المؤلفون: Kerrigan, A., Pande, K., Pingstone, D., Cavill, S. A., Gajdardziska-Josifovska, M., McKenna, K. P., Weinert, M., Lazarov, V. K.

وصف الملف: text

Relation: https://eprints.whiterose.ac.uk/187779/1/1_s2.0_S016943322201042X_main.pdf; Kerrigan, A., Pande, K., Pingstone, D. et al. (5 more authors) (2022) Nano-faceted stabilization of polar-oxide thin films:The case of MgO(111) and NiO(111) surfaces. APPLIED SURFACE SCIENCE. 153490. ISSN 0169-4332

الاتاحة: https://eprints.whiterose.ac.uk/187779/
https://eprints.whiterose.ac.uk/187779/1/1_s2.0_S016943322201042X_main.pdf
https://doi.org/10.1016/j.apsusc.2022.153490

المؤلفون: Silva, M. R., Lecus, A., Gajdardziska-Josifovska, M., Schofield, M., Virnoche, M., Chang, J., Chen, J., Garman, D.

المساهمون: University of Wisconsin-Milwaukee

المصدر: RSC Advances ; volume 10, issue 8, page 4589-4597 ; ISSN 2046-2069

الاتاحة: http://dx.doi.org/10.1039/c9ra00572b
http://pubs.rsc.org/en/content/articlepdf/2020/RA/C9RA00572B

المؤلفون: Liu, Y., Lazarov, V. K., Cheung, S. H., Keavney, D. J., Gai, Z., Gajdardziska-Josifovska, M., Weinert, M., Li, L.

وصف الملف: application/pdf

Relation: http://www.osti.gov/servlets/purl/1098783; https://www.osti.gov/biblio/1098783; https://doi.org/10.1103/PhysRevB.85.144113

الاتاحة: http://www.osti.gov/servlets/purl/1098783
https://www.osti.gov/biblio/1098783
https://doi.org/10.1103/PhysRevB.85.144113

المؤلفون: Krystofiak, E.S., Mattson, E.C., Albrecht, R.M., Gajdardziska-Josifovska, M., Oliver, J.A.

المصدر: Microscopy and Microanalysis ; volume 19, issue S2, page 276-277 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927613003371
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927613003371

المؤلفون: Mattson, E.C., Gajdardziska-Josifovska, M., Voyles, P.M., Krystofiak, E.S., Oliver, J.A.

المصدر: Microscopy and Microanalysis ; volume 18, issue S2, page 358-359 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927612003649
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927612003649

المؤلفون: Krystofiak, E.S., Mattson, E.C., Gajdardziska-Josifovska, M., Oliver, J.A.

المصدر: Microscopy and Microanalysis ; volume 18, issue S2, page 1650-1651 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927612010100
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927612010100

المؤلفون: Cheung, S. H., Celik-Aktas, A., Dey, P., Pande, K., Weinert, M., Kabius, B., Keavney, D. J., Lazarov, V. K., Chambers, S. A., Gajdardziska-Josifovska, M.

المساهمون: U.S. Department of Energy

المصدر: Physical Review B ; volume 85, issue 4 ; ISSN 1098-0121 1550-235X

الاتاحة: http://dx.doi.org/10.1103/physrevb.85.045405
http://link.aps.org/accepted/10.1103/PhysRevB.85.045405
http://link.aps.org/article/10.1103/PhysRevB.85.045405
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.85.045405/fulltext

المؤلفون: Pande, K., Gajdardziska-Josifovska, M., Weinert, M.

المساهمون: U.S. Department of Energy

المصدر: Physical Review B ; volume 86, issue 3 ; ISSN 1098-0121 1550-235X

الاتاحة: http://dx.doi.org/10.1103/physrevb.86.035431
http://link.aps.org/accepted/10.1103/PhysRevB.86.035431
http://link.aps.org/article/10.1103/PhysRevB.86.035431
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.86.035431/fulltext

المؤلفون: Liu, Y., Lazarov, V. K., Cheung, S. H., Keavney, D. J., Gai, Z., Gajdardziska-Josifovska, M., Weinert, M., Li, L.

المساهمون: National Science Foundation, U.S. Department of Energy

المصدر: Physical Review B ; volume 85, issue 14 ; ISSN 1098-0121 1550-235X

الاتاحة: http://dx.doi.org/10.1103/physrevb.85.144113
http://link.aps.org/accepted/10.1103/PhysRevB.85.144113
http://link.aps.org/article/10.1103/PhysRevB.85.144113
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.85.144113/fulltext

المؤلفون: Mattson, E, Cui, S, Schofield, M, Lu, G, Pu, H, Weinert, M, Chen, J, Hirschmugl, C, Gajdardziska-Josifovska, M

المصدر: Microscopy and Microanalysis ; volume 17, issue S2, page 1500-1501 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927611008373
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927611008373

المؤلفون: Mattson, E, Krystofiak, E, Voyles, P, Hirschmugl, C, Gajdardziska-Josifovska, M, Oliver, J

المصدر: Microscopy and Microanalysis ; volume 17, issue S2, page 1428-1429 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927611008014
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927611008014

المؤلفون: Sen, S, Zou, Y, Ray, SK, Robertson, DP, Guptasarma, P, Gajdardziska-Josifovska, M

المصدر: Microscopy and Microanalysis ; volume 16, issue S2, page 1720-1721 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927610062367
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927610062367

المؤلفون: Krystofiak, ES, Rajput, S, Albrecht, RM, Gajdardziska-Josifovska, M, Oliver, JA

المصدر: Microscopy and Microanalysis ; volume 16, issue S2, page 1714-1715 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927610060046
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927610060046

المؤلفون: Mattson, EC, Cui, S, Mao, S, Lu, GH, Chen, J, Hirschmugl, CJ, Gajdardziska-Josifovska, M

المصدر: Microscopy and Microanalysis ; volume 16, issue S2, page 1708-1709 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927610058265
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927610058265

المؤلفون: Pande, K, Lazarov, VK, Weinert, M, Gajdardziska-Josifovska, M

المصدر: Microscopy and Microanalysis ; volume 16, issue S2, page 1474-1475 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s143192761006215x
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S143192761006215X

المؤلفون: Hoppe, E. E., Aita, C. R., Gajdardziska-Josifovska, M.

المصدر: Applied Physics Letters ; volume 92, issue 10 ; ISSN 0003-6951 1077-3118

الاتاحة: https://doi.org/10.1063/1.2839289
https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.2839289/14396314/109903_1_online.pdf

المؤلفون: Lazarov, V. K., Gajdardziska-Josifovska, M.

المصدر: Microscopy and Microanalysis ; volume 9, issue S02, page 488-489 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s143192760344244x
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S143192760344244X

المؤلفون: Robertson, D. P., Gajdardziska-Josifovska, M., Kim, J. K., Guo, R. Q., Rohatgi, P. K.

المصدر: Microscopy and Microanalysis ; volume 8, issue S02, page 1278-1279 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s143192760210482x
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S143192760210482X

المؤلفون: Gajdardziska-Josifovska, M., Schofield, M. A., Robertson, D. P., McClean, R. G., Kean, W. F., Sommer, C. V.

المصدر: Microscopy and Microanalysis ; volume 8, issue S02, page 752-753 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927602106568
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927602106568

المؤلفون: Tsen, S.-C. Y., Crozier, P. A., Gajdardziska–Josifovska, M.

المصدر: Microscopy and Microanalysis ; volume 8, issue S02, page 1108-1109 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927602103618
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927602103618