المؤلفون: P. Lagrain, K. Paulussen, E. Grieten, G. Van den Bosch, S. Rachidi, D. Yudistira, L. Wouters, T. Hantschel

المصدر: Micro and Nano Engineering, Vol 23, Iss , Pp 100247- (2024)

مصطلحات موضوعية: Focused ion beam, FIB/SEM, Dual-beam, Electrical SPM, SSRM, C-AFM, Electronics, TK7800-8360, Technology (General), T1-995

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2590007224000108; https://doaj.org/toc/2590-0072

URL الوصول: https://doaj.org/article/d5a4ea81a68e4d849bd039a490c67128

المؤلفون: E. Simoen, B. J. O’Sullivan, N. Ronchi, G. Van den Bosch, D. Linten, J. Van Houdt

المصدر: AIP Advances, Vol 11, Iss 1, Pp 015219-015219-4 (2021)

مصطلحات موضوعية: Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2158-3226

URL الوصول: https://doaj.org/article/2f69ebed3e764992918d8d4bdfa74f8f

المؤلفون: Chun-Yu Liu, Lorenzo Celiberti, Régis Decker, Kari Ruotsalainen, Katarzyna Siewierska, Maximilian Kusch, Ru-Pan Wang, Dong Jik Kim, Israel Ibukun Olaniyan, Daniele Di Castro, Keisuke Tomiyasu, Emma van der Minne, Yorick A. Birkhölzer, Ellen M. Kiens, Iris C. G. van den Bosch, Komal N. Patil, Christoph Baeumer, Gertjan Koster, Masoud Lazemi, Frank M. F. de Groot, Catherine Dubourdieu, Cesare Franchini, Alexander Föhlisch

المصدر: Communications Physics, Vol 7, Iss 1, Pp 1-7 (2024)

مصطلحات موضوعية: Astrophysics, QB460-466, Physics, QC1-999

Relation: https://doi.org/10.1038/s42005-024-01642-5; https://doaj.org/toc/2399-3650; https://doaj.org/article/493833f792f4434a9ac4809649d62dab

الاتاحة: https://doi.org/10.1038/s42005-024-01642-5
https://doaj.org/article/493833f792f4434a9ac4809649d62dab

المؤلفون: S. Ramesh, K. Banerjee, K. Opsomer, I. Rachita, J. P. Bastos, J-Ph. Soulie, F. Sebaai, P. Favia, M. Korytov, O. Richard, L. Breuil, A. Arreghini, G. Van Den Bosch, M. Rosmeulen

المصدر: IEEE Electron Device Letters. 43:2085-2088

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2165175b501c1f0cd49d1682028a245c
https://doi.org/10.1109/led.2022.3212105

المؤلفون: Noortje J. M. L. Buermans, Sharon J. G. van den Bosch, Irene C. Huffnagel, Marjan E. Steenweg, Marc Engelen, Kim J. Oostrom, Gert J. Geurtsen

المصدر: Orphanet Journal of Rare Diseases, Vol 14, Iss 1, Pp 1-8 (2019)

مصطلحات موضوعية: X –linked adrenoleukodystrophy, Natural history studies, MRI, Leukodystrophies, Peroxisomes, Neuropsychological assessment, Medicine

Relation: http://link.springer.com/article/10.1186/s13023-019-1184-4; https://doaj.org/toc/1750-1172; https://doaj.org/article/01b35ac874464fa580e504a7bc007232

الاتاحة: https://doi.org/10.1186/s13023-019-1184-4
https://doaj.org/article/01b35ac874464fa580e504a7bc007232

المؤلفون: Nur K. Alam, Barry O'Sullivan, S. R. C. McMitchell, Amey Mahadev Walke, Dimitri Linten, Ben Kaczer, Yusuke Higashi, K. Banerjee, Nicolo Ronchi, Laurent Breuil, G. Van den bosch, J. Van Houdt

المصدر: IEEE Transactions on Electron Devices. 68:4391-4396

مصطلحات موضوعية: Materials science, Silicon, Condensed matter physics, chemistry.chemical_element, Depolarization, Trapping, Ferroelectricity, Electronic, Optical and Magnetic Materials, Threshold voltage, chemistry, Work function, Electrical and Electronic Engineering, Polarization (electrochemistry), Tin

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::317a497df8b01a00ffa75d721976e76a
https://doi.org/10.1109/ted.2021.3096510

المؤلفون: Mohana V. Kante, Daniel Monteiro Cunha, Moritz L. Weber, Iris C. G. van den Bosch, Lisa Heymann, Emma van der Minne, Shu Ni, Lorenz J. Falling, Gertjan Koster, Felix Gunkel, Slavomír Nemšák, Horst Hahn, Leonardo Velasco, Christoph Baeumer

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::612ab0b0e2db4c965497eb52ac213279
https://doi.org/10.26434/chemrxiv-2022-2x0v7

المؤلفون: L. Breuil, L. Nyns, S. Rachidi, K. Banerjee, A. Arreghini, J. Bastos, S. Ramesh, G. Van den bosch, M. Rosmeulen

المصدر: 2022 IEEE International Memory Workshop (IMW).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e6294b33dba12551a792a98a6f454d16
https://doi.org/10.1109/imw52921.2022.9779307

المؤلفون: N. Ronchi, L. -A. Ragnarsson, U. Celano, B. Kaczer, K. Kaczmarek, K. Banerjee, S. R. C. McMitchell, G. Van den bosch, J. Van Houdt

المصدر: 2022 IEEE International Memory Workshop (IMW).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e4ef99654aa02ef998ce600d3ac412fb
https://doi.org/10.1109/imw52921.2022.9779294

المؤلفون: M. Rosmeulen, C. Lockhart de la Rosa, K. Willems, S. Fransen, B.-Y. Shih, D. Verreck, V. Kalangi, F. Yasin, H. Philipsen, Y. T. Set, N. Ronchi, W. Van Roy, O. Y. F. Henry, A. Arreghini, G. Van den bosch, A. Furnemont

المصدر: 2022 IEEE International Memory Workshop (IMW).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cc094e59ba971d9e2551ac36ddac4552
https://doi.org/10.1109/imw52921.2022.9779295

المؤلفون: S. Rachidi, A. Arreghini, D. Verreck, G. L. Donadio, K. Banerjee, K. Katcko, Y. Oniki, G. Van den bosch, M. Rosmeulen

المصدر: 2022 IEEE International Memory Workshop (IMW).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::87d20af3b34e8525aa039e2b7299463b
https://doi.org/10.1109/imw52921.2022.9779303

المؤلفون: B. J. O'Sullivan, B. Truijen, V. Putcha, A. Grill, A Chasin, G. Van Den Bosch, B. Kaczer, M. N. K. Alam, J. Van Houdt

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8c75a28f2ade9ef36adc1e16e00feb98
https://doi.org/10.1109/irps48227.2022.9764588

المؤلفون: B. Truijen, B. O'Sullivan, Md Nur K. Alam, D. Claes, M. Thesberg, P. Roussel, A. Chasin, G. Van den Bosch, B. Kaczer, J. Van Houdt

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::52ba6a60064bfdfafb50d72def741da2
https://doi.org/10.1109/irps48227.2022.9764603

المؤلفون: S. Ramesh, S. Rachidi, G. L. Donadio, G. Van den bosch, M. Rosmeulen

المصدر: ECS Journal of Solid State Science and Technology. 12:045003

مصطلحات موضوعية: Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::38d88c194d64d349c42ce1499270555c
https://doi.org/10.1149/2162-8777/accb66

المؤلفون: D. Verreck, A. Arreghini, F. Schanovsky, G. Rzepa, Z. Stanojevic, F. Mitterbauer, C. Kernstock, O. Baumgartner, M. Karner, G. Van den bosch, M. Rosmeulen

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::26095c7e1e447b9e8c45dc618f0173b3
https://doi.org/10.1109/iedm19574.2021.9720506

المؤلفون: D. Verreck, A. Arreghini, G. Van den bosch, M. Rosmeulen

المصدر: Solid-State Electronics. 199:108498

مصطلحات موضوعية: Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5ad27f1371a0550bb5728b44ca690012
https://doi.org/10.1016/j.sse.2022.108498

المؤلفون: Antonio Arreghini, G. Van den bosch, Maarten Rosmeulen, Arnaud Furnemont, Devin Verreck

المصدر: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

مصطلحات موضوعية: Physics, Flash (photography), Interference (communication), Logic gate, Audio time-scale/pitch modification, Electronic engineering, NAND gate, Solid modeling, Threshold voltage, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::de1fc1298fdc6fbf56ab5faa07c85329
https://doi.org/10.1109/sispad54002.2021.9592552

المؤلفون: Laurent Breuil, J. Van Houdt, G. Van den bosch, Alexey Milenin, J. Stiers, K. Banerjee, L. Di Piazza, M. Pak, S. R. C. McMitchell

المصدر: 2021 IEEE International Memory Workshop (IMW).

مصطلحات موضوعية: 010302 applied physics, Materials science, Fabrication, business.industry, NAND gate, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Ferroelectricity, Non-volatile memory, Hardware_GENERAL, Logic gate, 0103 physical sciences, Trench, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Wafer, 0210 nano-technology, business, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b446a7eecf07ddfc4df79bf490f4c5be
https://doi.org/10.1109/imw51353.2021.9439620

المؤلفون: Davide Tierno, Maarten Rosmeulen, K. Croes, A. Ajaykumar, S. Ramesh, G. Van den bosch

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Materials science, Dielectric strength, business.industry, NAND gate, Time-dependent gate oxide breakdown, 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, 01 natural sciences, Line (electrical engineering), law.invention, Capacitor, Reliability (semiconductor), Planar, law, 0103 physical sciences, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::945dec7e37fec71465bba40616ed2c0e
https://doi.org/10.1109/irps46558.2021.9405132

المؤلفون: Tian-Li Wu, P. Van Marcke, Y.-H. Chen, G. Van den bosch, S. R. C. McMitchell, P. van der Heide, B. Kaczer, Paola Favia, Umberto Celano, Albert Minj, Nicolo Ronchi, J. Van Houdt, K. Banerjee

المصدر: 2020 IEEE Symposium on VLSI Technology.

مصطلحات موضوعية: Kelvin probe force microscope, Materials science, Silicon, business.industry, Doping, chemistry.chemical_element, Ferroelectricity, chemistry, Electrode, Microscopy, Optoelectronics, business, Electrical conductor, Nanoscopic scale

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4b7157586db80d256c462981f93557aa
https://doi.org/10.1109/vlsitechnology18217.2020.9265098