المؤلفون: J. H. Yum, J. Oh, Todd. W. Hudnall, C. W. Bielawski, G. Bersuker, S. K. Banerjee

المصدر: Active and Passive Electronic Components, Vol 2012 (2012)

مصطلحات موضوعية: Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://doaj.org/toc/0882-7516; https://doaj.org/toc/1563-5031

URL الوصول: https://doaj.org/article/e4cacb66b3d347798b435cad294ead1e

المؤلفون: G. Bersuker, E. Tang, D. Veksler

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5d4c0798e36d06aad8a7c7052e0bc481
https://doi.org/10.1109/irps48203.2023.10118314

المؤلفون: J. Farmer, D. Veksler, E. Tang, G. Bersuker, D. Z. Gao, A.-M. El-Sayed, T. Durrant, A. Shluger, T. Rueckes, L. Cleveland, H. Luan, R. Sen

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2927936fb2acac184b10017edfcdd358
https://doi.org/10.1109/irps48227.2022.9764576

المؤلفون: H. Luan, T. R. Durrant, David Z. Gao, Alexander L. Shluger, T. Rueckes, Al-Moatasem El-Sayed, R. Sen, J. Farmer, D. Veksler, G. Bersuker, L. Cleveland, W. Whitehead, A. Hall

المصدر: IRPS

مصطلحات موضوعية: Materials science, law, business.industry, Optoelectronics, Carbon nanotube, Memristor, Conductivity, business, Instability, law.invention, Pulse (physics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::eca72821eea6d52d697878120126d27f
https://doi.org/10.1109/irps46558.2021.9405123

المؤلفون: L. Cleveland, Kin P. Cheung, D. Veksler, T. Rueckes, G. Bersuker, Jason P. Campbell, H. Luan, Pragya R. Shrestha, David Gilmer, Maribeth Mason, A. W. Bushmaker

المصدر: IRPS

مصطلحات موضوعية: Materials science, Neuromorphic engineering, law, business.industry, Optoelectronics, Carbon nanotube, Memristor, Voltage pulse, business, law.invention, Resistive random-access memory

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::810abd76408f3313c7c9546ec1c5baff
https://doi.org/10.1109/irps45951.2020.9128335

المؤلفون: G. Bersuker, Jason P. Campbell, Maribeth Mason, Jason T. Ryan, Pragya R. Shrestha, Helmut Baumgart, Dmitry Veksler, Kin P. Cheung, David Nminibapiel

المصدر: Journal of Computational Electronics. 16:1085-1094

مصطلحات موضوعية: 010302 applied physics, Materials science, Fabrication, biology, business.industry, Nanotechnology, 02 engineering and technology, 021001 nanoscience & nanotechnology, Hafnia, biology.organism_classification, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Resistive random-access memory, Stack (abstract data type), Memory cell, Modeling and Simulation, 0103 physical sciences, Scalability, Overshoot (signal), Optoelectronics, Electrical and Electronic Engineering, 0210 nano-technology, business, Electrical conductor

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f26e38cbb468a28e748eefb3f9ff2a9a
https://doi.org/10.1007/s10825-017-1105-5

المؤلفون: Dmitry Veksler, G. Bersuker, Maribeth Mason, Donald G. Pierce

المصدر: ECS Transactions. 79:99-118

مصطلحات موضوعية: Reliability (semiconductor), Computer science, Emerging technologies, law, Transistor, Range (statistics), Application specific, Node (circuits), Reliability engineering, Characterization (materials science), law.invention, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7d8a248f6ed49ceeef444f85b4cfd125
https://doi.org/10.1149/07901.0099ecst

المؤلفون: G. Bersuker, Pragya R. Shrestha, Kin P. Cheung, D. Veksler, Jason P. Campbell, A. W. Bushmaker

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Resistive touchscreen, Materials science, business.industry, Pulse (signal processing), Oxide, Conductivity, 01 natural sciences, Resistive random-access memory, Protein filament, chemistry.chemical_compound, chemistry, 0103 physical sciences, Optoelectronics, Crystallite, business, Low voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f9a732bf9b29793bd68f4e47cdb7fb68
https://doi.org/10.1109/irps.2019.8720579

المؤلفون: Man Hoi Wong, Pui Yee Hung, G. Bersuker, Mohammad-Ali Miri, Farbod Shafiei, Alexey Vert, Andrea Alù, Michael C. Downer, Tommaso Orzali

المصدر: Advanced Optical Materials. 9:2002252

مصطلحات موضوعية: Threading dislocations, Nonlinear system, Scanning probe microscopy, Materials science, Scale (ratio), business.industry, Optoelectronics, Nanometre, business, Atomic and Molecular Physics, and Optics, Light scattering, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2f3abe1f067b161946887fef290c29a3
https://doi.org/10.1002/adom.202002252

المؤلفون: Montserrat Nafria, A. Cordes, Marc Porti, Q. Wu, V. Iglesias, S. Claramunt, G. Bersuker, C. Couso

المصدر: IEEE Transactions on Nanotechnology. 15:986-992

مصطلحات موضوعية: 010302 applied physics, Imagination, Engineering, Silicon, business.industry, media_common.quotation_subject, chemistry.chemical_element, Nanotechnology, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Temperature measurement, Line (electrical engineering), Computer Science Applications, Semiconductor, chemistry, 0103 physical sciences, Optoelectronics, Electrical and Electronic Engineering, 0210 nano-technology, Science, technology and society, business, Electrical conductor, Nanoscopic scale, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c848c8810ca343239c1bbb9cb2554351
https://doi.org/10.1109/tnano.2016.2619488

المؤلفون: G. Bersuker, Dmitry Veksler, William Whitehead

المصدر: ECS Meeting Abstracts. :2039-2039

مصطلحات موضوعية: Artificial neural network, Computer architecture, law, Computer science, Memristor, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::11b830a405afb2963a9397bacb13040d
https://doi.org/10.1149/ma2020-02312039mtgabs

المؤلفون: Stefano Ambrogio, Y. Ando, G. Bersuker, Chong Bi, Philippe Blaise, B. De Salvo, Jonas Deuermeier, Regina Dittmann, T. Endoh, S. Fukami, D.C. Gilmer, Ludovic Goux, T. Hanyu, Michel Harrand, Susanne Hoffmann-Eifert, Hyunsang Hwang, Cheol Seong Hwang, Daniele Ielmini, S. Ikeda, Asal Kiazadeh, H. Koike, Yunmo Koo, Luca Larcher, Seokjae Lim, Massimo Longo, Y. Ma, Stephan Menzel, Rivu Midya, Thomas Mikolajick, Gabriel Molas, Cécile Nail, H. Ohno, Andrea Padovani, Jaehyuk Park, Paolo Pavan, L. Perniola, Francesco Maria Puglisi, Mingyi Rao, Noriyuki Sato, H. Sato, R. Shirota, Jeonghwan Song, D. Suzuki, Navnidhi Kumar Upadhyay, D. Veksler, E. Vianello, Shan X. Wang, Zhongrui Wang, Rainer Waser, J. Joshua Yang

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::64f3ada96173237385b09ec06d42e54b
https://doi.org/10.1016/b978-0-08-102584-0.09990-3

المؤلفون: D.C. Gilmer, G. Bersuker, D. Veksler

مصطلحات موضوعية: Reduction (complexity), chemistry.chemical_compound, Materials science, chemistry, Material structure, Vacancy defect, Process (computing), Oxide, Dielectric, Microscopic description, Engineering physics, Resistive random-access memory

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e779c8f2c1b96ee85d190a2003f450d3
https://doi.org/10.1016/b978-0-08-102584-0.00002-4

المؤلفون: Chen Luo, Yawei Li, Xing Wu, Chaolun Wang, K. L. Pey, Zhigao Hu, Jian Zhang, Peng Hao, Litao Sun, Tao Sun, G. Bersuker, Runsheng Wang

المصدر: 2018 China Semiconductor Technology International Conference (CSTIC).

مصطلحات موضوعية: Materials science, Interface (computing), Oxide, Nanotechnology, 02 engineering and technology, Substrate (electronics), Electronic structure, Electron, 01 natural sciences, Atomic units, law.invention, chemistry.chemical_compound, law, 0103 physical sciences, General Materials Science, Electronics, Diode, 010302 applied physics, business.industry, Mechanical Engineering, Transistor, 021001 nanoscience & nanotechnology, chemistry, Mechanics of Materials, Optoelectronics, 0210 nano-technology, business, Indium gallium arsenide, Dark current

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ed87b51ac8844460dfe92af107bfa30b
https://doi.org/10.1109/cstic.2018.8369288

المؤلفون: G. Bersuker, David Gilmer

المصدر: Nanostructure Science and Technology ISBN: 9783319918952

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Oxide, Process (computing), 02 engineering and technology, Memristor, 021001 nanoscience & nanotechnology, 01 natural sciences, Resistive random-access memory, law.invention, Protein filament, Metal, chemistry.chemical_compound, chemistry, law, Vacancy defect, visual_art, 0103 physical sciences, visual_art.visual_art_medium, Optoelectronics, 0210 nano-technology, business, Reset (computing)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::16c90063445ca5558370c25ba2f4ecbd
https://doi.org/10.1007/978-3-319-91896-9_3

المؤلفون: B. Butcher, G. Bersuker, D. Gilmer, P. Kirsch, LARCHER, Luca, PADOVANI, ANDREA, VANDELLI, LUCA, R. Geer, P. D. Kirsch

المساهمون: B., Butcher, G., Bersuker, D., Gilmer, P., Kirsch, Larcher, Luca, Padovani, Andrea, Vandelli, Luca, R., Geer, P. D., Kirsch

مصطلحات موضوعية: RRAM modeling, Forming, HfO2

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781479923076; info:eu-repo/semantics/altIdentifier/wos/WOS:000346509500145; ispartofbook:2013 IEEE International Electron Devices Meeting; 2013 IEEE International Electron Devices Meeting, IEDM 2013; firstpage:22.2.1; lastpage:22.2.4; serie:TECHNICAL DIGEST - INTERNATIONAL ELECTRON DEVICES MEETING; http://hdl.handle.net/11380/990509; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84894379000

الاتاحة: http://hdl.handle.net/11380/990509
https://doi.org/10.1109/IEDM.2013.6724682

المؤلفون: D. Veksler, G. Bersuker, A. Muraviev, B. Chakrabarti, E. Vogel, D. C. Gilmer, P. D. Kirsch, VANDELLI, LUCA, PADOVANI, ANDREA, LARCHER, Luca

المساهمون: D., Veksler, G., Bersuker, Vandelli, Luca, Padovani, Andrea, Larcher, Luca, A., Muraviev, B., Chakrabarti, E., Vogel, D. C., Gilmer, P. D., Kirsch

مصطلحات موضوعية: RRAM, noise, high-k dielectric, Random telegraph noise

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000325097500161; ispartofbook:51th IEEE International Reliability Physics Symposium; 2013 IEEE International Reliability Physics Symposium, IRPS 2013; firstpage:MY.10.1; lastpage:MY.10.4; serie:IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS; http://hdl.handle.net/11380/924092; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84880987960

الاتاحة: http://hdl.handle.net/11380/924092
https://doi.org/10.1109/IRPS.2013.6532101

المؤلفون: G. Bersuker, B. Butcher, D. Gilmer, P. Kirsch, LARCHER, Luca, PADOVANI, ANDREA

المساهمون: G., Bersuker, B., Butcher, D., Gilmer, P., Kirsch, Larcher, Luca, Padovani, Andrea

مصطلحات موضوعية: RRAM modeling, RRAM, Hafnium Oxide

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781479906482; info:eu-repo/semantics/altIdentifier/wos/WOS:000342231600038; ispartofbook:2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC); 43rd European Solid-State Device Research Conference, ESSDERC 2013; firstpage:163; lastpage:165; serie:PROCEEDINGS OF THE EUROPEAN SOLID STATE DEVICE RESEARCH CONFERENCE; http://hdl.handle.net/11380/976096; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84902149966

الاتاحة: http://hdl.handle.net/11380/976096
https://doi.org/10.1109/ESSDERC.2013.6818844

المؤلفون: B. Butcher, G. Bersuker, A. Kalantarian, R. Geer, D. C. Gilmer, VANDELLI, LUCA, PADOVANI, ANDREA, LARCHER, Luca

المساهمون: B., Butcher, G., Bersuker, Vandelli, Luca, Padovani, Andrea, Larcher, Luca, A., Kalantarian, R., Geer, D. C., Gilmer

مصطلحات موضوعية: ReRAM, Forming, oxygen vacancie, device physic, RRAM, resistive switching memorie, hafnium, oxide, HfO2, HfO2-x, HfOx

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781467361675; info:eu-repo/semantics/altIdentifier/wos/WOS:000327312700014; ispartofbook:2013 5th IEEE International Memory Workshop; 2013 5th IEEE International Memory Workshop, IMW 2013; firstpage:52; lastpage:55; http://hdl.handle.net/11380/949091; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84883697104

الاتاحة: http://hdl.handle.net/11380/949091
https://doi.org/10.1109/IMW.2013.6582096

المؤلفون: PUGLISI, Francesco Maria, PAVAN, Paolo, PADOVANI, ANDREA, LARCHER, Luca, G. Bersuker

المساهمون: Puglisi, Francesco Maria, Pavan, Paolo, Padovani, Andrea, Larcher, Luca, G., Bersuker

مصطلحات موضوعية: RRAM, RRAM modeling, HMM, Time Lag Plots

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781467330862; ispartofbook:Proceedings of the 42nd European Solid-State Device Research Conference; 42nd European Solid-State Device Research Conference, ESSDERC 2012; firstpage:274; lastpage:277; serie:PROCEEDINGS OF THE EUROPEAN SOLID STATE DEVICE RESEARCH CONFERENCE; http://hdl.handle.net/11380/884491; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84870613393

الاتاحة: http://hdl.handle.net/11380/884491
https://doi.org/10.1109/ESSDERC.2012.6343386