041.

    URL الوصول: https://www.jstor.org/stable/41582997


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  3. 3
    Conference
    Laser Scattering: a Fast, Sensitive, In-Line Technique for Advanced Process Development and Monitoring

    المؤلفون: Nolot, E., Arrazat, B., Favier, S., Borde, Y., Damlencourt, J. F., Vincent, B., Kermarrec, O., Carron, V., Nemouchi, F., Vandelle, P., Bogumilowicz, Y., Danel, A., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 116-120 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799354

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  4. 4
    Conference
    CMP Control of Multi-Layer Inter-Layer Dielectrics (ILD) using X-ray Reflectivity

    المؤلفون: Bryant, Ross E., Porter, Hethel, Gallegos, Jesus, O'Dell, Jeremy, Agnihotri, Dileep, Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 216-219 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799373

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  5. 5
    Conference
    Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere

    المؤلفون: Kopanski, J. J., Afridi, M. Y., Jeliazkov, S., Jiang, W., Walker, T. R., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 530-534 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799430

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  6. 6
    Conference
    Development of a Focused-Beam Ellipsometer Based on a New Principle

    المؤلفون: Ye, Sang-Heon, Kwak, Yoon Keun, Kim, Soo Hyun, Cho, Hyun Mo, Cho, Yong Jai, Chegal, Won, Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 69-73 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799439

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  7. 7
    Conference
    Computational Scanning Electron Microscopy

    المؤلفون: Rad, Leili Baghaei, Feng, Hanying, Ye, Jun, Pease, R. F. W., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 512-517 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799427

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  8. 8
    Conference
    Methods to Characterize the Electrical and Mechanical Properties of Si Nanowires

    المؤلفون: Li, Qiliang, Koo, Sang-Mo, Xiong, Hao D., Edelstein, Monica D., Suehle, John S., Zhu, Xiaoxiao, Ioannou, Dimitris E., Richter, Curt A., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 457-461 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799417

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  9. 9
    Conference
    Linewidth Measurement Based on Automatically Matched and Stitched AFM Images

    المؤلفون: Chu, Wei, Fu, Joseph, Dixson, Ronald, Vorburger, Theodore, Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 407-412 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799408

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  10. 10
    Conference
    Ultra Low-κ Metrology Using X-Ray Reflectivity And Small-Angle X-Ray Scattering Techniques

    المؤلفون: Plantier, L., Gonchond, J.-P., Pernot, F., Peled, A., Wyon, C., Royer, J.-C., Yokhin, B., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 347-351 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799395

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  11. 11
    Conference
    EUV Lithography: New Metrology Challenges

    المؤلفون: Wood, Obert, Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 375-381 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799401

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  12. 12
    Conference
    Dopant Activation and Profile Determination with an Elastic Material Probe (EM-Probe)

    المؤلفون: Hillard, Robert J., Win Ye, C., Borland, John O., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 261-264 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799380

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  13. 13
    Conference
    Photo-Reflectance Characterization of Nanometer Scale Active Layers in Si

    المؤلفون: Chism, Will, Pham, Daniel, Allgair, John, Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 64-68 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799438

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  14. 14
    Conference
    Helium Ion Microscopy: a New Technique for Semiconductor Metrology and Nanotechnology

    المؤلفون: Postek, Michael T., Vladar, Andras E., Kramar, John, Stern, Lewis A., Notte, John, McVey, Sean, Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 161-167 ; ISSN 0094-243X

    الاتاحة: https://doi.org/10.1063/1.2799363

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  15. 15
    Conference
    The Continuous Anodic Oxidation Technique

    المؤلفون: Prussin, S., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 275-278 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799383

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  16. 16
    Conference
    Use of Drop-on-Demand Inkjet Printing Technology to Produce Trace Metal Contamination Standards For the Semiconductor Industry

    المؤلفون: Windsor, Eric, Fahey, Albert, Gillen, Greg, Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 146-150 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799360

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  17. 17
    Conference
    Off-Specular X-ray and Neutron Reflectometry for the Structural Characterization of Buried Interfaces

    المؤلفون: Lavery, Kristopher A., Prabhu, Vivek M., Lin, Eric K., Wu, Wen-li, Satija, Sushil, Wormington, Matthew, Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 185-190 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799367

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  18. 18
    Conference
    Protocol Optimisation For Work-Function Measurements Of Metal Gates Using Kelvin Force Microscopy

    المؤلفون: Mariolle, D., Kaja, K., Bertin, F., Martinez, E., Martin, F., Gassilloud, R., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 521-524 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799428

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  19. 19
    Conference
    Spectroscopic Studies of Band Edge Electronic States in Elemental High-k Oxide Dielectrics on Si and Ge Substrates

    المؤلفون: Lucovsky, G., Seo, H., Fleming, L. B., Ulrich, M. D., Lüning, J., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 315-319 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799390

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  20. 20
    Conference
    Investigation of Apertureless NSOM for Measurement of Stress in Strained Silicon-on-Insulator Test Structures

    المؤلفون: McDonough, Colin, Atesang, Jacob, Wang, Yunfei, Geer, Robert E., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

    المصدر: AIP Conference Proceedings ; volume 931, page 94-98 ; ISSN 0094-243X

    الاتاحة: http://dx.doi.org/10.1063/1.2799444

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